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Low Cost 1.2 g Dual Axis Accelerometer ADXL213 FEATURES Dual axis accelerometer on a single IC chip 5 mm x 5 mm x 2 mm LCC package 1 mg resolution at 60 Hz Low power: 700 A at VS = 5 V (typical) High zero g bias stability High sensitivity accuracy Pulse width modulated digital outputs X and Y axes aligned to within 0.1 (typical) BW adjustment with a single capacitor Single-supply operation 3500 g shock survival GENERAL DESCRIPTION The ADXL213 is a low cost, low power, complete dual axis accelerometer with signal conditioned, duty cycle modulated outputs, all on a single monolithic IC. The ADXL213 measures acceleration with a full-scale range of 1.2 g (typical). The ADXL213 can measure both dynamic acceleration (e.g., vibration) and static acceleration (e.g., gravity). The outputs are digital signals whose duty cycles (ratio of pulse width to period) are proportional to acceleration (30%/g). The duty cycle outputs can be directly measured by a microcontroller without an A/D converter or glue logic. Innovative design techniques are used to ensure high zero g bias stability (typically better than 0.25 mg/C), as well as tight sensitivity stability (typically better than 50 ppm/C). The typical noise floor is 160 g/Hz, allowing signals below 1 mg (0.06 of inclination) to be resolved in tilt sensing applications using narrow bandwidths (<60 Hz). The user selects the bandwidth of the accelerometer using capacitors CX and CY at the XFILT and YFILT pins. Bandwidths of 0.5 Hz to 250 Hz may be selected to suit the application. The ADXL213 is available in a 5 mm x 5 mm x 2 mm, 8-pad hermetic LCC package. APPLICATIONS Automotive tilt alarms Data projectors Navigation Platform stabilization/leveling Alarms and motion detectors High accuracy, 2-axis tilt sensing FUNCTIONAL BLOCK DIAGRAM +VS +VS CY YFILT ADXL213 CDC OUTPUT AMP DEMOD OUTPUT AMP 32k 32k YOUT DCM XOUT AC AMP SENSOR COM ST XFILT CX T2 RSET T2 T1 A(g) = (T1/T2 - 0.5)/30% 0g = 50% DUTY CYCLE T2(s) = RSET/125M 04742-0-001 Figure 1. Rev. 0 Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.326.8703 (c) 2004 Analog Devices, Inc. All rights reserved. ADXL213 TABLE OF CONTENTS Specifications..................................................................................... 3 Absolute Maximum Ratings............................................................ 4 Typical Performance Characteristics ............................................. 5 Theory of Operation ........................................................................ 8 Performance .................................................................................. 8 Applications....................................................................................... 9 Power Supply Decoupling ........................................................... 9 Setting the Bandwidth Using CX and CY.................................... 9 Self Test .......................................................................................... 9 Design Trade-Offs for Selecting Filter Characteristics: The Noise/BW Trade-Off........................................................9 Using the ADXL213 with Operating Voltages Other than 5 V................................................................................... 10 Using the ADXL213 as a Dual-Axis Tilt Sensor..................... 10 Pin Configurations and Functional Descriptions ...................... 11 Outline Dimensions ....................................................................... 12 ESD Caution................................................................................ 12 Ordering Guide .......................................................................... 12 REVISION HISTORY Revision 0: Initial Version Rev. 0 | Page 2 of 12 ADXL213 SPECIFICATIONS TA = -40C to +85C, VS = 5 V, CX = CY = 0.1 F, Acceleration = 0 g, unless otherwise noted. All minimum and maximum specifications are guaranteed. Typical specifications are not guaranteed. Table 1. Parameter SENSOR INPUT Measurement Range1 Nonlinearity Package Alignment Error Alignment Error Cross Axis Sensitivity SENSITIVITY (Ratiometric)2 Sensitivity at XOUT, YOUT Sensitivity Change due to Temperature3 ZERO g BIAS LEVEL (Ratiometric) 0 g Voltage at XOUT, YOUT Initial 0 g Output Deviation from Ideal 0 g Offset vs. Temperature NOISE PERFORMANCE Noise Density FREQUENCY RESPONSE4 CX, CY Range5 RFILT Tolerance Sensor Resonant Frequency SELF TEST6 Logic Input Low Logic Input High ST Input Resistance to Ground Output Change at XOUT, YOUT PWM Output FSET T2 Drift versus Temperature POWER SUPPLY Operating Voltage Range Quiescent Supply Current Turn-On Time7 Conditions Each axis % of full scale X sensor to Y sensor Each axis VS = 5 V VS = 5 V Each axis VS = 5 V VS = 5 V, 25C Min Typ 1.2 0.5 1 0.1 2 27 30 0.3 50 2 0.25 160 0.002 22 4.7 42 33 Max Unit g % Degrees Degrees % %/g % % % mg/C g/Hz rms F k kHz V V k % kHz % 6 1.1 V mA ms @25C 32 5.5 1 4 30 Self test 0 to 1 RSET = 125 k 50 23 1 0.3 3 0.7 20 1 2 Guaranteed by measurement of initial offset and sensitivity. Sensitivity varies with VS. At VS = 3 V, sensitivity is typically 28%/g. 3 Defined as the output change from ambient-to-maximum temperature or ambient-to-minimum temperature. 4 Actual frequency response controlled by user-supplied external capacitor (CX, CY). 5 Bandwidth = 1/(2 x x 32 k x C). For CX, CY = 0.002 F, Bandwidth = 2500 Hz. For CX, CY = 4.7 F, Bandwidth = 1 Hz. Minimum/maximum values are not tested. 6 Self-test response changes with VS. At VS = 3 V, self-test output is typically 8%. 7 Larger values of CX, CY increase turn-on time. Turn-on time is approximately 160 x CX or CY + 4 ms, where CX, CY are in F. Rev. 0 | Page 3 of 12 ADXL213 ABSOLUTE MAXIMUM RATINGS Table 2. ADXL213 Stress Ratings Parameter Acceleration (Any Axis, Unpowered) Acceleration (Any Axis, Powered) Drop Test (Concrete Surface) VS All Other Pins Output Short-Circuit Duration (Any Pin to Common) Operating Temperature Range Storage Temperature Rating 3,500 g 3,500 g 1.2 m -0.3 V to +7.0 V (COM - 0.3 V) to (VS + 0.3 V) Indefinite -55C to +125C -65C to +150C Table 3. Package Characteristics Package Type 8-Lead CLCC JA 120C/W JC 20C/W Device Weight <1.0 gram Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. TP RAMP-UP tP CRITICAL ZONE TL TO TP TEMPERATURE TL TSMAX TSMIN tL tS PREHEAT t25C TO PEAK TIME Profile Feature Average Ramp Rate (TL to TP) Preheat * * Minimum Temperature (TSMIN) Minimum Temperature (TSMAX) Condition Sn63/Pb37 Pb Free 3C/second max 100C 150C 60-120 seconds 150C 200C 60-150 seconds * Time (TSMIN to TSMAX) (tS) TSMAX to TL * Ramp-Up Rate Time Maintained above Liquidous (TL) * Liquidous Temperature (TL) 3C/second 183C 60-150 seconds 217C 60-150 seconds * Time (tL) Peak Temperature (TP) Time within 5C of Actual Peak Temperature (tP) Ramp-Down Rate Time 25C to Peak Temperature 240C +0C/-5C 260C +0C/-5C 10-30 seconds 20-40 seconds 6C/second max 6 minutes max 8 minutes max Figure 2. Recommended Soldering Profile Rev. 0 | Page 4 of 12 03757-0-002 RAMP-DOWN ADXL213 TYPICAL PERFORMANCE CHARACTERISTICS (VS = 5 V for all graphs, unless otherwise noted.) 25.0 25.0 PERCENT OF POPULATION (%) PERCENT OF POPULATION (%) 20.0 20.0 15.0 15.0 10.0 10.0 5.0 04742-0-002 5.0 04742-0-005 43 44 45 46 47 48 49 50 51 52 53 54 55 56 DUTY CYCLE OUTPUT (%) DUTY CYCLE OUTPUT (%) Figure 3. X Axis Zero g Bias Deviation from Ideal at 25C Figure 6. Y Axis Zero g Bias Deviation from Ideal at 25C 30.0 40.0 35.0 PERCENT OF POPULATION (%) 25.0 PERCENT OF POPULATION (%) 30.0 25.0 20.0 15.0 10.0 5.0 0 04742-0-006 20.0 15.0 10.0 -1.0 -0.9 -0.8 -0.7 -0.6 -0.5 -0.4 -0.3 -0.2 -0.1 0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 0 04742-0-003 5.0 TEMPCO (mg/C) Figure 4. X Axis Zero g Bias Tempco 30.0 30.0 25.0 PERCENT OF POPULATION (%) PERCENT OF POPULATION (%) 25.0 20.0 20.0 15.0 15.0 10.0 10.0 04742-0-004 28.0 28.4 28.8 29.2 29.6 30.0 30.4 30.8 31.2 31.6 32.0 0 28.0 28.4 28.8 29.2 29.6 30.0 30.4 30.8 31.2 31.6 DUTY CYCLE OUTPUT (% per g) DUTY CYCLE OUTPUT (% per g) Figure 5. X Axis Sensitivity at 25C Figure 8. Y Axis Sensitivity at 25C Rev. 0 | Page 5 of 12 32.0 0 04742-0-007 5.0 5.0 -1.0 -0.9 -0.8 -0.7 -0.6 -0.5 -0.4 -0.3 -0.2 -0.1 TEMPCO (mg/C) Figure 7. Y Axis Zero g Bias Tempco 0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 57 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 0 0 ADXL213 54.0 53.5 53.0 52.5 52.0 51.5 51.0 50.5 50.0 49.5 49.0 48.5 48.0 47.5 47.0 46.5 46.0 04742-0-008 31.50 31.25 31.00 30.75 SENSITIVITY (%/g) DUTY CYCLE (%) 30.50 30.25 30.00 29.75 29.50 29.25 04742-0-010 29.00 28.75 10 20 30 40 50 60 70 80 90 10 20 30 40 50 60 70 80 240 5.0 -30 -20 -10 -30 -20 -40 -50 -40 -10 TEMPERATURE (C) TEMPERATURE (C) Figure 9. Zero g Bias vs. Temperature - Parts Soldered to PCB Figure 12. Sensitivity vs. Temperature - Parts Soldered to PCB 40.0 35.0 40.0 35.0 PERCENT OF POPULATION (%) PERCENT OF POPULATION (%) 30.0 25.0 20.0 15.0 10.0 04742-0-009 30.0 25.0 20.0 15.0 10.0 5.0 0 04742-0-011 5.0 0 100 110 120 130 140 150 160 170 180 190 200 210 220 230 NOISE DENSITY (gHz) NOISE DENSITY (gHz) Figure 10. X Axis Noise Density at 25C Figure 13. Y Axis Noise Density at 25C 40 35 PERCENT OF POPULATION (%) 30 25 20 15 10 03757-0-005 40 35 PERCENT OF POPULATION (%) 30 25 20 15 10 5 0 03757-0-006 5 0 1.0 2.0 3.0 4.0 5.0 1.0 2.0 3.0 -5.0 -4.0 -3.0 -1.0 -5.0 -4.0 -3.0 -1.0 -2.0 PERCENT SENSITIVITY (%) Figure 11. Z vs. X Cross-Axis Sensitivity Figure 14. Z vs. Y Cross-Axis Sensitivity Rev. 0 | Page 6 of 12 -2.0 PERCENT SENSITIVITY (%) 4.0 0 0 250 100 110 120 130 140 150 160 170 180 190 200 210 220 230 240 250 90 28.50 0 0 ADXL213 0.9 100 90 5V 0.8 VS = 5V 0.7 CURRENT (mA) PERCENT OF POPULATION (%) 80 70 60 50 40 30 20 10 03757-0-018 3V 0.6 0.5 VS = 3V 03757-0-020 0.4 0 50 TEMPERATURE (C) 100 150 A Figure 15. Supply Current vs. Temperature Figure 18. Supply Current at 25C 16.0 14.0 PERCENT OF POPULATION (%) 16.0 14.0 12.0 10.0 8.0 6.0 4.0 04742-0-012 PERCENT OF POPULATION (%) 12.0 10.0 8.0 6.0 4.0 2.0 0 04742-0-014 2.0 0 -31 -30 -29 -28 -27 -26 -25 -24 -23 -22 -21 -20 -19 -18 -31 -30 -29 -28 -27 -26 -25 -24 -23 -22 -21 -20 -19 DELTA IN DUTY CYCLE (%) DELTA IN DUTY CYCLE (%) Figure 16. X Axis Self Test Response at 25C Figure 19. Y Axis Self Test Response at 25C 26 25 SELF TEST OUTPUT (%) 24 23 22 04742-0-013 21 10 20 30 40 50 60 70 80 -50 -40 -30 -20 -10 TEMPERATURE (C) Figure 17. Self Test Response vs. Temperature 90 20 0 Figure 20. Turn-On Time - CX, CY = 0.1 F, Time Scale = 2 ms/div Rev. 0 | Page 7 of 12 03757-0-009 -18 1000 200 300 400 500 600 700 800 900 0.3 -50 0 ADXL213 THEORY OF OPERATION PIN 8 XOUT = 80% YOUT = 50% PIN 8 XOUT = 50% YOUT = 20% TOP VIEW (Not to Scale) PIN 8 XOUT = 50% YOUT = 80% EARTH'S SURFACE Figure 21. Output Response vs. Orientation The ADXL213 is a complete dual axis acceleration measurement system on a single monolithic IC. It contains a polysilicon surface-micromachined sensor and signal conditioning circuitry to implement an open-loop acceleration measurement architecture. The output signals are duty cycle modulated digital signals proportional to acceleration. The ADXL213 is capable of measuring both positive and negative accelerations to 1.2 g. The accelerometer can measure static acceleration forces such as gravity, allowing the ADXL213 to be used as a tilt sensor. The sensor is a surface-micromachined polysilicon structure built on top of the silicon wafer. Polysilicon springs suspend the structure over the surface of the wafer and provide a resistance against acceleration forces. Deflection of the structure is measured using a differential capacitor that consists of independent fixed plates and plates attached to the moving mass. The fixed plates are driven by 180 out-of-phase square waves. Acceleration deflects the beam and unbalances the differential capacitor, resulting in an output square wave whose amplitude is proportional to acceleration. Phase sensitive demodulation techniques are then used to rectify the signal and determine the direction of the acceleration. The output of the demodulator is amplified and brought offchip through a 32 k resistor. At this point, the user can set the signal bandwidth of the device by adding a capacitor. This filtering improves measurement resolution and helps prevent aliasing. After being low-pass filtered, the duty cycle modulator converts the analog signals to duty cycle modulated outputs that can be read by a counter. A single resistor (RSET) sets the period for a complete cycle. A 0 g acceleration produces a 50% nominal duty cycle. The acceleration can be determined by measuring the length of the positive pulse width (t1) and the period (t2). The nominal transfer function of the ADXL213 is Acceleration = ((t1/t2) - Zero g Bias)/Sensitivity Where in the case of the ADXL213 Zero g Bias = 50% nominal Sensitivity = 30%/g nominal t2 = RSET/125 M PERFORMANCE Rather than using additional temperature compensation circuitry, innovative design techniques have been used to ensure that high performance is built in. As a result, there is essentially no quantization error or nonmonotonic behavior, and temperature hysteresis is very low (typically less than 10 mg over the -40C to +85C temperature range). Figure 9 shows the zero g output performance of eight parts (X and Y axis) over a -40C to +85C temperature range. Figure 12 demonstrates the typical sensitivity shift over temperature for VS = 5 V. Sensitivity stability is optimized for VS = 5 V, but is still very good over the specified range; it is typically better than 2% over temperature at VS = 3 V. Rev. 0 | Page 8 of 12 04742-0-015 PIN 8 XOUT = 20% YOUT = 50% XOUT = 50% YOUT = 50% ADXL213 APPLICATIONS POWER SUPPLY DECOUPLING For most applications, a single 0.1 F capacitor, CDC, adequately decouples the accelerometer from noise on the power supply. However, in some cases, particularly where noise is present at the 140 kHz internal clock frequency (or any harmonic thereof), noise on the supply may cause interference on the ADXL213's output. If additional decoupling is needed, a 100 (or smaller) resistor or ferrite beads may be inserted in the supply line of the ADXL213. Additionally, a larger bulk bypass capacitor (in the range of 1 F to 22 F) may be added in parallel to CDC. DESIGN TRADE-OFFS FOR SELECTING FILTER CHARACTERISTICS: THE NOISE/BW TRADE-OFF The accelerometer bandwidth selected ultimately determines the measurement resolution (smallest detectable acceleration). Filtering can be used to lower the noise floor, which improves the resolution of the accelerometer. Resolution is dependent on the analog filter bandwidth at XFILT and YFILT. The output of the ADXL213 has a typical bandwidth of 2.5 kHz. The user must filter the signal at this point to limit aliasing errors. The analog bandwidth must be no more than one-fifth the PWM frequency to minimize aliasing. The analog bandwidth may be further decreased to reduce noise and improve resolution. The ADXL213 noise has the characteristics of white Gaussian noise, which contributes equally at all frequencies and is described in terms of g/Hz (i.e., the noise is proportional to the square root of the accelerometer's bandwidth). The user should limit bandwidth to the lowest frequency needed by the application in order to maximize the resolution and dynamic range of the accelerometer. With the single pole roll-off characteristic, the typical noise of the ADXL213 is determined by SETTING THE BANDWIDTH USING CX AND CY The ADXL213 has provisions for bandlimiting the XOUT and YOUT pins. Capacitors must be added at these pins to implement low-pass filtering for antialiasing and noise reduction. The equation for the -3 dB bandwidth is F-3 dB = 1/(2(32 k) x C(X, Y)) or more simply, F-3 dB = 5 F/C(X, Y) The tolerance of the internal resistor (RFILT) can vary typically as much as 25% of its nominal value (32 k); thus, the bandwidth varies accordingly. A minimum capacitance of 2000 pF for CX and CY is required in all cases. Table 4. Filter Capacitor Selection, CX and CY Bandwidth (Hz) 1 10 50 100 200 500 Capacitor (F) 4.7 0.47 0.10 0.05 0.027 0.01 rmsNoise = (160 g / Hz ) x ( BW x 1.6 ) At 100 Hz the noise is rmsNoise = (160 g / Hz ) x ( 100 x1.6 ) = 2 mg Often, the peak value of the noise is desired. Peak-to-peak noise can only be estimated by statistical methods. Table 5 is useful for estimating the probabilities of exceeding various peak values, given the rms value. Table 5. Estimation of Peak-to-Peak Noise SELF TEST The ST pin controls the self-test feature. When this pin is set to VS, an electrostatic force is exerted on the beam of the accelerometer. The resulting movement of the beam allows the user to test if the accelerometer is functional. The typical change in output is 750 mg (corresponding to 23%). This pin may be left open circuit, or may be connected to common in normal use. The ST pin should never be exposed to voltages greater than VS + 0.3 V. If the system design is such that this condition cannot be guaranteed (i.e., multiple supply voltages present), a low VF clamping diode between ST and VS is recommended. Peak-to-Peak Value 2 x RMS 4 x RMS 6 x RMS 8 x RMS % of Time that Noise Will Exceed Nominal Peak-to-Peak Value 32 4.6 0.27 0.006 Rev. 0 | Page 9 of 12 ADXL213 Peak-to-peak noise values give the best estimate of the uncertainty in a single measurement. Table 6 gives the typical noise output of the ADXL213 for various CX and CY values. Table 6. Filter Capacitor Selection (CX, CY) Bandwidth(Hz) 10 50 100 500 CX, CY (F) 0.47 0.1 0.047 0.01 RMS Noise (mg) 0.64 1.4 2 4.5 Peak-to-Peak Noise Estimate (mg) 3.8 8.6 12 27.2 USING THE ADXL213 AS A DUAL-AXIS TILT SENSOR One of the most popular applications of the ADXL213 is tilt measurement. An accelerometer uses the force of gravity as an input vector to determine the orientation of an object in space. An accelerometer is most sensitive to tilt when its sensitive axis is perpendicular to the force of gravity, i.e., parallel to the earth's surface. At this orientation, its sensitivity to changes in tilt is highest. When the accelerometer is oriented on axis to gravity, i.e., near its +1 g or -1 g reading, the change in output acceleration per degree of tilt is negligible. When the accelerometer is perpendicular to gravity, its output changes nearly 17.5 mg per degree of tilt. At 45, its output changes at only 12.2 mg per degree and resolution declines. USING THE ADXL213 WITH OPERATING VOLTAGES OTHER THAN 5 V The ADXL213 is tested and specified at VS = 5 V; however, it can be powered with VS as low as 3 V or as high as 6 V. Some performance parameters will change as the supply voltage is varied. The ADXL213 output varies proportionally to supply voltage. At VS = 3 V, the output sensitivity is typically 28%/g. The zero g bias output is ratiometric, so the zero g output is nominally equal to 50% at all supply voltages. The output noise also varies with supply voltage. At VS = 3 V, the noise density is typically 200 g/Hz. Self-test response in g is roughly proportional to the square of the supply voltage. So at VS = 3 V, the self-test response is equivalent to approximately 270 mg (typical), or 8%. The supply current decreases as the supply voltage decreases. Typical current consumption at VDD = 3 V is 450 A. Dual-Axis Tilt Sensor: Converting Acceleration to Tilt When the accelerometer is oriented so both its X and Y axes are parallel to the earth's surface, it can be used as a 2-axis tilt sensor with a roll axis and a pitch axis. Once the output signal from the accelerometer has been converted to an acceleration that varies between -1 g and +1 g, the output tilt in degrees is calculated as follows: PITCH = ASIN(AX/1 g) ROLL = ASIN(AY/1 g) Be sure to account for overranges. It is possible for the accelerometers to output a signal greater than 1 g due to vibration, shock, or other accelerations. Rev. 0 | Page 10 of 12 ADXL213 PIN CONFIGURATIONS AND FUNCTIONAL DESCRIPTIONS ADXL213E TOP VIEW (Not to Scale) VS 8 ST 1 T2 2 COM 3 4 7 6 5 XFILT YFILT XOUT 04742-0-016 YOUT Figure 22. ADXL213 8-Lead CLCC Table 7. ADXL213 8-Lead CLCC Pin Function Descriptions Pin No. 1 2 3 4 5 6 7 8 Mnemonic ST T2 COM YOUT XOUT YFILT XFILT VS Description Self Test RSET Resistor to Common Common Y Channel Output X Channel Output Y Channel Filter Pin X Channel Filter Pin 3 V to 6 V Rev. 0 | Page 11 of 12 ADXL213 OUTLINE DIMENSIONS 5.00 SQ 1.78 1.27 4.50 SQ TOP VIEW 1.27 7 1 0.50 DIAMETER 1.90 2.50 1.27 R 0.38 0.15 R 0.20 5 3 0.64 2.50 0.38 DIAMETER BOTTOM VIEW Figure 23. 8-Terminal Ceramic Leadless Chip Carrier [LCC] (E-8) Dimensions shown in millimeters ESD CAUTION ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although this product features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality. ORDERING GUIDE ADXL213 Products ADXL213AE1 ADXL213AE-REEL1 ADXL213EB Number of Axes 1 1 Specified Voltage (V) 5 5 Temperature Range -40C to +85C -40C to +85C Package Description 8-Lead Ceramic Leadless Chip Carrier 8-Lead Ceramic Leadless Chip Carrier Evaluation Board Package Option E-8 E-8 1 Lead Finish--Gold over Nickel over Tungsten. (c) 2004 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. D04742-0-4/04(0) Rev. 0 | Page 12 of 12 This datasheet has been download from: www..com Datasheets for electronics components. |
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