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				DALLAS[Dallas Semiconductor]
Part No.	DS28EC20_T DS28EC20 DS28EC20_
OCR Text	...to IL. Write-cycle endurance is degraded as TA increases. Not 100% production-tested; guaranteed by reliability monitor sampling. Data retention is degraded as TA increases. Guaranteed by 100% production test at elevated temperature for a s...
Description	20Kb 1-Wire EEPROM
File Size	178.35K / 24 Page	View it Online	Download Datasheet

				DALLAS[Dallas Semiconductor]
Part No.	DS28EA00U_T DS28EA00 DS28EA00U_
OCR Text	...ower). Write-cycle endurance is degraded as TA increases. Not 100% production-tested; guaranteed by reliability monitor sampling. Data retention is degraded as TA increases. Guaranteed by 100% production test at elevated temperature for a s...
Description	1-Wire Digital Thermometer with Sequence Detect and PIO
File Size	210.53K / 29 Page	View it Online	Download Datasheet

				TriQuint Semiconductor
Part No.	TQM7M9023
OCR Text	...tput power gmsk hpm gmsk hpm (degraded power) 8psk (rms power) low power mode 34.5 32.5 14.0 35 29 dbm dbm dbm dbm power added efficiency (pae) gmsk hpm, p out = p sat _hpm gmsk mpm, p out = p sat _mpm 8psk hpm,...
Description	5.0x7.5mm Multimode Multiband Power Amplifier
File Size	393.81K / 15 Page	View it Online	Download Datasheet

				MAXIM[Maxim Integrated Products]
Part No.	DS28CN01U_T DS28CN01 DS28CN01U_ DS28CN01U DS28CN01UT
OCR Text	...y row. Write-cycle endurance is degraded as TA increases. Not 100% production-tested; guaranteed by reliability monitor sampling. Data retention is degraded as TA increases. Guaranteed by 100% production test at elevated temperature for a s...
Description	1Kbit I2C/SMBus EEPROM with SHA-1 Engine 1Kbit I?C/SMBus EEPROM with SHA-1 Engine
File Size	133.97K / 9 Page	View it Online	Download Datasheet

				DALLAS[Dallas Semiconductor]
Part No.	DS28E01P-100 DS28E01-100 DS28E01G-100TR DS28E01P-100TR DS28E01P-100_TR DS28E01X-100 DS28E01X-100-S DS28E01P-100_ DS28E01G-100R DS28E01G-100T DS28E01P-100R DS28E01P-100T DS28E01P-100_R DS28E01P-100_T DS28E01P-100/T DS28E01P-100/R
OCR Text	...sheet. Write-cycle endurance is degraded as TA increases. Not 100% production-tested; guaranteed by reliability monitor sampling. Data retention is degraded as TA increases. Guaranteed by 100% production test at elevated temperature for a s...
Description	1K-Bit Protected 1-Wire EEPROM with SHA-1 Engine
File Size	142.13K / 16 Page	View it Online	Download Datasheet

				DALLAS[Dallas Semiconductor]
Part No.	DS2460S DS2460 DS2460STR DS2460S_TR DS2460S_ DS2460S/TR
OCR Text	...ested. Write-cycle endurance is degraded as TA increases. Not 100% production-tested; guaranteed by reliability monitor sampling. Data retention is degraded as TA increases. Guaranteed by 100% production test at elevated temperature for a s...
Description	SHA-1 Coprocessor with EEPROM
File Size	129.46K / 8 Page	View it Online	Download Datasheet

				Stanford Microdevices
Part No.	SXT-289
OCR Text	...3 *Note: IP3 performance degraded due to lower (4.5V) device voltage. 0.1 uF 22pF 4.3 15 nH 39pF Z=50 , 35.5 39pF 220 1.8K 750 39pF 0.5 pF 1000pF 1.8K 15nH UMZ1N 1 750 39pF 0.5p F 1.0p F ...
Description	1800-2500 MHz Power Amplifier
File Size	271.40K / 8 Page	View it Online	Download Datasheet

				Analog Devices
Part No.	AD9516-0 AD9516-1 ADRF6702 CN-0243 AD9122
OCR Text	...e floor of the dac can also be degraded by sample clock jitter, and the iq modulator performance is dependent on the noise and spur characteristics of its local oscill ator (lo). using high performance components for sample clock and lo...
Description	High Dynamic Range RF Transmitter Signal Chain Using Single External Frequency Reference for DAC Sample Clock and IQ Modulator LO Generation
File Size	626.61K / 8 Page	View it Online	Download Datasheet

For degraded Found Datasheets File :: 1856 Search Time::1.562ms
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