| PART |
Description |
Maker |
| SN54LVTH182512HKC SN54LVTH18512HKC |
3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
|
http://
|
| MAX1203BC/D MAX1202BC/D MAX1202AEPP MAX1202BCAP |
5v, 8-cHANNEL, sERIAL, 12-bIT adcS WITH 3v dIGITAL iNTERFACE 8-CH 12-BIT SUCCESSIVE APPROXIMATION ADC, SERIAL ACCESS, PDSO20
Scan Test Devices With 18-Bit Bus Transceivers 56-SSOP -40 to 85
DIODE VOLTAGE SUPPRESSOR 170V
5v / 8-cHANNEL / sERIAL / 12-bIT adcS WITH 3v dIGITAL iNTERFACE
|
Maxim Integrated Products, Inc.
|
| SCANPSC110FSC |
SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support)
|
Fairchild Semiconductor Corporation
|
| TA1316AN |
YCbCr/YPbPr Signal and Sync Processor for Digital TV, Progressive Scan TV and Double Scan TV
|
Toshiba Corporation
|
| TA1360ANG TA1360ANG05 |
YCbCr/YPbPr Signal and Sync Processor for Digital TV, Progressive Scan TV and Double Scan TV
|
Toshiba Semiconductor
http://
|
| TA1316AN |
YCbCr/YPbPr Signal and Sync Processor for Digital TV, Progressive Scan TV and Double Scan TV
|
Toshiba Semiconductor
|
| MAX6023EBT |
CHIP SCALE DEVICES
3.3-V ABT Octal Transparent D-type Latches With 3-State Outputs 20-CFP -55 to 125 芯片级器
|
MAXIM - Dallas Semiconductor
MAXIM[Maxim Integrated Products]
Maxim Integrated Products, Inc.
|
| 0040.1031 0040.1032 0040.1033 0040.1034 0040.1035 |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN
|
Schurter Inc.
|
| 6245-48-0 6245-48-2 |
Test Clip to Straight Sheathed Banana Plug
Connector assemblies, IC clips Test; RoHS Compliant: Yes INTERCONNECTION DEVICE
|
Pomona Electronics
|
| EPC4 EPC8 |
Configuration Devices for SRAM-Based LUT Devices
|
Altera Corporation
|
