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 SN54F10, SN74F10 TRIPLE 3-INPUT POSITIVE-NAND GATES
SDFS039A - MARCH 1987 - REVISED OCTOBER 1993
*
Package Options Include Plastic Small-Outline Packages, Ceramic Chip Carriers, and Standard Plastic and Ceramic 300-mil DIPs
SN54F10 . . . J PACKAGE SN74F10 . . . D OR N PACKAGE (TOP VIEW)
description
These devices contain three independent 3-input NAND gates. They perform the Boolean functions Y = A * B * C or Y = A + B + C in positive logic. The SN54F10 is characterized for operation over the full military temperature range of - 55C to 125C. The SN74F10 is characterized for operation from 0C to 70C.
FUNCTION TABLE (each gate) INPUTS A H L X X B H X L X C H X X L OUTPUT Y L H H H
1A 1B 2A 2B 2C 2Y GND
1 2 3 4 5 6 7
14 13 12 11 10 9 8
VCC 1C 1Y 3C 3B 3A 3Y
SN54F10 . . . FK PACKAGE (TOP VIEW)
2A NC 2B NC 2C
4 5 6 7 8
3 2 1 20 19 18 17 16 15 14 9 10 11 12 13
1B 1A NC VCC 1C 1Y NC 3C NC 3B
NC - No internal connection 12 1Y
logic symbol
1A 1B 1C 2A 2B 2C 3A 3B 3C 1 2 13 3 4 5 9 10 11 8 3Y 6 2Y &
logic diagram, each gate (positive logic)
A B C Y
This symbol is in accordance with ANSI/IEEE Std 91-1984 and IEC Publication 617-12. Pin numbers shown are for the D, J, and N packages.
PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
Copyright (c) 1993, Texas Instruments Incorporated
POST OFFICE BOX 655303
* DALLAS, TEXAS 75265
2Y GND NC 3Y 3A
2-1
SN54F10, SN74F10 TRIPLE 3-INPUT POSITIVE-NAND GATES
SDFS039A - MARCH 1987 - REVISED OCTOBER 1993
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, VCC . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . - 0.5 V to 7 V Input voltage range, VI (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . - 1.2 V to 7 V Input current range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . - 30 mA to 5 mA Voltage range applied to any output in the high state . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . - 0.5 V to VCC Current into any output in the low state . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40 mA Operating free-air temperature range: SN54F10 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . - 55C to 125C SN74F10 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0C to 70C Storage temperature range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . - 65C to 150C
Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. NOTE 1: The input voltage ratings may be exceeded provided the input current ratings are observed.
recommended operating conditions
SN54F10 MIN VCC VIH VIL IIK IOH IOL TA Supply voltage High-level input voltage Low-level input voltage Input clamp current High-level output current Low-level output current Operating free-air temperature - 55 4.5 2 0.8 - 18 -1 20 125 0 NOM 5 MAX 5.5 MIN 4.5 2 0.8 - 18 -1 20 70 SN74F10 NOM 5 MAX 5.5 UNIT V V V mA mA mA C
electrical characteristics over recommended operating free-air temperature range (unless otherwise noted)
PARAMETER VIK VOH VOL II IIH IIL IOS ICCH VCC = 4.5 V, VCC = 4.5 V, VCC = 4.75 V, VCC = 4.5 V, VCC = 5.5 V, VCC = 5.5 V, VCC = 5.5 V, VCC = 5.5 V, VCC = 5.5 V, VCC = 5.5 V, TEST CONDITIONS II = - 18 mA IOH = - 1 mA IOH = - 1 mA IOL = 20 mA VI = 7 V VI = 2.7 V VI = 0.5 V VO = 0 VI = 0 VI = 4.5 V - 60 1.4 MIN 2.5 SN54F10 TYP MAX - 1.2 3.4 0.3 0.5 0.1 20 - 0.6 -150 2.1 - 60 1.4 2.5 2.7 0.3 0.5 0.1 20 - 0.6 -150 2.1 7.7 3.4 MIN SN74F10 TYP MAX - 1.2 UNIT V V V mA A mA mA mA mA
ICCL 5.1 7.7 5.1 All typical values are at VCC = 5 V, TA = 25C. Not more than one output should be shorted at a time, and the duration of the short circuit should not exceed one second.
2-2
POST OFFICE BOX 655303
* DALLAS, TEXAS 75265
SN54F10, SN74F10 TRIPLE 3-INPUT POSITIVE-NAND GATES
SDFS039A - MARCH 1987 - REVISED OCTOBER 1993
switching characteristics (see Note 2)
VCC = 5 V, CL = 50 pF, RL = 500 , TA = 25C F10 MIN tPLH tPHL A, B A B, or C Y 1.6 1 TYP 3.3 2.8 MAX 5 4.3 VCC = 4.5 V to 5.5 V, CL = 50 pF, RL = 500 , TA = MIN to MAX SN54F10 MIN 1.2 1 MAX 7 6.5 SN74F10 MIN 1.6 1 MAX 6 5.3 ns
PARAMETER
FROM (INPUT)
TO (OUTPUT)
UNIT
For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions. NOTE 2: Load circuits and waveforms are shown in Section 1.
POST OFFICE BOX 655303
* DALLAS, TEXAS 75265
2-3
SN54F10, SN74F10 TRIPLE 3-INPUT POSITIVE-NAND GATES
SDFS039A - MARCH 1987 - REVISED OCTOBER 1993
2-4
POST OFFICE BOX 655303
* DALLAS, TEXAS 75265
IMPORTANT NOTICE Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue any product or service without notice, and advise customers to obtain the latest version of relevant information to verify, before placing orders, that information being relied on is current and complete. All products are sold subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those pertaining to warranty, patent infringement, and limitation of liability. TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in accordance with TI's standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements. CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE ("CRITICAL APPLICATIONS"). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO BE FULLY AT THE CUSTOMER'S RISK. In order to minimize risks associated with the customer's applications, adequate design and operating safeguards must be provided by the customer to minimize inherent or procedural hazards. TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property right of TI covering or relating to any combination, machine, or process in which such semiconductor products or services might be or are used. TI's publication of information regarding any third party's products or services does not constitute TI's approval, warranty or endorsement thereof.
Copyright (c) 1998, Texas Instruments Incorporated


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