| |
|
 |
INTERSIL[Intersil Corporation]
|
| Part No. |
HCTS244MS HCTS244D HCTS244DMSR HCTS244HMSR HCTS244K HCTS244KMSR
|
| OCR Text |
...ROUPS Initial Test (Preburn-In) interim Test I (Postburn-In) interim Test II (Postburn-In) PDA interim Test III (Postburn-In) PDA Final Test Group A (Note 1) Group B Subgroup B-5 Subgroup B-6 Group D NOTE: 1. Alternate group A testing in ac... |
| Description |
Radiation Hardened Octal Buffer/Line Driver, Three-State
|
| File Size |
191.39K /
10 Page |
 View
it Online |
Download Datasheet
|
| |
|
|
INTERSIL[Intersil Corporation]
|
| Part No. |
CD4070BMS CD4077BMS FN3322 CD4070 CD4077
|
| OCR Text |
...ROUP Initial Test (Pre Burn-In) interim Test 1 (Post Burn-In) interim Test 2 (Post Burn-In) PDA (Note 1) interim Test 3 (Post Burn-In) MIL-STD-883 METHOD 100% 5004 100% 5004 100% 5004 100% 5004 100% 5004 GROUP A SUBGROUPS 1, 7, 9 1, 7, 9 1,... |
| Description |
Exclusive-OR and Exclusive NOR Gates, 2-Input, Quad, Rad-Hard, CMOS, Logic
CMOS Quad Exclusive OR and Exclusive NOR Gates
From old datasheet system
|
| File Size |
71.64K /
8 Page |
View
it Online |
Download Datasheet |
| |
|
|
INTERSIL[Intersil Corporation]
Intersil, Corp.
|
| Part No. |
HCTS20MS HCTS20D_SAMPLE HCTS20DMSR HCTS20HMSR HCTS20K_SAMPLE HCTS20KMSR HCTS20D/SAMPLE HCTS20K/SAMPLE
|
| OCR Text |
...ROUPS Initial Test (Preburn-In) interim Test I (Postburn-In) interim Test II (Postburn-In) PDA interim Test III (Postburn-In) PDA Final Test Group A (Note 1) Group B Subgroup B-5 Subgroup B-6 Group D NOTE: 1. Alternate group A inspection in... |
| Description |
NAND-Gate, 4-Input, TTL Inputs, Dual, Rad-Hard, High-Speed, CMOS, Logic
Switch Boot; For Use With:Toggle Switches
Radiation Hardened Dual 4-Input NAND Gate HCT SERIES, DUAL 4-INPUT NAND GATE, CDFP14
|
| File Size |
163.38K /
8 Page |
View
it Online |
Download Datasheet |
| |
|
|
Intersil, Corp.
INTERSIL[Intersil Corporation]
|
| Part No. |
HCTS20KMSR CTS20MS HCTS20D HCTS20DMSR HCTS20HMSR HCTS20K
|
| OCR Text |
...ROUPS Initial Test (Preburn-In) interim Test I (Postburn-In) interim Test II (Postburn-In) PDA interim Test III (Postburn-In) PDA Final Test Group A (Note 1) Group B Subgroup B-5 Subgroup B-6 Group D NOTE: 1. Alternate group A inspection in... |
| Description |
Radiation Hardened Dual 4-Input NAND Gate 辐射加固双路4输入与非
|
| File Size |
131.75K /
9 Page |
View
it Online |
Download Datasheet |
| |
|
|
INTERSIL[Intersil Corporation]
|
| Part No. |
HCTS157MS HCTS157D HCTS157DMSR HCTS157HMSR HCTS157K HCTS157KMSR
|
| OCR Text |
...ROUPS Initial Test (Preburn-In) interim Test I (Postburn-In) interim Test II (Postburn-In) PDA interim Test III (Postburn-In) PDA Final Test Group A (Note 1) Group B Subgroup B-5 Subgroup B-6 Group D NOTE: 1. Alternate Group A testing in ac... |
| Description |
Radiation Hardened Quad 2-Input Multiplexers
|
| File Size |
131.68K /
10 Page |
View
it Online |
Download Datasheet |
|
Price and Availability
|
