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| PD - 94348A HEXFET(R) POWER MOSFET SURFACE MOUNT (SMD-1) IRL7N1404 40V, N-CHANNEL Product Summary Part Number IRL7N1404 BVDSS 40V RDS(on) 0.006 ID 55A* Seventh Generation HEXFET(R) power MOSFETs from International Rectifier utilize advanced processing techniques to achieve the lowest possible on-resistance per silicon unit area. This benefit, combined with the fast switching speed and ruggedized device design that HEXFET power MOSFETs are well known for, provides the designer with an extremely efficient device for use in a wide variety of applications. These devices are well-suited for applications such as switching power supplies, motor controls, inverters, choppers, audio amplifiers and high-energy pulse circuits. SMD-1 Features: n n n n n n n n n Low RDS(on) Avalanche Energy Ratings Dynamic dv/dt Rating Simple Drive Requirements Ease of Paralleling Hermetically Sealed Light Weight Surface Mount LogicGate Drive Absolute Maximum Ratings Parameter ID @ VGS = 10V, TC = 25C ID @ VGS = 10V, TC = 100C IDM PD @ TC = 25C VGS EAS IAR EAR dv/dt TJ T STG Continuous Drain Current Continuous Drain Current Pulsed Drain Current Max. Power Dissipation Linear Derating Factor Gate-to-Source Voltage Single Pulse Avalanche Energy Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt Operating Junction Storage Temperature Range Package Mounting Surface Temp. Weight * Current is limited by package For footnotes refer to the last page 55* 55* 220 100 0.8 20 300 55 10 2.0 -55 to 150 300 (for 5s) 2.6 (Typical) Units A W W/C V mJ A mJ V/ns o C g www.irf.com 1 04/26/02 IRL7N1404 Electrical Characteristics @ Tj = 25C (Unless Otherwise Specified) Parameter BVDSS Drain-to-Source Breakdown Voltage BV DSS/T J Temperature Coefficient of Breakdown Voltage RDS(on) Static Drain-to-Source On-State Resistance VGS(th) Gate Threshold Voltage gfs Forward Transconductance IDSS Zero Gate Voltage Drain Current Min 40 -- -- -- 1.0 93 -- -- -- -- -- -- -- -- -- -- -- -- Typ Max Units -- 0.041 -- -- -- -- -- -- -- -- -- -- -- -- -- -- -- 4.0 -- -- 0.006 0.008 3.0 -- 20 250 200 -200 115 37 45 40 356 63 96 -- V V/C V S( ) A Test Conditions VGS = 0V, ID = 250A Reference to 25C, ID = 1.0mA VGS = 10V, ID = 55A VGS = 4.5V, ID = 55A VDS = VGS, ID = 250A VDS =10V, IDS = 55A VDS = 40V ,VGS=0V VDS = 32V, VGS = 0V, TJ =125C VGS = 20V VGS = -20V VGS =5.0V, ID = 55A VDS = 32V VDD = 20V, ID = 55A, VGS = 5.0V, RG = 2.5 IGSS IGSS Qg Q gs Q gd td(on) tr td(off) tf LS + LD l Ciss C oss C rss Gate-to-Source Leakage Forward Gate-to-Source Leakage Reverse Total Gate Charge Gate-to-Source Charge Gate-to-Drain (`Miller') Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Total Inductance nA nC ns nH Measured from the center of drain pad to the center of source pad VGS = 0V, VDS = 25V f = 1.0MHz Input Capacitance Output Capacitance Reverse Transfer Capacitance -- -- -- 6470 1600 165 -- -- -- pF Source-Drain Diode Ratings and Characteristics Parameter IS ISM VSD t rr QRR ton Continuous Source Current (Body Diode) Pulse Source Current (Body Diode) Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge Forward Turn-On Time Min Typ Max Units -- -- -- -- -- -- -- -- -- -- 55* 220 1.3 125 230 Test Conditions A V ns nC Tj = 25C, IS = 55A, VGS = 0V Tj = 25C, IF = 55A, di/dt 100A/s VDD 25V Intrinsic turn-on time is negligible. Turn-on speed is substantially controlled by LS + LD. * Current is limited by package Thermal Resistance Parameter RthJC Junction-to-Case Min Typ Max Units -- -- 1.25 C/W Test Conditions Note: Corresponding Spice and Saber models are available on the G&S Website. For footnotes refer to the last page 2 www.irf.com IRL7N1404 1000 VGS TOP 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V BOTTOM 4.3V 1000 VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V BOTTOM 4.3V TOP ID, Drain-to-Source Current (A) 4.3V ID, Drain-to-Source Current (A) 4.3V 100 100 20s PULSE WIDTH Tj = 25C 10 0.1 1 10 100 20s PULSE WIDTH Tj = 150C 10 0.1 1 10 100 VDS, Drain-to-Source Voltage (V) VDS, Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics Fig 2. Typical Output Characteristics 1000 2.0 R DS(on) , Drain-to-Source On Resistance (Normalized) ID = 55A I D , Drain-to-Source Current (A) 1.5 TJ = 25 C TJ = 150 C 1.0 0.5 100 4.0 15 V DS = 15V 20s PULSE WIDTH 5.5 6.0 4.5 5.0 6.5 0.0 -60 -40 -20 VGS = 10V 0 20 40 60 80 100 120 140 160 VGS , Gate-to-Source Voltage (V) TJ , Junction Temperature( C) Fig 3. Typical Transfer Characteristics Fig 4. Normalized On-Resistance Vs. Temperature www.irf.com 3 IRL7N1404 10000 VGS , Gate-to-Source Voltage (V) 8000 VGS = Ciss = Crss = Coss = 0V, f = 1MHz Cgs + Cgd , Cds SHORTED Cgd Cds + Cgd 20 ID = 55A 16 C, Capacitance (pF) Ciss 6000 VDS = 32V VDS = 20V VDS = 8V 12 4000 C oss 8 2000 4 C rss 0 1 10 100 0 0 50 100 FOR TEST CIRCUIT SEE FIGURE 13 150 200 250 VDS , Drain-to-Source Voltage (V) QG , Total Gate Charge (nC) Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage 1000 1000 OPERATION IN THIS AREA LIMITED BY R DS(on) ISD , Reverse Drain Current (A) 100 TJ = 150 C ID, Drain-to-Source Current (A) 100 100s 1ms 10 Tc = 25C Tj = 150C Single Pulse 1 0.1 1 10 100 VDS , Drain-toSource Voltage (V) 10 TJ = 25 C V GS = 0 V 0.6 1.0 1.4 1.8 10ms 1 0.2 VSD ,Source-to-Drain Voltage (V) Fig 7. Typical Source-Drain Diode Forward Voltage Fig 8. Maximum Safe Operating Area 4 www.irf.com IRL7N1404 100 LIMITED BY PACKAGE VGS 80 V DS RD D.U.T. + I D , Drain Current (A) RG -V DD 60 VGS Pulse Width 1 s Duty Factor 0.1 % 40 Fig 10a. Switching Time Test Circuit 20 VDS 90% 0 25 50 75 100 125 150 TC , Case Temperature ( C) 10% VGS td(on) tr t d(off) tf Fig 9. Maximum Drain Current Vs. Case Temperature Fig 10b. Switching Time Waveforms 10 Thermal Response (Z thJC ) 1 D = 0.50 0.20 0.10 0.1 0.05 0.02 0.01 SINGLE PULSE (THERMAL RESPONSE) 0.01 0.00001 Notes: 1. Duty factor D = t 1 / t 2 2. Peak T J = P DM x Z thJC + TC 0.1 0.001 0.01 P DM t1 t2 1 0.0001 t1 , Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case www.irf.com 5 IRL7N1404 800 EAS , Single Pulse Avalanche Energy (mJ) 1 5V 600 ID 24.6A 35A BOTTOM 55A TOP VD S L D R IV E R RG D .U .T. IA S 400 + V - DD A VGS 20V tp 0 .0 1 200 Fig 12a. Unclamped Inductive Test Circuit V (B R )D S S tp 0 25 50 75 100 125 150 Starting TJ , Junction Temperature ( C) Fig 12c. Maximum Avalanche Energy Vs. Drain Current IAS Fig 12b. Unclamped Inductive Waveforms Current Regulator Same Type as D.U.T. 50K 12V .2F .3F QG 10V QGS VG QGD VGS 3mA D.U.T. + V - DS IG ID Charge Current Sampling Resistors Fig 13a. Basic Gate Charge Waveform Fig 13b. Gate Charge Test Circuit 6 www.irf.com IRL7N1404 Footnotes: Repetitive Rating; Pulse width limited by maximum junction temperature. VDD = 25 V, Starting TJ = 25C, L= 0.2mH Peak IAS = 55A, VGS = 10V, RG= 25 ISD 55A, di/dt 166A/s, Pulse width 300 s; Duty Cycle 2% VDD 55V, TJ 150C Case Outline and Dimensions -- SMD-1 PAD ASSIGNMENTS IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 TAC Fax: (310) 252-7903 Visit us at www.irf.com for sales contact information. Data and specifications subject to change without notice. 04/02 www.irf.com 7 |
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