| PART |
Description |
Maker |
| LVDS |
LVDS Description and Family Characteristics
LVDS Description and Family Characteristics
|
Fairchild Semiconductor Corporation
|
| RD10JS RD11JS RD12JS RD13JS RD15JS RD16JS RD18JS R |
DO-34 Package Low noise, Sharp Breakdown characteristics 400 mW Zener Diode
8.2 V, 0.4 W, SILICON, UNIDIRECTIONAL VOLTAGE REGULATOR DIODE, DO-34
surface mount silicon Zener diodes 表面贴装硅稳压二极管
DO-34 Package Low noise/ Sharp Breakdown characteristics 400 mW Zener Diode
DO-34 Package Low noise Sharp Breakdown characteristics 400 mW Zener Diode
Constant Voltage diode 400mW DO-34
|
NEC, Corp.
NEC Corp.
NEC[NEC]
|
| MB6052ASC-1 |
Electrical Characteristics Test Condition (Vs= 2 . 0 V, RL= 2 . 2 k ohm, Ta=20掳C, RH=65%)
Electrical Characteristics Test Condition (Vs= 2 . 0 V, RL= 2 . 2 k ohm, Ta=20°C, RH=65%)
|
Knowles Electronics
|
| MB9750USB-4 |
Electrical Characteristics Test Condition (Vs= 1 . 5 V, RL= 0 . 6 8 k ohm, Ta=20隆?C, RH=65%)
Electrical Characteristics Test Condition (Vs= 1 . 5 V, RL= 0 . 6 8 k ohm, Ta=20°C, RH=65%)
|
Knowles Electronics
|
| MB6052USZ-2 |
Electrical Characteristics Test Condition (Vs= 2 . 0 V, RL= 2 . 2 k ohm, Ta=20掳C, RH=65%)
Electrical Characteristics Test Condition (Vs= 2 . 0 V, RL= 2 . 2 k ohm, Ta=20°C, RH=65%)
|
Knowles Electronics
|
| 2N918ADCSM |
ELECTRICAL CHARACTERISTICS
|
Seme LAB
|
| 3DU5 |
D-TRIP CHARACTERISTICS
|
Altech corporation
|
| VIRTEX-5FPGA |
DC and Switching Characteristics
|
Xilinx, Inc
|
| VIRTEX-5 |
DC and Switching Characteristics
|
Xilinx, Inc
|
| ACTF45-48 ACTF45-48_44.25-48.24_W2 ACTF45-48/44.25 |
the characteristics of the SAW Duplexer
|
Advanced Crystal Technology
|
| M16C26A-SC |
Standard Characteristics
|
Renesas Electronics Corporation
|
| BZY93C62 BZY93C68 BZY93C43 |
MECHANICAL CHARACTERISTICS
|
New Jersey Semi-Conductor P...
New Jersey Semi-Conduct...
|
