PART |
Description |
Maker |
0040.1211 0040.1212 0040.1213 |
TEST JACKS, TEST PROBES
|
Schurter Inc.
|
6364 |
Replacement Tips For 080 Series Test Probes
|
Pomona Electronics
|
6249-12-0 6249-24-0 6249-48-0 6249-24-2 6249-12-2 |
Test Clip To Multi-Stacking Banana Plug Test Lead
|
Pomona Electronics
|
IT3M-200S-BGA IT3D-200S-BGA IT3D-300S-BGA IT3M-300 |
IT3 Test Vehicle Assembly Yield Test
|
Hirose Electric
|
CA-PLCC052-Z-P-T-01 |
Carrier Adapter 52 position PLCC ZIF socket with test probes to male PLCC plug. Two piece adapter connects via a gold plated mini grid receptacle.
|
Ironwood Electronics.
|
AP160L AP160 |
8-BIT MICROCONTROLLER WITH 8KB OTP ECONOLINE: REC3-S_DRW(Z)/H4,H6 - Safety standards and approval: EN 60950 certified, rated for 250VAV (LVD test report)- Applied for Ul 1950 Component Zener Diode; Zener Voltage Typ, Vz:5.1V; Vz Test Current, Izt:20mA; Power Dissipation, Pd:500mW; Package/Case:41-MiniDIP; Leaded Process Compatible
|
AMIC Technology Corporation
|
16043A 16043B |
16043A 3-Terminal SMD Test Fixture 16043B 3-Terminal SMD Test Fixture
|
Agilent (Hewlett-Packard)
|
72913-0 72912-0 5931-0 3265 3261 |
Banana adapter; Color:Black; Features:Panel mount IEC1010 banana jacks for sheathed plugs, solder tab, black INTERCONNECTION DEVICE Banana adapter; Color:Black; Features:Panel mount IEC1010 banana jacks for sheathed plugs, threaded stud, black INTERCONNECTION DEVICE Banana Jack; For Use With:Pomona Types 5907A, 5908A, 5909A Sheathed DMM Test Leads; Insulator Material:Nylon; Mounting Type:Panel; Panel Thickness Max:0.28" RoHS Compliant: Yes INTERCONNECTION DEVICE Connector RoHS Compliant: Yes INTERCONNECTION DEVICE
|
Pomona Electronics
|
IDT5V991A-2JG IDT5V991A-2JI IDT5V991A-5J IDT5V991A |
3.3V PROGRAMMABLE SKEW PLL CLOCK DRIVER TURBOCLOCK 5V SERIES, PLL BASED CLOCK DRIVER, 8 TRUE OUTPUT(S), 0 INVERTED OUTPUT(S), PQCC32 Scan Test Devices With 18-Bit Inverting Bus Transceivers 56-SSOP -40 to 85 Scan Test Devices With 20-Bit Universal Bus Transceivers 64-LQFP -40 to 85 From old datasheet system
|
Integrated Device Technology, Inc. IDT[Integrated Device Technology]
|
44242-0001 44242-0002 44242-0003 44242-0004 44242- |
Micro-Fit 3.0垄芒 Test Plugs Won隆炉t Damage Mating Contact Micro-Fit 3.0 Test Plugs Won’t Damage Mating Contact
|
Molex Electronics Ltd.
|
3787-C-18 3787-C-60 5187-K-48 |
Connector assemblies, IC clips Test; RoHS Compliant: Yes INTERCONNECTION DEVICE Connector assemblies, IC clips Test; INTERCONNECTION DEVICE
|
Pomona Electronics
|