| PART |
Description |
Maker |
| TLP3116 |
MEASUREMENT INSTRUMENTS LOGIC IC TESTERS/MEMORY TESTERS BOARD TESTERS/SCANNERS
From old datasheet system
|
Toshiba Corporation
TOSHIBA[Toshiba Semiconductor]
|
| TLP3115-14 |
MEASUREMENT INSTRUMENTS LOGIC IC TESTERS / MEMORY TESTERS BOARD TESTERS / SCANNERS
|
Toshiba Semiconductor
|
| TLP3113 |
MEASUREMENT INSTRUMENTS LOGIC IC TESTERS MEMORY TESTERS BOARD TESTERS SCANNERS
|
Toshiba Corporation
Toshiba Semiconductor
|
| TLP3215 |
LOGIC IC TESTERS / MEMORY TESTERS
|
Toshiba Semiconductor
|
| TLP3241 |
Logic IC Testers / Memory Testers
|
Toshiba Semiconductor
|
| CAT28F010 CAT28F010TI-70T CAT28F010PI-70T CAT28F01 |
120ns 2M-bit CMOS flash memory
90ns 2M-bit CMOS flash memory
70ns 2M-bit CMOS flash memory
1 Megabit CMOS Flash Memory
High Speed CMOS Logic 8-Stage Shift-and-Store Bus Register with 3-Stage Outputs 16-PDIP -55 to 125
|
http://
CATALYST[Catalyst Semiconductor]
|
| 6171-0 6171-2 |
Test Companion Test Kit For Fluke 20 & 70 Series DMM’s
|
Pomona Electronics
|
| 0040.1061 0040.1062 0040.1141 0040.1142 |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN
|
Schurter Inc.
|
| IT3M-200S-BGA IT3D-200S-BGA IT3D-300S-BGA IT3M-300 |
IT3 Test Vehicle Assembly Yield Test
|
Hirose Electric
|
| 29C256 AT29C256-15 AT29C256-70TC AT29C256-90PC AT2 |
256K 32K x 8 5-volt Only CMOS Flash Memory
High Speed CMOS Logic 8-Bit Shift Register with Input Storage 16-SO -55 to 125
High Speed CMOS Logic 4-by-4 Register File 16-PDIP -55 to 125
High Speed CMOS Logic 4-by-4 Register File 16-SOIC -55 to 125
|
Atmel Corp.
|
