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| TM124MBK36B, TM124MBK36R 1048576 BY 36-BIT TM248NBK36B, TM248NBK36R 2097152 BY 36-BIT DYNAMIC RAM MODULE SMMS137E - JANUARY 1991 - REVISEDJUNE 1995 D D D D D D D D D D Organization TM124MBK36B . . . 1 048 576 x 36 TM248NBK36B . . . 2 097 152 x 36 Single 5-V Power Supply (10% Tolerance) 72-pin Leadless Single In-Line Memory Module (SIMM) for Use With Sockets TM124MBK36B-Utilizes Eight 4-Megabit DRAMs in Plastic Small-Outline J-Lead (SOJ) Packages and One 4-Megabit Quad-CAS DRAM in a Plastic Small-Outline J-Lead (SOJ) Package TM248NBK36B-Utilizes Sixteen 4-Megabit DRAMs in Plastic Small-Outline J-Lead (SOJ) Packages and Two 4-Megabit Quad-CAS DRAMs in Plastic Small-Outline J-Lead (SOJ) Packages Long Refresh Period 16 ms (1024 Cycles) All Inputs, Outputs, Clocks Fully TTL Compatible 3-State Output Common CAS Control for Nine Common Data-In and Data-Out Lines, in Four Blocks Enhanced Page Mode Operation with CAS-Before-RAS ( CBR), RAS-Only, and Hidden Refresh D D Presence Detect Performance Ranges: ACCESS TIME tRAC (MAX) 60 ns 70 ns 80 ns 60 ns 70 ns 80 ns ACCESS ACCESS READ TIME TIME OR tAA tCAC WRITE CYCLE (MAX) (MAX) (MIN) 30 ns 15 ns 110 ns 35 ns 18 ns 130 ns 40 ns 20 ns 150 ns 30 ns 15 ns 110 ns 35 ns 18 ns 130 ns 40 ns 20 ns 150 ns D D D D '124MBK36B-60 '124MBK36B-70 '124MBK36B-80 '248NBK36B-60 '248NBK36B-70 '248NBK36B-80 Low Power Dissipation Operating Free-Air Temperature Range 0C to 70C Gold-Tabbed Versions Available: - TM124MBK36B - TM248NBK36B Tin-Lead (Solder) Tabbed Versions Available: - TM124MBK36R - TM248NBK36R description TM124MBK36B The TM124MBK36B is a dynamic random-access memory (DRAM) organized as four times 1 048 576 x 9 (bit 9 is generally used for parity) in a 72-pin leadless single in-line memory module (SIMM). The SIMM is composed of eight TMS44400DJ, 1 048 576 x 4-bit DRAMs, each in 20/26-lead plastic small-outline J-lead packages (SOJs), and one TMS44460DJ, 1 048 576 x 4-bit Quad-CAS DRAM in a 24/26-lead plastic small-outline J-lead package (SOJ), mounted on a substrate with decoupling capacitors. Each TMS44400DJ and TMS44460DJ is described in the TMS44400 or TMS44460 data sheet, respectively. The TM124MBK36B is available in the single-sided BK leadless module for use with sockets. The TM124MBK36B features RAS access times of 60 ns, 70 ns, and 80 ns. This device is rated for operation from 0C to 70C. TM248NBK36B The TM248NBK36B is a DRAM organized as four times 2 097 152 x 9 (bit 9 is generally used for parity) in a 72-pin leadless SIMM. The SIMM is composed of sixteen TMS44400DJ, 1 048 576 x 4-bit DRAMs, each in 20/26-lead plastic small-outline J-lead packages (SOJs), and two TMS44460DJ, 1 048 576 x 4-bit Quad-CAS DRAMs, each in a 24/26-lead plastic small-outline J-lead package (SOJ), mounted on a substrate with decoupling capacitors. Each TMS44400DJ and TMS44460DJ is described in the TMS44400 and TMS44460 data sheet, respectively. Part numbers in this data sheet are for the gold-tabbed version; the information applies to both gold-tabbed and solder-tabbed versions. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright (c) 1995, Texas Instruments Incorporated POST OFFICE BOX 1443 * HOUSTON, TEXAS 77251-1443 1 TM124MBK36B, TM124MBK36R 1048576 BY 36-BIT TM248NBK36B, TM248NBK36R 2097152 BY 36-BIT DYNAMIC RAM MODULE SMMS137E - JANUARY 1991 - REVISEDJUNE 1995 TM248NBK36B (continued) The TM124NBK36B is available in the double-sided BK leadless module for use with sockets. The TM124NBK36B features RAS access times of 60 ns, 70 ns, and 80 ns. This device is rated for operation from 0C to 70C operation TM124MBK36B The TM124MBK36B operates as eight TMS44400DJs and one TMS44460DJ connected as shown in the functional block diagram and Table 1. The parity bits are provided by the TMS44460DJ and are controlled by RAS2. To ensure proper parity bit operation all memory accesses should include a RAS2 pulse. Refer to the TMS44400 and TMS44460 data sheets for details of operation. The common I/O feature dictates the use of early write cycles to prevent contention on D and Q. TM248NBK36B The TM248NBK36B operates as sixteen TMS44400DJs and two TMS44460DJs connected as shown in the functional block diagram and Table 1. The parity bits are provided by the TMS44460DJ and are controlled by RAS2 on side 1 and RAS3 on side 2. To ensure proper parity bit operation, all memory accesses should include a RAS2 or RAS3 pulse. Refer to the TMS44400 and TMS44460 data sheets for details of operation. The common I/O feature dictates the use of early write cycles to prevent contention on D and Q. 2 POST OFFICE BOX 1443 * HOUSTON, TEXAS 77251-1443 TM124MBK36B, TM124MBK36R 1048576 BY 36-BIT TM248NBK36B, TM248NBK36R 2097152 BY 36-BIT DYNAMIC RAM MODULE SMMS137E - JANUARY 1991 - REVISEDJUNE 1995 BK SINGLE IN-LINE MEMORY MODULE (TOP VIEW) TM124MBK36B (SIDE VIEW) TM248NBK36B (SIDE VIEW) VSS DQ0 DQ18 DQ1 DQ19 DQ2 DQ20 DQ3 DQ21 VCC NC A0 A1 A2 A3 A4 A5 A6 NC DQ4 DQ22 DQ5 DQ23 DQ6 DQ24 DQ7 DQ25 A7 NC VCC A8 A9 RAS3 RAS2 DQ26 DQ8 DQ17 DQ35 VSS CAS0 CAS2 CAS3 CAS1 RAS0 RAS1 NC W NC DQ9 DQ27 DQ10 DQ28 DQ11 DQ29 DQ12 DQ30 DQ13 DQ31 VCC DQ32 DQ14 DQ33 DQ15 DQ34 DQ16 NC PD1 PD2 PD3 PD4 NC VSS 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 PIN NOMENCLATURE A0 - A9 CAS0 - CAS3 DQ0 - DQ35 NC PD1 - PD4 RAS0 - RAS3 VCC VSS W Address Inputs Column-Address Strobe Data In/Data Out No Connection Presence Detects Row-Address Strobe 5-V Supply Ground Write Enable PRESENCE DETECT SIGNAL (PIN) 80 ns TM124MBK36B 70 ns 60 ns 80 ns TM248NBK36B 70 ns 60 ns PD1 (67) VSS VSS VSS NC NC NC PD2 (68) VSS VSS VSS NC NC NC PD3 (69) NC VSS NC NC VSS NC PD4 (70) VSS NC NC VSS NC NC POST OFFICE BOX 1443 * HOUSTON, TEXAS 77251-1443 3 TM124MBK36B, TM124MBK36R 1048576 BY 36-BIT TM248NBK36B, TM248NBK36R 2097152 BY 36-BIT DYNAMIC RAM MODULE SMMS137E - JANUARY 1991 - REVISEDJUNE 1995 Table 1. Connection Table DATA BLOCK DQ0 - DQ7 DQ8 DQ9 - DQ16 DQ17 DQ18 - DQ25 DQ26 DQ27 - DQ34 DQ35 RASx SIDE 1 RAS0 RAS2 RAS0 RAS2 RAS2 RAS2 RAS2 RAS2 SIDE 2 RAS1 RAS3 RAS1 RAS3 RAS3 RAS3 RAS3 RAS3 CASx CAS0 CAS0 CAS1 CAS1 CAS2 CAS2 CAS3 CAS3 Side 2 applies to the TM248NBK36B only. single-in-line memory module and components PC substrate: 1,27 0,1 mm (0.05 inch) nominal thickness; 0.005 inch/inch maximum warpage Bypass capacitors: Multilayer ceramic Contact area for TM124MBK36B and TM248NBK36B: Nickel plate and gold plate over copper Contact area for TM124MBK36R and TM248NBK36R: Nickel plate and tin-lead over copper 4 POST OFFICE BOX 1443 * HOUSTON, TEXAS 77251-1443 functional block diagram (TM124MBK36B and TM248NBK36B, side 1) A0 - A9 RAS0 W CAS0 10 RAS2 CAS1 10 1M x 4 A0-A9 RAS W CAS OE DQ1- DQ4 10 1M x 4 A0 - A9 RAS W CAS OE DQ1 - DQ4 CAS2 10 1M x 4 A0 - A9 RAS W CAS OE DQ1 - DQ4 CAS3 10 1M x 4 A0 - A9 RAS W CAS OE DQ1 - DQ4 POST OFFICE BOX 1443 * HOUSTON, TEXAS 77251-1443 DQ0 - DQ3 10 DQ9 - DQ12 10 DQ18 - DQ21 10 DQ27 - DQ30 10 1M x 4 A0 - A9 RAS W CAS OE DQ1 - DQ4 DQ4 - DQ7 1M x 4 A0 - A9 RAS W CAS OE DQ1 - DQ4 DQ13 - DQ16 1M x 4 A0 - A9 RAS W CAS OE DQ1 - DQ4 DQ22 - DQ25 10 1M x 4 A0 - A9 RAS W CAS OE DQ1 - DQ4 TM124MBK36B, TM124MBK36R 1048576 BY 36-BIT TM248NBK36B, TM248NBK36R 2097152 BY 36-BIT DYNAMIC RAM MODULE DQ31 - DQ34 1M x 4 A0 - A9 RAS W CAS4 DQ4 CAS3 DQ3 CAS2 DQ2 DQ1 CAS1 OE SMMS137E - JANUARY 1991 - REVISED JUNE 1995 DQ35 DQ26 DQ17 DQ8 5 SMMS137E - JANUARY 1991 - REVISED JUNE 1995 TM124MBK36B, TM124MBK36R 1048576 BY 36-BIT TM248NBK36B, TM248NBK36R 2097152 BY 36-BIT DYNAMIC RAM MODULE functional block diagram (TM248NBK36B, side 2) 6 POST OFFICE BOX 1443 * HOUSTON, TEXAS 77251-1443 Template Release Date: 7-11-94 A0 - A9 RAS1 W CAS0 10 RAS3 CAS1 10 1M x 4 A0 - A9 RAS W CAS OE DQ1 - DQ4 10 1M x 4 A0 - A9 RAS W CAS OE DQ1 - DQ4 CAS2 10 1M x 4 A0 - A9 RAS W CAS OE DQ1 - DQ4 CAS3 10 1M x 4 A0 - A9 RAS W CAS OE DQ1 - DQ4 DQ0 - DQ3 10 DQ9 - DQ12 10 DQ18 - DQ21 10 DQ27 - DQ30 10 1M x 4 A0 - A9 RAS W CAS OE DQ1 - DQ4 DQ4 - DQ7 1M x 4 A0 - A9 RAS W CAS OE DQ1 - DQ4 DQ13 - DQ16 1M x 4 A0 - A9 RAS W CAS OE DQ1 - DQ4 DQ22 - DQ25 10 1M x 4 A0 - A9 RAS W CAS OE DQ1 - DQ4 DQ31 - DQ34 1M x 4 A0 - A9 RAS W CAS4 DQ4 CAS3 DQ3 CAS2 DQ2 DQ1 CAS1 OE DQ35 DQ26 DQ17 DQ8 TM124MBK36B, TM124MBK36R 1048576 BY 36-BIT TM248NBK36B, TM248NBK36R 2097152 BY 36-BIT DYNAMIC RAM MODULE SMMS137E - JANUARY 1991 - REVISEDJUNE 1995 absolute maximum ratings over operating free-air temperature range (unless otherwise noted) Voltage range on any pin (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . - 1 V to 7 V Voltage range on VCC (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . - 1 V to 7 V Short-circuit output current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50 mA Power dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9 W Operating free-air temperature range, TA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0C to 70C Storage temperature range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . - 55C to 125C Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. NOTE 1: All voltage values are with respect to VSS. recommended operating conditions MIN VCC VIH VIL TA Supply voltage High-level input voltage Low-level input voltage (see Note 2) Operating free-air temperature 4.5 2.4 -1 0 NOM 5 MAX 5.5 6.5 0.8 70 UNIT V V V C NOTE 2: The algebraic convention, where the more negative (less positive) limit is designated as minimum, is used for logic-voltage levels only. electrical characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER VOH VOL II IO ICC1 High-level output voltage Low-level output voltage Input current (leakage) Output current (leakage) Read or write cycle current (see Note 3) TEST CONDITIONS IOH = - 5 mA IOL = 4.2 mA VCC = 5.5 V, VI = 0 V to 6.5 V, All other pins = 0 V to VCC VCC = 5.5 V, CAS high VCC = 5.5 V, VO = 0 V to VCC, '124MBK36B-60 MIN 2.4 0.4 10 10 945 MAX '124MBK36B-70 MIN 2.4 0.4 10 10 810 MAX '124MBK36B-80 MIN 2.4 0.4 10 10 720 MAX UNIT V V A A mA Minimum cycle ICC2 Standby current After 1 memory cycle, RAS and CAS high, VIH = 2.4 V (TTL) After 1 memory cycle, RAS and CAS high, VIH = VCC - 0.2 V (CMOS) VCC = 5.5 V, Minimum cycle, RAS cycling, CAS high (RAS only), RAS low after CAS low (CBR) VCC = 5.5 V, RAS low, tPC = minimum, CAS cycling 18 18 18 mA 9 9 9 mA ICC3 Average refresh current (RAS only or CBR) (see Note 3) Average page current (see Note 4) 945 810 720 mA ICC4 810 720 630 mA NOTES: 3. Measured with a maximum of one address change while RAS = VIL 4. Measured with a maximum of one address change while CAS = VIH POST OFFICE BOX 1443 * HOUSTON, TEXAS 77251-1443 7 TM124MBK36B, TM124MBK36R 1048576 BY 36-BIT TM248NBK36B, TM248NBK36R 2097152 BY 36-BIT DYNAMIC RAM MODULE SMMS137E - JANUARY 1991 - REVISEDJUNE 1995 electrical characteristics over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted) PARAMETER VOH VOL II IO ICC1 High-level output voltage Low-level output voltage Input current (leakage) Output current (leakage) Read or write cycle current (see Note 3) TEST CONDITIONS IOH = - 5 mA IOL = 4.2 mA VCC = 5.5 V, VI = 0 V to 6.5 V, All other pins = 0 V to VCC VCC = 5.5 V, CAS high VCC = 5.5 V, VO = 0 V to VCC, '248NBK36B-60 MIN 2.4 0.4 20 20 963 MAX '248NBK36B-70 MIN 2.4 0.4 20 20 828 MAX '248NBK36B-80 MIN 2.4 0.4 20 20 738 MAX UNIT V V A A mA Minimum cycle ICC2 Standby current ICC3 Average refresh current (RAS only or CBR) (see Note 3) Average page current (see Note 4) After 1 memory cycle, RAS and CAS high, VIH = 2.4 V (TTL) After 1 memory cycle, RAS and CAS high, VIH = VCC - 0.2 V (CMOS) VCC = 5.5 V, Minimum cycle, RAS cycling, CAS high (RAS only), RAS low after CAS low (CBR) VCC = 5.5 V, tPC = minimum, RAS low, CAS cycling 36 36 36 mA 18 18 18 mA 1890 1620 1440 mA ICC4 828 738 648 mA NOTES: 3. Measured with a maximum of one address change while RAS = VIL 4. Measured with a maximum of one address change while CAS = VIH capacitance over recommended ranges of supply voltage and operating free-air temperature, f = 1 MHz (see Note 5) PARAMETER Ci(A) Ci(R) Ci(C) Ci(W) Co(DQ) Input capacitance, A0 - A9 Input capacitance, RAS Input capacitance, CAS Input capacitance, W Output capacitance on DQ pins '124MBK36B MIN MAX 45 35 21 63 7 '248NBK36B MIN MAX 90 35 42 126 14 UNIT pF pF pF pF pF NOTE 5: VCC = 5 V 0.5 V and the bias on pins under test is 0 V. 8 POST OFFICE BOX 1443 * HOUSTON, TEXAS 77251-1443 TM124MBK36B, TM124MBK36R 1048576 BY 36-BIT TM248NBK36B, TM248NBK36R 2097152 BY 36-BIT DYNAMIC RAM MODULE SMMS137E - JANUARY 1991 - REVISEDJUNE 1995 switching characteristics over recommended ranges of supply voltage and operating free-air temperature PARAMETER tCAC tAA tRAC tCPA tCLZ tOFF Access time from CAS low Access time from column address Access time from RAS low Access time from column precharge CAS to output in low impedance Output disable time after CAS high (see Note 6) 0 0 15 '124MBK36B-60 '248NBK36B-60 MIN MAX 15 30 60 35 0 0 18 '124MBK36B-70 '248NBK36B-70 MIN MAX 18 35 70 40 0 0 20 '124MBK36B-80 '248NBK36B-80 MIN MAX 20 40 80 45 ns ns ns ns ns ns UNIT NOTE 6: tOFF is specified when the output is no longer driven. timing requirements over recommended ranges of supply voltage and operating free-air temperature '124MBK36B-60 '248NBK36B-60 MIN tRC tRWC tPC tRASP tRAS tCAS tCP tRP tWP tASC tASR tDS tRCS tCWL tRWL tWCS tWSR Cycle time, random read or write (see Note 7) Cycle time, read write Cycle time, page-mode read or write (see Note 8) Pulse duration, page mode, RAS low Pulse duration, nonpage mode, RAS low Pulse duration, CAS low Pulse duration, CAS high Pulse duration, RAS high (precharge) Pulse duration, write Setup time, column address before CAS low Setup time, row address before RAS low Setup time, data Setup time, read before CAS low Setup time, W low before CAS high Setup time, W low before RAS high Setup time, W low before CAS low Setup time, W high (see Note 9) 110 130 40 60 60 15 10 40 15 0 0 0 0 15 15 0 10 100 000 10 000 10 000 MAX '124MBK36B-70 '248NBK36B-70 MIN 130 153 45 70 70 18 10 50 15 0 0 0 0 18 18 0 10 100 000 10 000 10 000 MAX '124MBK36B-80 '248NBK36B-80 MIN 150 175 50 80 80 20 10 60 15 0 0 0 0 20 20 0 10 100 000 10 000 10 000 MAX ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns UNIT NOTES: 7. All cycles assume tT = 5 ns. 8. To assure tPC min, tASC should be 5 ns. 9. CBR refresh only POST OFFICE BOX 1443 * HOUSTON, TEXAS 77251-1443 9 TM124MBK36B, TM124MBK36R 1048576 BY 36-BIT TM248NBK36B, TM248NBK36R 2097152 BY 36-BIT DYNAMIC RAM MODULE SMMS137E - JANUARY 1991 - REVISEDJUNE 1995 timing requirements over recommended ranges of supply voltage and operating free-air temperature (continued) '124MBK36B-60 '248NBK36B-60 MIN tCAH tDHR tDH tAR tCLCH tRAH tRCH tRRH tWCH tWCR tWHR tCHR tCRP tCSH tCSR tRAD tRAL tCAL tRCD tRPC tRSH tREF tT Hold time, column address after CAS low Hold time, data after RAS low (see Note 10) Hold time, data Hold time, column address after RAS low (see Note 10) Hold time, CAS low to CAS high Hold time, row address after RAS low Hold time, read after CAS high (see Note 11) Hold time, read after RAS high (see Note 11) Hold time, write after CAS low Hold time, write after RAS low (see Note 10) Hold time, W high (see Note 9) Delay time, RAS low to CAS high (see Note 9) Delay time, CAS high to RAS low Delay time, RAS low to CAS high Delay time, CAS low to RAS low (see Note 9) Delay time, RAS low to column address (see Note 12) Delay time, column address to RAS high Delay time, column address to CAS high Delay time, RAS low to CAS low (see Note 12) Delay time, RAS high to CAS low (see Note 9) Delay time, CAS low to RAS high Refresh time interval Transition time 2 10 50 10 50 5 10 0 0 15 50 10 15 0 60 10 15 30 30 20 0 15 16 50 2 45 30 MAX '124MBK36B-70 '248NBK36B-70 MIN 15 55 15 55 5 10 0 0 15 55 10 15 0 70 10 15 35 35 20 0 18 16 50 2 52 35 MAX '124MBK36B-80 '248NBK36B-80 MIN 15 60 15 60 5 10 0 0 15 60 10 20 0 80 10 15 40 40 20 0 20 16 50 60 40 MAX ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ns ms ns UNIT NOTES: 9. 10. 11. 12. CBR refresh only The minimum value is measured when tRCD is set to tRCD min as a reference. Either tRRH or tRCH must be satisfied for a read cycle. The maximum value is specified only to assure access time. device symbolization (TM124MBK36B illustrated) TM124MBK36B -SS YYMMT YY MM T -SS = = = = Year Code Month Code Assembly Site Code Speed Code NOTE: Location of symbolization may vary. 10 POST OFFICE BOX 1443 * HOUSTON, TEXAS 77251-1443 IMPORTANT NOTICE Texas Instruments and its subsidiaries (TI) reserve the right to make changes to their products or to discontinue any product or service without notice, and advise customers to obtain the latest version of relevant information to verify, before placing orders, that information being relied on is current and complete. All products are sold subject to the terms and conditions of sale supplied at the time of order acknowledgement, including those pertaining to warranty, patent infringement, and limitation of liability. TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in accordance with TI's standard warranty. Testing and other quality control techniques are utilized to the extent TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily performed, except those mandated by government requirements. CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE ("CRITICAL APPLICATIONS"). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR WARRANTED TO BE SUITABLE FOR USE IN LIFE-SUPPORT DEVICES OR SYSTEMS OR OTHER CRITICAL APPLICATIONS. INCLUSION OF TI PRODUCTS IN SUCH APPLICATIONS IS UNDERSTOOD TO BE FULLY AT THE CUSTOMER'S RISK. In order to minimize risks associated with the customer's applications, adequate design and operating safeguards must be provided by the customer to minimize inherent or procedural hazards. TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other intellectual property right of TI covering or relating to any combination, machine, or process in which such semiconductor products or services might be or are used. TI's publication of information regarding any third party's products or services does not constitute TI's approval, warranty or endorsement thereof. Copyright (c) 1999, Texas Instruments Incorporated |
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