| PART |
Description |
Maker |
| 690-997-66 690-946-66 690-940-66 690-930-66 690-53 |
UL Certified - Certificate Number 20120419-E349017 High Intensity LED Panel Indicator
|
Marl International Limited
|
| 6249-12-0 6249-24-0 6249-48-0 6249-24-2 6249-12-2 |
Test Clip To Multi-Stacking Banana Plug Test Lead
|
Pomona Electronics
|
| 5523 3781 |
Connector assemblies, Hooks Test; RoHS Compliant: Yes INTERCONNECTION DEVICE
Minigrabber Test Clip Patch Cord
|
Pomona Electronics
|
| 0040.1061 0040.1062 0040.1141 0040.1142 |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN
|
Schurter Inc.
|
| 0040.1211 0040.1212 0040.1213 |
TEST JACKS, TEST PROBES
|
Schurter Inc.
|
| 6470 |
Test Probe; Leaded Process Compatible:Yes; Peak Reflow Compatible (260 C):Yes RoHS Compliant: Yes INTERCONNECTION DEVICE
SMD Microtip Test Probe Set
|
Pomona Electronics
|
| 44281-0001 44281-0002 44281-0003 44281-0004 44281- |
Mini-Fit Test Plugs
Mini-Fit垄芒 Test Plugs
|
Molex Electronics Ltd.
|
| 4000-CU-VDSL-INF 4000-WBTONES 4000-TDR |
T-BERD?/MTS-4000Multiple Services Test Platform
T-BERD垄莽/MTS-4000Multiple Services Test Platform
|
JDS Uniphase Corporation
|
| IDT5V991A-2JG IDT5V991A-2JI IDT5V991A-5J IDT5V991A |
3.3V PROGRAMMABLE SKEW PLL CLOCK DRIVER TURBOCLOCK 5V SERIES, PLL BASED CLOCK DRIVER, 8 TRUE OUTPUT(S), 0 INVERTED OUTPUT(S), PQCC32
Scan Test Devices With 18-Bit Inverting Bus Transceivers 56-SSOP -40 to 85
Scan Test Devices With 20-Bit Universal Bus Transceivers 64-LQFP -40 to 85
From old datasheet system
|
Integrated Device Technology, Inc.
IDT[Integrated Device Technology]
|
| MB3015USB-4 |
Electrical Characteristics Test Condition (Vs= 2 . 0 V, RL= 2 . 2 k ohm, Ta=20°C, RH=65%)
Electrical Characteristics Test Condition (Vs= 2 . 0 V, RL= 2 . 2 k ohm, Ta=20隆?C, RH=65%)
|
Knowles Electronics
|
| MB6022NSC-2 |
Electrical Characteristics Test Condition (Vs= 2 . 0 V, RL= 2 . 2 k ohm, Ta=20°C, RH=65%)
Electrical Characteristics Test Condition (Vs= 2 . 0 V, RL= 2 . 2 k ohm, Ta=20隆?C, RH=65%)
|
Knowles Electronics
|
