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 IDT74FCT2827AT/CT FAST CMOS 10-BIT BUFFER
INDUSTRIAL TEMPERATURE RANGE
FAST CMOS 10-BIT BUFFER
IDT74FCT2827AT/CT
FEATURES:
* * * * * * * *
A and C grades Low input and output leakage 1A (max.) CMOS power levels True TTL input and output compatibility: - VOH = 3.3V (typ.) - VOL = 0.3V (typ.) Resistor outputs (-15mA IOH, 12mA IOL) Meets or exceeds JEDEC standard 18 specifications Reduced system switching noise Available in SOIC, QSOP, and TSSOP packages
DESCRIPTION:
The FCT2827T 10-bit bus driver provides high-performance bus interface buffering for wide data/address paths or buses carrying parity. The 10-bit buffers have NAND-ed output enables for maximum control flexibility. All of the FCT2827T high-performance interface family are designed for high-capacitance load drive capability, while providing low-capacitance bus loading at both inputs and outputs. All inputs have clamp diodes to ground and all outputs are designed for low-capacitance bus loading in high-impedance state. The FCT2827T has balanced output drive with current limiting resistors. This offers low ground bounce, minimal undershoot and controlled output fall times-reducing the need for external series terminating resistors. FCT2827T parts are plug-in replacements for FCT827T parts.
FUNCTIONAL BLOCK DIAGRAM
Y0
Y1
Y2
Y3
Y4
Y5
Y6
Y7
Y8
Y9
D0
D1
D2
D3
D4
D5
D6
D7
D8
D9
OE1 OE2
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
INDUSTRIAL TEMPERATURE RANGE
1
AUGUST 2000
DSC-5485/1
(c) 2000 Integrated Device Technology, Inc.
IDT74FCT2827AT/CT FAST CMOS 10-BIT BUFFER
INDUSTRIAL TEMPERATURE RANGE
PIN CONFIGURATION
ABSOLUTE MAXIMUM RATINGS(1)
Symbol VTERM(2) VTERM(3) TSTG IOUT Description Terminal Voltage with Respect to GND Terminal Voltage with Respect to GND Storage Temperature DC Output Current Max -0.5 to +7 -0.5 to VCC+0.5 -65 to +150 -60 to +120 Unit V V C mA
OE1 D0 D1 D2 D3 D4 D5 D6 D7 D8 D9 GND
1 2 3 4 5 6 7 8 9 10 11 12
24 23 22 21 20 19 18 17 16 15 14 13
VCC Y0 Y1 Y2 Y3 Y4 Y5 Y6 Y7 Y8 Y9 OE2
NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. No terminal voltage may exceed Vcc by +0.5V unless otherwise noted. 2. Inputs and Vcc terminals only. 3. Output and I/O terminals only.
CAPACITANCE (TA = +25C, F = 1.0MHz)
Symbol CIN COUT Parameter(1) Input Capacitance Output Capacitance Conditions VIN = 0V VOUT = 0V Typ. 6 8 Max. 10 12 Unit pF pF
NOTE: 1. This parameter is measured at characterization but not tested.
SOIC/ QSOP/ TSSOP TOP VIEW
PIN DESCRIPTION
Pin Names OEx Dx Yx I/O I I O Description When both are LOW, the outputs are enabled. When either one or both are HIGH, the outputs are High Z. 10-Bit Data Input 10-Bit Data Output
FUNCTION TABLE(1)
OE1 L L H X Inputs OE2 L L X H Dx L H X X Outputs Yx L H Z Z Function Transparent 3-State
NOTE: 1. H = HIGH Voltage Level X = Don't Care L = LOW Voltage Level Z = High Impedance
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IDT74FCT2827AT/CT FAST CMOS 10-BIT BUFFER
INDUSTRIAL TEMPERATURE RANGE
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified: Industrial: TA = -40C to +85C, VCC = 5.0V 5%
Symbol VIH VIL IIH IIL IOZH IOZL II VIK VH ICC Parameter Input HIGH Level Input LOW Level Input HIGH Current(4) Input LOW Current(4) High Impedance Output Current (3-State output pins)(4) Input HIGH Current(4) Clamp Diode Voltage Input Hysteresis Quiescent Power Supply Current VCC = Max., VI = VCC (Max.) VCC = Min, IIN = -18mA -- VCC = Max., VIN = GND or VCC Test Conditions(1) Guaranteed Logic HIGH Level Guaranteed Logic LOW Level VCC = Max. VCC = Max. VCC = Max VI = 2.7V VI = 0.5V VO = 2.7V VO = 0.5V Min. 2 -- -- -- -- -- -- -- -- -- Typ.(2) -- -- -- -- -- -- -- -0.7 200 0.01 Max. -- 0.8 1 1 1 1 1 -1.2 -- 1 A V mV A Unit V V A A A
OUTPUT DRIVE CHARACTERISTICS
Symbol IODL IODH VOH VOL Parameter Output LOW Current Output HIGH Current Output HIGH Voltage Output LOW Voltage Test Conditions(1) VCC = 5V, VIN = VIH or VIL, VOUT = 1.5V(3) VCC = 5V, VIN = VIH or VIL, VOUT = 1.5V(3) VCC = Min IOH = -15mA VIN = VIH or VIL VCC = Min IOL = 12mA VIN = VIH or VIL Min. 16 -16 2.4 -- Typ.(2) 48 -48 3.3 0.3 Max. -- -- -- 0.5 Unit mA mA V V
NOTES: 1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC = 5.0V, +25C ambient. 3. Not more than one output should be tested at one time. Duration of the test should not exceed one second. 4. The test limit for this parameter is 5A at TA = -55C.
3
IDT74FCT2827AT/CT FAST CMOS 10-BIT BUFFER
INDUSTRIAL TEMPERATURE RANGE
POWER SUPPLY CHARACTERISTICS
Symbol ICC ICCD Parameter Quiescent Power Supply Current TTL Inputs HIGH Dynamic Power Supply Current(4) VCC = Max. VIN = 3.4V(3) VCC = Max. Outputs Open OE1 = OE2 = GND One Input Toggling 50% Duty Cycle VCC = Max. Outputs Open fi = 10MHz 50% Duty Cycle OE1 = OE2 = GND One Bit Toggling VCC = Max. Outputs Open fi = 2.5MHz 50% Duty Cycle OE1 = OE2 = GND Eight Bits Toggling VIN = VCC VIN = GND Test Conditions(1) Min. -- -- Typ.(2) 0.5 0.06 Max. 2 0.12 Unit mA mA/ MHz
IC
Total Power Supply Current(6)
VIN = VCC VIN = GND VIN = 3.4V VIN = GND VIN = VCC VIN = GND VIN = 3.4V VIN = GND
--
0.6
2.2
mA
--
0.9
3.2
--
1.2
3.4(5)
--
3.2
11.4(5)
NOTES: 1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC = 5.0V, +25C ambient. 3. Per TTL driven input; (VIN = 3.4V). All other inputs at VCC or GND. 4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations. 5. Values for these conditions are examples of ICC formula. These limits are guaranteed but not tested. 6. IC = IQUIESCENT + IINPUTS + IDYNAMIC IC = ICC + ICC DHNT + ICCD (fCP/2+ fiNi) ICC = Quiescent Current ICC = Power Supply Current for a TTL High Input (VIN = 3.4V) DH = Duty Cycle for TTL Inputs High NT = Number of TTL Inputs at DH ICCD = Dynamic Current caused by an Input Transition Pair (HLH or LHL) fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices) fi = Output Frequency Ni = Number of Outputs at fi All currents are in milliamps and all frequencies are in megahertz.
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IDT74FCT2827AT/CT FAST CMOS 10-BIT BUFFER
INDUSTRIAL TEMPERATURE RANGE
SWITCHING CHARACTERISTICS OVER OPERATING RANGE
Symbol tPLH tPHL Parameter Propagation Delay Dx to Yx Condition(1) CL = 50pF RL = 500 CL = 300pF(3) RL = 500 CL = 50pF RL = 500 CL = 300pF(3) RL = 500 CL = 5pF(3) RL = 500 CL = 50pF RL = 500 FCT2827AT Min.(2) Max. 1.5 8 1.5 1.5 1.5 1.5 1.5 15 12 23 9 10 FCT2827CT Min.(2) Max. 1.5 4.4 1.5 1.5 1.5 1.5 1.5 10 7 14 5.7 6 Unit ns ns ns ns ns ns
tPZH tPZL
Output Enable Time OEx to Yx
tPHZ tPLZ
Output Disable Time OEx to Yx
NOTES: 1. See test circuit and waveforms. 2. Minimum limits are guaranteed but not tested on Propagation Delays. 3. This parameter is guaranteed but not tested.
5
IDT74FCT2827AT/CT FAST CMOS 10-BIT BUFFER
INDUSTRIAL TEMPERATURE RANGE
TEST CIRCUITS AND WAVEFORMS
V CC 7.0V 500 VIN Pulse G enerator D.U.T. 50pF R
T
SWITCH POSITION
Test Switch Closed Open Open Drain Disable Low Enable Low All Other Tests
V OU T
500 C
L
DEFINITIONS: CL = Load capacitance: includes jig and probe capacitance. RT = Termination resistance: should be equal to ZOUT of the Pulse Generator.
Octal link
Test Circuits for All Outputs
DATA INPUT tSU TIMING INPUT ASYNCHRO NOUS CONTROL PRESET CLEAR ETC. SYNCHRON OUS CONTROL PRESET CLEAR CLOCK ENABLE ETC. tREM tH
3V 1.5V 0V 3V 1.5V 0V 3V 1.5V 0V 3V 1.5V 0V
Octal link
LOW -HIGH-LOW PULSE tW HIGH-LOW -HIG H PULSE
Octal link
1.5V
1.5V
tSU
tH
Pulse Width
Set-Up, Hold, and Release Times
ENABLE SAM E PHASE INPUT TRANSITION tPLH O UTPUT tPLH OPPOSITE PHASE INPUT TRANSITION tPHL tPHL 3V 1.5V 0V VOH 1.5V VOL 3V 1.5V 0V
Octal link
DISABLE 3V
CONTROL INPUT tPZL OUTPUT NORMALLY LOW SW ITCH CLO SED tPZH OUTPUT NORMALLY HIGH SW ITCH OPEN 3.5V 1.5V 0.3V tPHZ 0.3V 1.5V 0V tPLZ
1.5V 0V 3.5V VOL VOH
0V
Octal link
Propagation Delay
Enable and Disable Times
NOTES: 1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH. 2. Pulse Generator for All Pulses: Rate 1.0MHz; tF 2.5ns; tR 2.5ns.
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IDT74FCT2827AT/CT FAST CMOS 10-BIT BUFFER
INDUSTRIAL TEMPERATURE RANGE
ORDERING INFORMATION
IDT XX FCT XX Temp. Range Device Type X Package
SO Q PG
Small Outline IC Quarter-size Small Outline Package Thin Shrink Small Outline Package
2827AT 2827CT
Fast CMOS 10-Bit Buffer
74
- 40C to +85C
CORPORATE HEADQUARTERS 2975 Stender Way Santa Clara, CA 95054
for SALES: 800-345-7015 or 408-727-6116 fax: 408-492-8674 www.idt.com
for Tech Support: logichelp@idt.com (408) 654-6459
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