| PART |
Description |
Maker |
| 28229-PCN-001-A 28973-DSH-001-A-15 |
Test and Ship Location Change for CX28224/5/9 Inverse Multiplexing
Single-Chip SDSL/HDSL Transceiver
|
M/A-COM Technology Solutions, Inc.
M/A-COM Technology Solution...
|
| 6249-12-0 6249-24-0 6249-48-0 6249-24-2 6249-12-2 |
Test Clip To Multi-Stacking Banana Plug Test Lead
|
Pomona Electronics
|
| 5523 3781 |
Connector assemblies, Hooks Test; RoHS Compliant: Yes INTERCONNECTION DEVICE
Minigrabber Test Clip Patch Cord
|
Pomona Electronics
|
| 0040.1012 0040.1013 0040.1015 0040.1011 0040.1014 |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN
|
Schurter Inc.
|
| 50PA-420 |
LC HANDOVER TEST SYSTEM
|
JFW Industries, Inc.
|
| 50PA-560 |
HANDOVER TEST SYSTEM
|
JFW Industries, Inc.
|
| MC33390 ON1047 |
Class B Serlal Llnk Transceiver
J-1850 SERIAL LINK TRANSCEIVER
From old datasheet system
|
Motorola
ON Semi
|
| US-TUVR-4428 |
IEC SYSTEM FOR MUTUAL RECOGNITION OF TEST CERTIFICATES FOR ELECTRICAL...
|
SL Power Electronics
|
| 0040.1211 0040.1212 0040.1213 |
TEST JACKS, TEST PROBES
|
Schurter Inc.
|
| IDT59910A IDT59910A-7SOI IDT59910A-2SO IDT59910A-2 |
LOW SKEW PLL CLOCK DRIVER TURBOCLOCK JR. PLL BASED CLOCK DRIVER, 8 TRUE OUTPUT(S), 0 INVERTED OUTPUT(S), PDSO24
Scan Test Devices With 18-Bit Universal Bus Transceiver 64-LQFP -40 to 85
Scan Test Devices With 18-Bit Bus Transceivers 56-SSOP -40 to 85
LOW SKEW PLL CLOCK DRIVER TURBOCLOCK? JR.
|
Kycon, Inc.
Integrated Device Technology, Inc.
IDT[Integrated Device Technology]
|
| 74LVC646A_3 74LVC646A 74LVC646APWDH |
LVC/LCX/Z SERIES, 8-BIT REGISTERED TRANSCEIVER, TRUE OUTPUT, PDSO24
From old datasheet system
Octal bus transceiver/register (3-State)
|
NXP SEMICONDUCTORS
Philips
|
| DK-21169 |
IEC SYSTEM FOR MUTUAL RECOGNITION OF TEST CERTIFICATES FOR ELECTRICAL EQUIPMENT (IECEE) CB SCHEME
|
SL Power Electronics
|
