| |
|
 |
Hamamatsu Photonics K.K.
HAMAMATSU[Hamamatsu Corporation]
|
| Part No. |
C4675-302 C4675 C4675-102 C4675-103
|
| OCR Text |
...rve potential measurement under microscope l 2-D (wavelength x spatial position) spectrophotometry in visible range l Fine-modulation light measurement
s General ratings
Parameter Photodiode Number of element Active area (per 1 element)... |
| Description |
16 x 16 element photodiode array detector 16 × 16元光电二极管阵列检测器
|
| File Size |
125.88K /
4 Page |
 View
it Online |
Download Datasheet
|
| |
|
|
SKYWORKS[Skyworks Solutions Inc.]
|
| Part No. |
DSG9500-000
|
| OCR Text |
...hould be done under a binocular microscope with magnification in the range of 20X to 30X. Special handling precautions are also required to avoid electrical damage, such as static discharge. Bonding The DSG9500-000 can best be bonded to sub... |
| Description |
Planar Beam Lead PIN Diode
|
| File Size |
68.53K /
5 Page |
View
it Online |
Download Datasheet |
| |
|
|
Osram Opto Semiconductors GmbH
OSRAM[OSRAM GmbH]
|
| Part No. |
F2000D
|
| OCR Text |
...ckside is performed with stereo microscope with incident light with 40x-80x magnification. Areas > 1/4 cm which have an amount of more than 3% failed dies will be removed. The visual inspection of chip frontside is performed by a stereo mic... |
| Description |
InGaAlP-High Brightness-Lumineszenzdiode (617nm, High Current and Flux), InGaAlP High Brightness LED (617nm, High Current and Flux)
|
| File Size |
211.09K /
6 Page |
View
it Online |
Download Datasheet |
| |
|
|
EUDYNA[Eudyna Devices Inc]
|
| Part No. |
F0100406B
|
| OCR Text |
...ng to SEI's authorized rules. A microscope inspection is conducted in conformance with the MIL-STD-883C Method 2010.7.
Precautions Owing to their small dimensions, the GaAsFET's from which the F0100406B is designed are easily damaged or ... |
| Description |
3.3V 1.25Gbit/s NRZ Receiver Transimpedance Amplifier
|
| File Size |
95.21K /
10 Page |
View
it Online |
Download Datasheet |
| |
|
|
EUDYNA[Eudyna Devices Inc]
|
| Part No. |
F0100504B
|
| OCR Text |
...ng to SEI's authorized rules. A microscope inspection is conducted in conformance with the MIL-STD-883C Method 2010.7.
Precautions Owing to their small dimensions, the GaAsFET's from which the F0100504B is designed are easily damaged or ... |
| Description |
3.3V/5V 2.5Gb/s NRZ Receiver Transimpedance Amplifier
|
| File Size |
182.36K /
13 Page |
View
it Online |
Download Datasheet |
| |
|
|
EUDYNA[Eudyna Devices Inc]
|
| Part No. |
F0100505B
|
| OCR Text |
...ng to SEI's authorized rules. A microscope inspection is conducted in conformance with the MIL-STD883C Method 2010.7. Precautions Owing to their small dimensions, the GaAs FET's from which the F0100505B is designed are easily damaged or de... |
| Description |
3.3 V /5V 2.5 Gb/s NRZ Receiver Transimpedance Amplifier
|
| File Size |
560.54K /
12 Page |
View
it Online |
Download Datasheet |
|
Price and Availability
|
