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For bed Found Datasheets File :: 3395    Search Time::1.75ms    
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    IDT
Part No. 74FST32XL384_DS_67192 IDT74FST32XL384PA IDT74FST32XL384PV8 IDT74FST32XL384PA8
OCR Text ...ated Device Technology, Inc. bed BEB INDUSTRIAL TEMPERATURE RANGE 1 (c) 2002 Integrated Device Technology, Inc. JUNE 2002 DSC-4681/1 IDT74FST32XL384 20-BIT BUS SWITCH INDUSTRIAL TEMPERATURE RANGE PIN CONFIGURATION BEA ...
Description 20-Bit Bus Switch
From old datasheet system
BUS SWITCH|CMOS|TSSOP|48PIN|PLASTIC 总线开关|的CMOS | TSSOP封装| 48PIN |塑料

File Size 63.84K  /  6 Page

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    Cypress Semiconductor Corp.
Part No. CY2210
OCR Text ...high frequency Enables ATE and "bed of nails" testing Widely available, standard package enables lower cost SSOP Top View REFCLK [0-1] (14.318 MHz) VSSREF REFCLK0 REFCLK1 VDDREF 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 ...
Description 133-MHz Spread Spectrum Clock Synthesizer/Driver with AGP, USB, and DRCG Support(由AGP,USBB>DRCG支持33MHz宽频谱时钟合成器/驱动
From old datasheet system

File Size 128.96K  /  9 Page

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    Cypress Semiconductor Corp.
Part No. CY2215
OCR Text ...high frequency Enables ATE and "bed of nails" testing Widely available, standard package enables lower cost Logic Block Diagram SEL0 REFCLK0 (14.318 MHz) REFCLK1 (14.318 MHz) CPUCLK [0-2] SEL0/REFCLK0 REFCLK1 VDDREF XTALIN XTALOUT VS...
Description 133-MHz Spread Spectrum Frequency Timing Generator(133MHz 宽频谱定时发生器)
From old datasheet system

File Size 107.89K  /  8 Page

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    Xilinx
Part No. DS041 XCR5128
OCR Text ...global 3-state pin facilitates "bed of nails" testing without using logic resources Available in PLCC, VQFP, and PQFP packages Available in both Commercial and Industrial grades Description The XCR5128 CPLD (Complex Programmable Logic D...
Description From old datasheet system
Product Specification

File Size 116.35K  /  20 Page

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    Cypress Semiconductor Corp.
Part No. W208D
OCR Text ...s: 2. Provided for board-level "bed of nails" testing. 3. "Normal" mode of operation. 4. TCLK is a test clock overdriven on the XTAL_IN input during test mode. 5. Required for DC output impedance verification. 6. Range of reference frequenc...
Description FTG for Integrated Core Logic with 133-MHz FSB(B>133MHz FSB的应用于集成核心逻辑器件的频率定时发生器(FTG
From old datasheet system

File Size 157.55K  /  13 Page

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