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54ACT11000, 74ACT11000 QUADRUPLE 2-INPUT POSITIVE-NAND GATES SCAS002A - D2957, JUNE 1987 - REVISED APRIL 1993 * * * * * * Inputs Are TTL-Voltage Compatible Flow-Through Architecture Optimizes PCB Layout Center-Pin VCC and GND Configurations Minimize High-Speed Switching Noise EPICt (Enhanced-Performance Implanted CMOS) 1-mm Process 500-mA Typical Latch-Up Immunity at 125C Package Options Include Plastic Small-Outline Packages, Ceramic Chip Carriers, and Standard Plastic and Ceramic 300-mil DIPs 54ACT11000 . . . J PACKAGE 74ACT11000 . . . D OR N PACKAGE (TOP VIEW) 1A 1Y 2Y GND GND 3Y 4Y 4B 1 2 3 4 5 6 7 8 16 15 14 13 12 11 10 9 1B 2A 2B VCC VCC 3A 3B 4A description These devices contain four independent 2-input NAND gates. They perform the Boolean functions Y = ASB or Y = A + B in positive logic. The 54ACT11000 is characterized for operation over the full military temperature range of - 55C to 125C. The 74ACT11000 is characterized for operation from - 40C to 85C. FUNCTION TABLE (each gate) INPUTS A H L X B H X L OUTPUT Y L H H 54ACT11000 . . . FK PACKAGE (TOP VIEW) 2A 1B NC 1A 1Y 4 5 6 7 8 3 2 1 20 19 18 17 16 15 14 9 10 11 12 13 2B VCC NC VCC 3A 3B 4A NC 4B 4Y NC - No internal connection logic symbol 1A 1B 2A 2B 3A 3B 4A 4B 1 16 15 14 11 10 9 8 & 2 1Y logic diagram (positive logic) 1A 1B 2A 2Y 2B 3A 3B 7 4Y 4A 4B 4Y 3Y 2Y 1Y 3 6 3Y This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. Pin numbers shown are for the D, J, and N packages. EPIC is a trademark of Texas Instruments Incorporated. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright (c) 1993, Texas Instruments Incorporated POST OFFICE BOX 655303 * DALLAS, TEXAS 75265 2Y GND NC GND 3Y 2-1 54ACT11000, 74ACT11000 QUADRUPLE 2-INPUT POSITIVE-NAND GATES SCAS002A - D2957, JUNE 1987 - REVISED APRIL 1993 absolute maximum ratings over operating free-air temperature range (unless otherwise noted) Supply voltage range, VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . - 0.5 V to 6 V Input voltage range, VI (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . - 0.5 V to VCC + 0.5 V Output voltage range, VO (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . - 0.5 V to VCC + 0.5 V Input clamp current, IIK (VI < 0 or VI > VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 mA Output clamp current, IOK (VO < 0 or VO > VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 mA Continuous output current, IO (VO = 0 to VCC) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 mA Continuous current through VCC or GND . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100 mA Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . - 65C to 150C Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. NOTE 1: The input and output voltage ratings may be exceeded if the input and output current ratings are observed. recommended operating conditions 54ACT11000 MIN VCC VIH VIL VI VO IOH IOL TA Supply voltage High-level input voltage Low-level input voltage Input voltage Output voltage High-level output current Low-level output current Input transition rise or fall rate Operating free-air temperature 0 - 55 0 0 4.5 2 0.8 VCC VCC - 24 24 10 125 0 - 40 0 0 MAX 5.5 74ACT11000 MIN 4.5 2 0.8 VCC VCC - 24 24 10 85 MAX 5.5 UNIT V V V V V mA mA ns/ V C Dt/Dv electrical characteristics over recommended operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS IOH = - 50 mA VOH IOH = - 24 mA IOH = - 50 mA IOH = - 75 mA IOL = 50 mA VOL IOL = 24 mA IOL = 50 mA IOL = 75 mA II ICC VI = VCC or GND VI = VCC or GND, IO = 0 VCC 4.5 V 5.5 V 4.5 V 5.5 V 5.5 V 5.5 V 4.5 V 5.5 V 4.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 V 5.5 55V 5V 3.5 0.1 4 0.9 09 1 80 1 0.1 0.1 0.36 0.36 0.1 0.1 0.5 0.5 1.65 1.65 1 40 1 TA = 25C MIN TYP MAX 4.4 5.4 3.94 4.94 54ACT11000 MIN 4.4 5.4 3.7 4.7 3.85 3.85 0.1 0.1 0.44 0.44 V MAX 74ACT11000 MIN 4.4 5.4 3.8 4.8 V MAX UNIT mA mA mA pF DICCw Ci One input at 3.4 V, , Other inputs at GND or VCC VI = VCC or GND Not more than one output should be tested at a time, and the duration of the test should not exceed 10 ms. This is the increase in supply current for each input that is at one of the specified TTL voltage levels rather than 0 V or VCC. 2-2 POST OFFICE BOX 655303 * DALLAS, TEXAS 75265 54ACT11000, 74ACT11000 QUADRUPLE 2-INPUT POSITIVE-NAND GATES SCAS002A - D2957, JUNE 1987 - REVISED APRIL 1993 switching characteristics over recommended ranges of supply voltage and free-air temperature (unless otherwise noted) (see Figure 1) PARAMETER tPLH tPHL FROM (INPUT) A or B TO (OUTPUT) Y MIN 1.5 1.5 TA = 25C TYP MAX 7.2 5.8 10.9 8 54ACT11000 MIN 1.5 1.5 MAX 13.3 9.5 74ACT11000 MIN 1.5 1.5 MAX 12.3 8.8 UNIT ns operating characteristics, VCC = 5 V, TA = 25C PARAMETER Cpd Power dissipation capacitance per gate TEST CONDITIONS CL = 50 pF, f = 1 MHz TYP 23 UNIT pF PARAMETER MEASUREMENT INFORMATION From Output Under Test CL = 50 pF (see Note A) 500 Output Input (see Note B) tPHL 3V 1.5 V 1.5 V 0V tPLH VOH 50% VCC VOL LOAD CIRCUIT VOLTAGE WAVEFORMS 50% VCC NOTES: A. CL includes probe and jig capacitance. B. Input pulses are supplied by generators having the following characteristics: PRR 10 MHz, ZO = 50 , tr = 3 ns, tf = 3 ns. C. The outputs are measured one at a time with one input transition per measurement. Figure 1. Load Circuit and Voltage Waveforms POST OFFICE BOX 655303 * DALLAS, TEXAS 75265 2-3 54ACT11000, 74ACT11000 QUADRUPLE 2-INPUT POSITIVE-NAND GATES SCAS002A - D2957, JUNE 1987 - REVISED APRIL 1993 2-4 POST OFFICE BOX 655303 * DALLAS, TEXAS 75265 IMPORTANT NOTICE Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue any product or service without notice, and advise customers to obtain the latest version of relevant information to verify, before placing orders, that information being relied on is current and complete. All products are sold subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those pertaining to warranty, patent infringement, and limitation of liability. TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in accordance with TI's standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements. CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE ("CRITICAL APPLICATIONS"). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO BE FULLY AT THE CUSTOMER'S RISK. In order to minimize risks associated with the customer's applications, adequate design and operating safeguards must be provided by the customer to minimize inherent or procedural hazards. TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property right of TI covering or relating to any combination, machine, or process in which such semiconductor products or services might be or are used. TI's publication of information regarding any third party's products or services does not constitute TI's approval, warranty or endorsement thereof. Copyright (c) 1998, Texas Instruments Incorporated |
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