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| MNA14 Ceramic capacitors Multi-layer ceramic chip capacitor networks MNA14 (1608 (0603) x 4 size, chip capacitor networks) !Features 1) Area ratio is approximately 55% smaller than that of the MCH18, enabling high - density mounting. 2) Mounting costs are reduced. 3) Use of convex electrodes prevents solder bridging during mounting, and makes it easy to perform a visual inspection of the mounted piece. Also facilitates automatic inspection. 4) Barrier layer and end terminations to improve solderability. 5) Each element is independent to ensure a wide range of circuit applications. 6) Can be packed on tape. !External dimensions (Units : mm) 0.550.1 0.70.2 0.15 + 0.09 - 0.12 0.850.1 0.80.1 3.20.2 0.80.1 Land pattern in 0.8mm pitch between each electrode is recommended. !Structure !Equivalent circuits C1 C2 C3 C4 C1 = C2 = C3 = C4 External electrode (coating layer) Internal electrode Ceramic element External electrode (barrier layer) External electrode (thick membrane layer) The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. 1.60.2 MNA14 Ceramic capacitors !Product designation Code Product thickness Packaging specifications Reel K 0.8mm Paper tape (width 8 mm, pich 4 mm) 180mm (7in.) Reel (180mm) : compatible with EIAJ ET-7200A Basic ordening unit (pcs.) 4,000 Part No. Packaging style MNA Rated voltage Code Voltage 2 25V 5 50V 14 5 A 101 K K Nominal Capacitance tolerance Capacitance-temperature characteristics tolerace Code EIA code Operating temperature range (C) Temp. coefficient or percent change capacitance Code A C0G -55 ~ +125 0 30ppm / C 10% 3-digit designation K CN X7R -55 ~ +125 15% according IEC M 20% !Capacitance range Product name Temperature characteristic Capacitance (pF) Rated voltage Tolerance 10 22 47 100 220 470 1,000 2,200 4,700 10,000 22,000 0.8 0.1 MNA 14 A (C0G) 50V K ( 10%) CN (X7R) 25V M ( 20%) Product thickness (mm) The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. MNA14 Ceramic capacitors !Characteristics Class 1 (For thermal compensation) Temperature characteristics A (C0G) Item Operating temperature Nominal capacitance (C) -55C ~ +125C Must be within the specified tolerance range. 100 / (400 + 20C)% or less: Less than 30 pF 0.1% or less : 30 pF or larger Test methods / conditions (based on JIS C 5102) Dissipation factor (tan) Based on paragraph 7.8 and paragraph 9, Measured at room temperature and standard humidity. Measurement frequency : 1 0.1MHz Measurement voltage : 1 0.1Vrms. Based on paragraph 7.6. Measurement is made after rated voltage is applied for 60 5s. Based on paragraph 7.1. Apply 300% of the rated voltage for 1 to 5s then measure. The temperature coefficients in table 12, paragraph 7.12 are calculated at 20C and high temperature. Based on paragraph 8.11.2. Apply 5N for 10 1s in the direction indicated by the arrow. Insulation resistance (IR) 10,000M or 500MF, whichever is smaller Withstanding voltage The insulation must not be damaged. Temperature characteristics Within 0 30ppm / C Terminal adherence No detachment or signs of detachment. Pressure (5N) Test board Capacitor Appearance Resistance to vibration Rate of capacitance change Dissipation factor (tan) There must be no mechanical damage. Must be within initial tolerance. Must satisfy initial specified value. At least 3/4 of the surface of the two terminals must be covered with new solder. Chip is mounted to a board in the manner shown on the right, subjected to vibration (type A in paragraph 8.2), and Board measured 24 2 hours later. Based on paragraph 8.13, Soldering temperature : 235 5C : 2 0.5s Soldering time Solderability Appearance Rate of capacitance change Resistance to soldering heat Dissipation factor (tan) Insulation resistance Withstanding voltage Appearance Temperature cycling Rate of capacitance change Dissipation factor (Tan) Insulation resistance Appearance Rate of capacitance change Humidity load test Dissipation factor (tan) Insulation resistance Appearance Hightemperature load test Rate of capacitance change Dissipation factor (tan) Insulation resistance There must be no mechanical damage. 2.5% or 0.25 pF, whichever is larger Must satisfy initial specified value. 10,000M or 500MF, whichever is smaller The insulation must not be damaged. There must be no mechanical damage. 2.5% or 0.25 pF, whichever is larger Must satisfy initial specified value. 10,000M or 500MF, whichever is smaller There must be no mechanical damage. 7.5% or 0.75 pF, whichever is larger 0.5% or less 500M or 25MF, whichever is smaller There must be no mechanical damage. 3.0% or 0.3 pF, whichever is larger 0.3% or less 10,000M or 50MF, whichever is smaller Based on paragraph 9.9, Test temperature : 40 2C Relative humidity : 90% to 95% Applied voltage : rated voltage Test time : 500 to 524 hrs. Capacitance measured after 24 2 hrs. Based on paragraph 9.10, Test temperature : Max. operating temp. Applied voltage : rated voltage x 200% Test time : 1,000 to 1,048 hrs. Capacitance measured after 24 2 hrs. Based on paragraph 9.3, Number of cycles : 5 Capacitance measured after 24 2 hrs. Based on paragraph 8.14. Soldering temperature : 260 5C : 5 0.5s Soldering time : 150 10C for 1 to 2 min. Preheating The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. MNA14 Ceramic capacitors Class 2 (High dielectric constant) Temperature characteristics CN (X7R) Item Operating temperature Nominal capacitance (C) Dissipation factor (tan) -55C ~ +125C Must be within the specified tolerance range. 2.5% or less (when rated voltage is 16V : 3.5% or less) 10,000M or 500MF, whichever is smaller Based on paragraph 7.8 Measured at room temperature and standard humidity. Measurement frequency: 1 0.1 kHz Measurement voltage : 0.1 0.2 Vrms. Based on paragraph 7.6 Measurement is made after rated voltage is applied for 60 5s. Based on paragraph 7.1 Apply 250% of the rated voltage for 1 to 5s then measure. The temperature coefficients in paragraph 7.12, table 8, condition B, are based on measurements carried out at 20C, with no voltage applied. Based on paragraph 8.11.2. Apply 5N for 10 1s in the direction indicated by the arrow. Test methods/conditions (based on JIS C 5102) Insulation resistance (IR) Withstanding voltage The insulation must not be damaged. Temperature characteristics Within 15% Terminal adherence No peeling or sign of peeling on terminal. Pressure (5N) Test board Capacitor Appearance Resistance to vibration Rate of capacitance change Dissipation factor (tan) Solderability There must be no mechanical damage. Must be within initial tolerance. Must satisfy initial specified value. At least 3/4 of the surface of the two terminals must be covered with new solder. Chip is mounted to a board in the manner shown on the right, subjected to vibration (type A in paragraph 8.2), and measured 48 4 hrs. later. Board Based on paragraph 8.13 Soldering temperature: 235 5C : 2 0.5s Soldering time Appearance Rate of capacitance change Resistance to soldering heat Dissipation factor (tan) Insulation resistance Withstanding voltage Appearance Temperature cycling Rate of capacitance change Dissipation factor (tan) Insulation resistance Appearance Humidity load test Rate of capacitance change Dissipation factor (tan) Insulation resistance Appearance Hightemperature load test Rate of capacitance change Dissipation factor (tan) Insulation resistance There must be no mechanical damage. Within 5.0% Must satisfy initial specified value. 10,000M or 500MF, whichever is smaller The insulation must not be damaged. There must be no mechanical damage. Within 7.5% Must satisfy initial specified value. 10,000M or 500MF, whichever is smaller There must be no mechanical damage. Within 12.5% 5.0% or less 500M or 25MF, whichever is smaller There must be no mechanical damage. Within 10.0% 5.0% or less 1,000M or 50MF, whichever is smaller Based on paragraph 9.10 Test temperature : Max. operating temp. Applied voltage : rated voltage x 200% Test time : 1,000 to 1,048 hrs. Capacitance measured after 48 4 hrs. Based on paragraph 9.9 Test temperature : 40 2C Relative humidity : 90% to 95% Applied voltage : rated voltage Test time : 500 to 524 hrs. Capacitance measured after 48 4 hrs. Based on paragraph 9.3 Number of cycles : 5 Capacitance measured after 48 4 hrs. Based on paragraph 8.14. Soldering temperature: 260 5C Soldering time : 5 0.5s Preheating : 150 10C for 1 to 2 min. The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. MNA14 Ceramic capacitors !Packaging specifications (Units : mm) Taping t J E A D B C Reel 9.0 0.3 11.4 1.0 (Paper taping) Pulling direction Symbol Dimensions C D E F G H J t t1 3.5 1.75 4.0 2.0 4.0 1.5 1.05 1.2 8.0 0.3 0.05 0.1 0.1 0.05 0.1 +0.1 MAX. MAX. 0 Label position Size Symbol A B (180mm reel) 1608 x 4 2.0 0.1 3.5 0.1 EIAJ ET-7200A compliant The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. 0 180 -1.5 t1 F G H 13 0.2 -0 60 +1 MNA14 Ceramic capacitors !Electrical characteristics gA (C0G) Characteristics 5 RATE OF CAPACITANCE CHANGE : (%) 10000 1000 100 10 1 0.1 100pF 220pF 470pF 4 3 2 1 0 -1 -2 -3 -4 -5 -50 0 50 100 0 1 10 100 1000 10000 FREQUENCY (MHz) IMPEDANCE () TEMPERATURE : (C) Fig.1 Capacitance-temperature characteristics Fig.2 Impedance-frequency characteristics gCN (X7R) Characteristics 30 RATE OF CAPACITANCE CHANGE : (%) 1000 20 10 0 -10 -20 -30 C / C 100 IMPEDANCE () 10 1 1,000pF 15 tan (%) 0.1 10,000pF 0.01 1 10 100 1000 10000 FREQUENCY (MHz) 10 tan -50 0 50 100 5 0 TEMPERATURE : (C) Fig.3 Capacitance-temperature characteristics Fig.4 Impedance-frequency characteristics The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. MNA14 Ceramic capacitors gTemperature cycling test A (C0G) Characteristics (100pF) 3.0 RATE OF CAPACITANCE CHANGE : (%) 2.0 JIS C 5102 9. 3 SAMPLE SIZE : n = 50pcs -55 / +125C 100cyc 0.6 0.5 JIS C 5102 9. 3 SAMPLE SIZE : n = 50pcs -55 / +125C 100cyc JIS C 5102 9. 3 SAMPLE SIZE : n = 50pcs -55 / +125C 100cyc 1 x 1 012 1.0 tan : (%) 0.4 0 -1.0 -2.0 -3.0 INITIAL VALUE TESTED 0.3 0.2 0.1 0 INITIAL VALUE TESTED IR : () 1 x 1011 INITIAL VALUE TESTED Fig.5 Rate of capacitance change Fig.6 tan Fig.7 Insulation resistance 15.0 RATE OF CAPACITANCE CHANGE : (%) CN (X7R) Characterisics (10,000pF) JIS C 5102 9. 3 SAMPLE SIZE : n = 50pcs -55 / +125C 100cyc 6.0 JIS C 5102 9. 3 SAMPLE SIZE : n = 50pcs -55 / +125C 100cyc 10.0 5.0 JIS C 5102 9. 3 SAMPLE SIZE : n = 50pcs -55 / +125C 100cyc 1 x 1012 5.0 tan : (%) 4.0 IR : () 0 -5.0 -10.0 -15.0 INITIAL VALUE TESTED 3.0 2.0 1.0 0 INITIAL VALUE TESTED 1 x 1011 INITIAL VALUE TESTED Fig.8 Rate of capacitance change Fig.9 tan Fig.10 Insulation resistance gHigh - temperature load test 3.0 RATE OF CAPACITANCE CHANGE : (%) A (C0G) Characteristics (100pF) JIS C 5102 9. 10 SAMPLE SIZE : n = 50pcs +125C 1,000h OVERLOAD : 200% RATED VOLTAGE 0.6 JIS C 5102 9. 10 SAMPLE SIZE : n = 50pcs +125C 1,000h OVERLOAD : 200% RATED VOLTAGE 0.5 2.0 1 x 1012 1.0 tan : (%) 0.4 0.0 -1.0 -2.0 -3.0 0 240 480 TIME (h) 720 0.3 0.2 0.1 0 IR : () 1 x 1011 JIS C 5102 9. 10 SAMPLE SIZE : n = 50pcs +125C 1,000h OVERLOAD : 200% RATED VOLTAGE 1000 0 240 480 TIME (h) 720 1000 1 x 1010 0 240 480 TIME (h) 720 1000 Fig.11 Rate of capacitance change Fig.12 tan Fig.13 Insulation resistance The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. MNA14 Ceramic capacitors 15.0 RATE OF CAPACITANCE CHANGE : (%) CN (X7R) Characteristics (10,000pF) JIS C 5102 9. 10 SAMPLE SIZE : n = 50pcs +125C 1,000h OVERLOAD : 200% RATED VOLTAGE tan : (%) 6.0 JIS C 5102 9. 10 SAMPLE SIZE : n = 50pcs +125C 1,000h OVERLOAD : 200% RATED VOLTAGE 10.0 5.0 1 x 1012 JIS C 5102 9. 10 SAMPLE SIZE : n = 50pcs +125C 1,000h OVERLOAD : 200% RATED VOLTAGE 5.0 4.0 IR : () 0.0 -5.0 -10.0 -15.0 0 240 480 TIME (h) 720 3.0 2.0 1.0 0 1000 0 240 480 TIME (h) 720 1000 1 x 1011 0 240 480 TIME (h) 720 1000 Fig.14 Rate of capacitance change Fig.15 tan Fig.16 Insulation resistance gHumidity load test 3.0 A (C0G) Characteristics (100pF) JIS C 5102 9. 9 SAMPLE SIZE : n = 50pcs +40C 90 ~ 95%RH 1,000h OVERLOAD : THE RATED VOLTAGE 0.6 JIS C 5102 9. 9 SAMPLE SIZE : n = 50pcs +40C 90 ~ 95%RH 1,000h OVERLOAD : THE RATED VOLTAGE RATE OF CAPACITANCE CHANGE : (%) 2.0 0.5 1 x 1012 JIS C 5102 9. 9 SAMPLE SIZE : n = 50pcs +40C 90 ~ 95%RH 1,000h OVERLOAD : THE RATED VOLTAGE 1.0 tan : (%) 0.4 IR : () 0.0 -1.0 -2.0 -3.0 0 240 480 TIME (h) 720 0.3 0.2 0.1 0 0 240 480 TIME (h) 720 1000 1 x 1011 1000 1 x 1010 0 240 480 TIME (h) 720 1000 Fig.17 Rate of capacitance change Fig.18 tan Fig.19 Insulation resistance 15.0 RATE OF CAPACITANCE CHANGE : (%) CN (X7R) Characteristics (10,000pF) JIS C 5102 9. 9 SAMPLE SIZE : n = 50pcs +40C 90 ~ 95%RH 1,000h OVERLOAD : THE RATED VOLTAGE 6.0 10.0 5.0 1 x 1012 4.0 JIS C 5102 9. 9 SAMPLE SIZE : n = 50pcs +40C 90 ~ 95%RH 1,000h OVERLOAD : THE RATED VOLTAGE 5.0 tan : (%) 0 -5.0 -10.0 -15.0 0 240 480 TIME (h) 720 3.0 2.0 1.0 0 0 240 480 TIME (h) 720 1000 JIS C 5102 9. 9 SAMPLE SIZE : n = 50pcs +40C 90 ~ 95%RH 1,000h OVERLOAD : THE RATED VOLTAGE 1000 IR : () 1 x 1011 1 x 1010 0 240 480 TIME (h) 720 1000 Fig.20 Rate of capacitance change Fig.21 tan Fig.22 Insulation resistance The design and specifications are subject to change without prior notice. Before ordering or using, please check the latest technical specification. Appendix Notes No technical content pages of this document may be reproduced in any form or transmitted by any means without prior permission of ROHM CO.,LTD. The contents described herein are subject to change without notice. The specifications for the product described in this document are for reference only. Upon actual use, therefore, please request that specifications to be separately delivered. Application circuit diagrams and circuit constants contained herein are shown as examples of standard use and operation. Please pay careful attention to the peripheral conditions when designing circuits and deciding upon circuit constants in the set. Any data, including, but not limited to application circuit diagrams information, described herein are intended only as illustrations of such devices and not as the specifications for such devices. ROHM CO.,LTD. disclaims any warranty that any use of such devices shall be free from infringement of any third party's intellectual property rights or other proprietary rights, and further, assumes no liability of whatsoever nature in the event of any such infringement, or arising from or connected with or related to the use of such devices. Upon the sale of any such devices, other than for buyer's right to use such devices itself, resell or otherwise dispose of the same, no express or implied right or license to practice or commercially exploit any intellectual property rights or other proprietary rights owned or controlled by ROHM CO., LTD. is granted to any such buyer. Products listed in this document use silicon as a basic material. Products listed in this document are no antiradiation design. The products listed in this document are designed to be used with ordinary electronic equipment or devices (such as audio visual equipment, office-automation equipment, communications devices, electrical appliances and electronic toys). Should you intend to use these products with equipment or devices which require an extremely high level of reliability and the malfunction of with would directly endanger human life (such as medical instruments, transportation equipment, aerospace machinery, nuclear-reactor controllers, fuel controllers and other safety devices), please be sure to consult with our sales representative in advance. About Export Control Order in Japan Products described herein are the objects of controlled goods in Annex 1 (Item 16) of Export Trade Control Order in Japan. In case of export from Japan, please confirm if it applies to "objective" criteria or an "informed" (by MITI clause) on the basis of "catch all controls for Non-Proliferation of Weapons of Mass Destruction. Appendix1-Rev1.0 |
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