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 2SJ619
TOSHIBA Field Effect Transistor Silicon P Channel MOS Type (L2-F-MOSV)
2SJ619
Switching Regulator and DC-DC Converter Applications Motor Drive Applications
* * * * * 4-V gate drive Low drain-source ON resistance: RDS (ON) = 0.15 W (typ.) High forward transfer admittance: iYfsi = 7.7 S (typ.) Low leakage current: IDSS = -100 A (max) (VDS = -100 V) Enhancement-model: Vth = -0.8 to -2.0 V (VDS = -10 V, ID = -1 mA) Unit: mm
Maximum Ratings (Ta = 25C)
Characteristics Drain-source voltage Drain-gate voltage (RGS = 20 kW) Gate-source voltage Drain current DC Pulse (Note 1) (Note 1) Symbol VDSS VDGR VGSS ID IDP PD EAS IAR EAR Tch Tstg Rating -100 -100 20 -16 -64 75 292 -16 7.5 150 -55 to150 Unit V V V A
JEDEC
W mJ A mJ C C
SC-97 2-9F1B
Drain power dissipation (Tc = 25C) Single pulse avalanche energy (Note 2) Avalanche current Repetitive avalanche energy (Note 3) Channel temperature Storage temperature range
JEITA TOSHIBA
Weight: 0.74 g (typ.)
Circuit Configuration
4
Thermal Characteristics
Characteristics Thermal resistance, channel to case Symbol Rth (ch-c) Max 1.67 Unit C/W 1
Note 1: Please use devices on condition that the channel temperature is below 150C. Note 2: VDD = -25 V, Tch = 25C (initial), L = 1.84 mH, RG = 25 W, IAR = -16 A Note 3: Repetitive rating: Pulse width limited by maximum channel temperature This transistor is an electrostatic sensitive device. Please handle with caution.
3
1
2002-08-09
2SJ619
Electrical Characteristics (Ta = 25C)
Characteristics Gate leakage current Drain cut-OFF current Drain-source breakdown voltage Gate threshold voltage Drain-source ON resistance Forward transfer admittance Input capacitance Reverse transfer capacitance Output capacitance Rise time Symbol IGSS IDSS V (BR) DSS Vth RDS (ON) iYfsi Ciss Crss Coss tr VDS = -10 V, VGS = 0 V, f = 1 MHz Test Condition VGS = 16 V, VDS = 0 V VDS = -100 V, VGS = 0 V ID = -10 mA, VGS = 0 V VDS = -10 V, ID = -1 mA VGS = -4 V, ID = -6 A VGS = -10 V, ID = -6 A VDS = -10 V, ID = -6 A 4.5 3/4 3/4 3/4 3/4 VOUT 3/4 50 9 RL = 6.25 W 3/4 Duty < 1%, tw = 10 ms = VDD ~ -50 V 3/4 3/4 VDD ~ -80 V, VGS = -10 V, ID = -16 A 3/4 3/4 65 48 29 19 3/4 3/4 3/4 3/4 nC 18 3/4 30 3/4 ns Min 3/4 3/4 Typ. 3/4 3/4 3/4 3/4 0.25 0.15 7.7 1100 210 440 18 Max 10 Unit mA mA V V W S
-100
3/4
-100 -0.8
3/4
-2.0
0.32 0.21 3/4 3/4 3/4 3/4 3/4
pF
Turn-ON time Switching time Fall time
ton
0V VGS -10 V
ID = -8 A
tf
Turn-OFF time Total gate charge (gate-source plus gate-drain) Gate-source charge Gate-drain ("miller") charge
toff Qg Qgs Qgd
Source-Drain Ratings and Characteristics (Ta = 25C)
Characteristics Continuous drain reverse current (Note 1) Pulse drain reverse current Forward voltage (diode) Reverse recovery time Reverse recovery charge (Note 1) Symbol IDR IDRP VDSF trr Qrr Test Condition 3/4 3/4 IDR = -16 A, VGS = 0 V IDR = -16 A, VGS = 0 V, dIDR/dt = 50 A/ms Min 3/4 3/4 3/4 3/4 3/4 Typ. 3/4 3/4 3/4 160 0.5 Max -16 -64 1.7 3/4 3/4 Unit A A V ms mC
Marking
Lot Number J619
Type
Month (starting from alphabet A) Year (last number of the christian era)
2
2002-08-09
2SJ619
ID - VDS
-5 Common source Tc = 25C pulse test -8 -3 -2.5 -20 -10 -6 -4 -3 -16 -8 -10
ID - VDS
Common source Tc = 25C pulse test -4
-4
-6
(A)
ID
ID Drain current
(A)
-12
Drain current
-3.5 -8 -3 -4 -2.5 VGS = -2 V
-2
-1 VGS = -2 V 0 0
-0.4
-0.8
-1.2
-1.6
-2.0
0 0
-2
-4
-6
-8
-10
Drain-source voltage
VDS
(V)
Drain-source voltage
VDS
(V)
ID - VGS
-10 Common source VDS = -10 V pulse test -3.2
VDS - VGS
Common source Tc = 25C pulse test
-8
(A)
25 -6
VDS Drain-source voltage
(V)
-2.4 -1.6
Drain current
ID
-4
ID = -8 A
-2 100 Tc = -55C 0 0 -1 -2 -3 -4 -5 -6
-0.8
-4 -2
0 0
-4
-8
-12
-16
-20
Gate-source voltage
VGS
(V)
Gate-source voltage
VGS
(V)
iYfsi - ID
50
RDS (ON) - ID
3.0 Common source Tc = 25C Pulse test
(S)
Common source 30 VDS = -10 V Pulse test
iYfsi
Drain-source on resistance
1.0
Forward transfer admittance
(9) RDS (ON)
10 25 5
Tc = -55C
0.5 0.3 VGS = -4 V -10 0.1 0.05
100 3
1 -0.3
-1
-3
-10
-30
0.03 -0.1
-0.3
-1
-3
-10
-20
Drain current
ID
(A)
Drain current
ID
(A)
3
2002-08-09
2SJ619
RDS (ON) - Tc
(W)
0.5 -30 Common source pulse test 0.4 -4 0.3 -2 0.2 V GS = -4 V ID = -8 V -8 -2, 4 Common source Tc = 25C pulse test -10 -5 -3 VGS = -10 V -5 -3
IDR - VDS
RDS (ON)
Drain-source on resistance
Drain reverse current IDR
(A)
-1.0 -0.5
0.1 VGS = -10 V 0 -80
-2 -1
0, 1 0.6 0.8 1.0
-40
0
40
80
120
160
-0.3 0
0.2
0.4
Case temperature
Tc
(C)
Drain-source voltage
VDS
(V)
Capacitance - VDS
5000 3000 -4
Vth - Tc
Common source VDS = -10 V ID = -1 mA pulse test
(pF)
1000 500 300
Ciss
Gate threshold voltage Vth (V)
-100
-3
Capacitance C
Coss Crss
-2
100 50 30 Common source VGS = 0 V f = 1 MHz Tc = 25C -0.3 -1 -3 -10 -30
-1
10 -0.1
0 -80
-40
0
40
80
120
160
Drain-source voltage
VDS
(V)
Case temperature Tc
(C)
PD - Tc
100 -100
Dynamic input/output characteristics
Common source ID = -16 A Tc = 25C pulse test VDS -60 VDD = -80 V -40 -20 -20 VGS 0 0 0 100 -4 -40 -8 -12 -20
(W)
(V)
80
-80
-16
Drain power dissipation
40
20
0 0
Drain-source voltage
40
80
120
160
200
20
40
60
80
Case temperature
Tc
(C)
Total gate charge Qg (nC)
4
2002-08-09
Gate-source voltage
60
VDS
VGS
PD
(V)
2SJ619
rth - tw
10
Normalized transient thermal impedance rth (t)/Rth (ch-a)
3
1 Duty = 0.5 0.3 0.2 0.1 0.1 0.05 0.02 0.03 0.01 0.01 10 m 100 m 1m 10 m 100 m Single pulse PDM t T Duty = t/T Rth (ch-c) = 1.67C/W 1 10
Pulse width
tw
(S)
Safe operating area
-1000 500
EAS - Tch
(mJ)
100 ms *
400
Avalanche energy EAS
-100 ID max (pulsed) *
(A)
300
ID max (continuous) -10 DC operation Tc = 25C -1 *: Single nonrepetitive pulse Tc = 25C Curves must be derated linearly with increase in temperature. -1 -10 1 ms *
ID
Drain current
200
100
-0.1 -0.1
VDSS max -100 -1000
0 25
50
75
100
125
150
Channel temperature (initial) Tch (C)
Drain-source voltage
VDS
(V)
15 V -15 V
BVDSS IAR VDD VDS
Test circuit RG = 25 W VDD = -25 V, L = 1.84 mH
AS =
Wave form
ae o 1 B VDSS / x L x I2 x c cB / 2 VDSS - VDD o e
5
2002-08-09
2SJ619
RESTRICTIONS ON PRODUCT USE
000707EAA
* TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc.. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this document shall be made at the customer's own risk. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any intellectual property or other rights of TOSHIBA CORPORATION or others. * The information contained herein is subject to change without notice.
6
2002-08-09


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