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 INFRARED DETECTOR
PbS photoconductive detector
P2532-01, P2682-01
Infrared detectors utilizing photoconductive effects
Features
Makes PbS cells useful in a wide range of applications including radiation thermometers and flame monitors l High sensitivity l Large active area l Low price l Lower temperature detection limit: 100 C l Thermoelectrically cooled types Cooling a PbS cell increases sensitivity and improves S/N, so cooled types are widely used in precision photometry such as in analytical instruments.
Applications
l Room temperature operation
l Radiation thermometers l Flame monitors l Water content analyzers l Food ingredient analysis l Spectrophotometers
Accessories (Optional)
l Heatsink for one-stage TE-cooled type l Heatsink for two-stage TE-cooled type l Temperature controller for TE-cooled type l Preamplifier for PbS/PbSe photoconductive detector l Power supply for amplifier l Infrared detector module with preamp Cooled type
A3179 A3179-01 C1103-04 C3757-02 C3871 P4638
s Specification / Absolute maximum ratings
Type No. Dimensional outline/ Package Window 1 material * /S TO-8 P2682-01 /S Cooling Absolute maximum ratings Active Thermistor Thermistor TE-cooler Operating Storage Supply temperature temperature area resistance power current voltage Topr Tstg dissipation dissipation (mm) (mW) (A) (V) (C) (C) (k) 1.5 4x5 9 0.2 1.0 100 -30 to +5 0 -55 to +5 0
P2532-01
One-stage TE-cooled Two-stage TE-cooled
s Electrical and optical characteristics (Typ. unless otherwise noted)
Measure ment Peak Cut-off condition sensitivity wavelength Element wavelength c temperature p Photo sensitivity *2 Rise time Dark S D D resistance tr =p (p, 600, 1) (500, 600, 1) Rd 0 to 63 % Vs=15 V Typ. Max. Min. Typ. Min. (c m* Hz 1/2 / W) (c m* Hz 1/2 / W) (c m* Hz 1/2 / W) (s) (V/W) (V/W) (M) 0.5 to 10 3 x 104 8 x 104 5 x 108 1 x 109 1 x 1011 600 0.8 to 10 6 x 104 1.6 x 105 8 x 108 2 x 109 2 x 1011
Type No.
(C) (m) (m) P2532-01 -10 2.4 3.1 P2682-01 -20 2.5 3.2 *1: Window material S: sapphire glass *2: Chopping frequency: 600 Hz, load resistance: nearly equal to detector element dark resistance
1
PbS photoconductive detector
s Spectral response
100 -20 C (Typ.)
P2532-01, P2682-01
(Typ. Ta=25 C) 8 7
s S/N vs. supply voltage
800
80 -10 C
600
SIGNAL 6
RELATIVE VALUE (%)
SIGNAL (V)
60 25 C 40
400 NOISE 200
4 3
20
0 1 2 3 4 5
0 0 10
2 LIGHT SOURCE: BLACK BODY 500 K INCIDENT ENERGY: 4.8 W/cm2 1 CHOPPING FREQUENCY: 600 Hz FREQUENCY BANDWIDTH: 60 Hz 0 20 40 50 60 30
WAVELENGTH (m)
KIRDB0279EA
SUPPLY VOLTAGE (V)
KIRDB0046EA
If voltage of higher than 60 V is applied, the noise increases exponentially, degrading the S/N. The device should be operated at 60 V or less.
s S/N vs. chopping frequency
10
3
s Photo sensitivity temperature characteristic
103 (Typ.)
(Typ. Ta=25 C) LIGHT SOURCE: BLACK BODY 500 K INCIDENT ENERGY: 4.8 W/cm2 SUPPLY VOLTAGE: 15 V tr: 200 s S/N
S 10
2
RELATIVE SENSITIVITY
RELATIVE S/N
102
N 101 1 10
10
1
LIGHT SOURCE: BLACK BODY 500 K INCIDENT ENERGY: 4.8 W/cm2 CHOPPING FREQUENCY: 600 Hz SUPPLY VOLTAGE: 15 V
102
103
-20
-10
0
10
20
30
40
50
60
CHOPPING FREQUENCY (Hz)
KIRDB0047EB
ELEMENT TEMPERATURE (C)
KIRDB0048EB
Increasing the chopping frequency reduces the 1/f noise and results in an S/N improvement. The S/N can also be improved by narrowing the noise bandwidth using a lock-in amplifier.
Cooling the device enhances its sensitivity, but the sensitivity also depends on the load resistance in the circuit.
s Dark resistance, rise time temperature characteristics
103 (Typ.)
s Photo sensitivity linearity
10
2
(Typ. Ta=25 C, FULLY ILLUMINATED)
DARK RESISTANCE
101
RELATIVE OUTPUT
RELATIVE VALUE
100
10
2
RISE TIME
10-1
10
-2
DEPENDENT ON NEP
10
1
-20
-10
0
10
20
30
40
50
60
10-3 -9 10
10
-8
10
-7
10
-6
10
-5
10
-4
ELEMENT TEMPERATURE (C)
KIRDB0049EB
INCIDENT ENERGY (W/cm2)
KIRDB0050EA
By making the incident light spot smaller than the active area, the upper limit of the linearity becomes lower.
2
NOISE (V)
5
PbS photoconductive detector
s Cooling characteristics of TE-cooler
P2532-01, P2682-01
s Current vs. voltage characteristics of TE-cooler
(Typ. Ta=25 C, Thermal resistance of heatsink=3 C/W)
40
(Typ. Ta=25 C, Thermal resistance of heatsink=3 C/W)
1.6 1.4
ELEMENT TEMPERATURE (C)
20
ONE-STAGE TE-COOLED
1.2
ONE-STAGE TE-COOLED
CURRENT (A)
0
1.0 0.8 0.6 0.4 0.2 TWO-STAGE TE-COOLED
-20 TWO-STAGE TE-COOLED -40
-60 0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6
0 0 0.2 0.4 0.6 0.8 1.0 1.2
CURRENT (A)
KIRDB0171EA
VOLTAGE (V)
KIRDB0115EB
s Thermistor temperature characteristic
106 (Typ.)
RESISTANCE ()
105
104
10
3
-40
-30
-20
-10
0
10
20
30
ELEMENT TEMPERATURE (C)
KIRDB0116EA
s Connection example (P2682-01)
CABLE (SUPPLIED WITH C3757-02) POWER SUPPLY FOR PREAMP 2-CONDUCTOR SHIELDED CABLE P2682-01 + A3179-01 DETECTOR AND HEATSINK BNC CONNECTOR CABLE (SOLD SEPARATELY) C3757-02 C3871 AMP LOCK-IN AMP or SPECTRUM ANALYZER SIGNAL PROCESSING CIRCUIT
C1103-04
TEMPERATURE CONTROLLER
C4696 CHOPPER
CABLE (SUPPLIED WITH C1103-04) Connect C1103-04 and C3871 ground terminals together.
KIRDC0003EA
3
PbS photoconductive detector
s Dimensional outlines (unit: mm) P2532-01
15.3 0.2 14 0.2
6.4 0.2
P2532-01, P2682-01
P2682-01
15.3 0.2 14 0.2
4.5 0.2
12 MIN.
PHOTOSENSITIVE SURFACE 0.45 LEAD 10.2 0.2
5.1 0.2
0.45 LEAD 10.2 0.2
5.1 0.2
5.1 0.2
KIRDA0116EA
5.1 0.2
DETECTOR DETECTOR TE-COOLER (-) TE-COOLER (+) THERMISTOR
12 MIN.
DETECTOR DETECTOR TE-COOLER (-) TE-COOLER (+) THERMISTOR
PHOTOSENSITIVE SURFACE
6.9 0.2
10 0.2
WINDOW 10 0.2
WINDOW 10 0.2
KIRDA0117EA
Information furnished by HAMAMATSU is believed to be reliable. However, no responsibility is assumed for possible inaccuracies or omissions. Specifications are subject to change without notice. No patent rights are granted to any of the circuits described herein. (c)2003 Hamamatsu Photonics K.K.
HAMAMATSU PHOTONICS K.K., Solid State Division 1126-1 Ichino-cho, Hamamatsu City, 435-8558 Japan, Telephone: (81) 053-434-3311, Fax: (81) 053-434-5184, http://www.hamamatsu.com
U.S.A.: Hamamatsu Corporation: 360 Foothill Road, P.O.Box 6910, Bridgewater, N.J. 08807-0910, U.S.A., Telephone: (1) 908-231-0960, Fax: (1) 908-231-1218 Germany: Hamamatsu Photonics Deutschland GmbH: Arzbergerstr. 10, D-82211 Herrsching am Ammersee, Germany, Telephone: (49) 08152-3750, Fax: (49) 08152-2658 France: Hamamatsu Photonics France S.A.R.L.: 8, Rue du Saule Trapu, Parc du Moulin de Massy, 91882 Massy Cedex, France, Telephone: 33-(1) 69 53 71 00, Fax: 33-(1) 69 53 71 10 United Kingdom: Hamamatsu Photonics UK Limited: 2 Howard Court, 10 Tewin Road, Welwyn Garden City, Hertfordshire AL7 1BW, United Kingdom, Telephone: (44) 1707-294888, Fax: (44) 1707-325777 North Europe: Hamamatsu Photonics Norden AB: Smidesvagen 12, SE-171 41 Solna, Sweden, Telephone: (46) 8-509-031-00, Fax: (46) 8-509-031-01 Italy: Hamamatsu Photonics Italia S.R.L.: Strada della Moia, 1/E, 20020 Arese, (Milano), Italy, Telephone: (39) 02-935-81-733, Fax: (39) 02-935-81-741 Cat. No. KIRD1019E06
4
Sep. 2003 DN


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