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Lineage Power
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| Part No. |
10209
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| OCR Text |
...damage to the device. these are abso- lute stress ratings only. functional operation of the device is not implied at these or any other conditions in excess of those given in the operational sections of the data sheet. exposure to absolute... |
| Description |
1:1 Redundancy Switch Units(1冗余度开关单
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| File Size |
118.25K /
4 Page |
 View
it Online |
Download Datasheet
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Elite Semiconductor
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| Part No. |
M12L128168A
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| OCR Text |
...nent device damage may occur if abso lute maximum rating are exceeded. functional operation should be restrict ed to recommended operating condition. exposure to higher than recommended voltage for exten ded periods of time could affect d... |
| Description |
Dynamic RAM
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| File Size |
761.30K /
45 Page |
View
it Online |
Download Datasheet |
| |
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Elite Semiconductor
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| Part No. |
M12L128324A
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| OCR Text |
...nent device damage may occur if abso lute maximum rating are exceeded. functional operation should be restrict ed to recommended operating condition. exposure to higher than recommended voltage for exten ded periods of time could affect d... |
| Description |
Dynamic RAM
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| File Size |
790.23K /
46 Page |
View
it Online |
Download Datasheet |
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Atmel
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| Part No. |
AT17LV010-10DP
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| OCR Text |
...ons is not implied. exposure to abso- lute maximum rating conditions for extended periods of time may affect device reliability. storage temperature ..................................... -65 c to +150 c voltage on any pin with respect to... |
| Description |
AT17LV010-10DP Advance Information [Updated 7/03. 11 Pages]
FPGA Configuration EEPROM packaged in the 28-pin 400 mils wide FP package.
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| File Size |
133.82K /
11 Page |
View
it Online |
Download Datasheet |
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Price and Availability
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