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| TLP559 TOSHIBA Photocoupler GaAAs Ired & Photo IC TLP559 Digital Logic Ground Isolation Line Receiver Microprocessor System Interfaces Switching Power Supply Feedback Control Transistor Inverter Unit in mm The TOSHIBA TLP559 consists of a GaAAs high-output light emitting diode and a high speed detector of one chip photo diode-transistor. This unit is 8-lead DIP package. TLP559 has no internal base connection, and a faraday shield integrated on the photodetector chip provides an effective common mode noise transient immunity. So this is suitable for application in noisy environmental condition. * * * * Isolation voltage: 2500Vrms (min.) Switching speed: tpHL = 0.3s (typ.) tpLH = 0.5s (typ.) (RL = 1.9k) TTL compatible UL recognized: UL1577, file No.E67349 TOSHIBA Weight: 0.54g 11-10C4 Pin Configuration (top view) 1 2 3 4 Shield 8 7 6 5 1 : N.C. 2 : Anode 3 : Cathode 4 : N.C. 5 : Emitter 6 : Collector 7 : N.C. 8 : VCC Schematic ICC IF 2 VF 3 IO 6 VO 8 VCC Shield 5 GND 1 2007-10-01 TLP559 Absolute Maximum Ratings (Ta = 25C) Characteristic Forward current Pulse forward current LED Peak transient forward current Reverse voltage Diode power dissipation Output current Detector Peak output current Output voltage Supply voltage Output power dissipation Operating temperature range Storage temperature range Lead solder temperature (10s) Isolation voltage (AC, 1 min., R.H. 60%) (Note 7) (Note 6) (Note 5) (Note 4) (Note 1) (Note 2) (Note 3) Symbol IF IFP IFPT VR PD IO IOP VO VCC PO Topr Tstg Tsol BVS Rating 25 50 1 5 45 8 16 -0.5~15 -0.5~15 100 -55~100 -55~125 260 2500 Unit mA mA A V mW mA mA V V mW C C C Vrms Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook ("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test report and estimated failure rate, etc). (Note 1) (Note 2) (Note 3) (Note 4) (Note 5) (Note 6) (Note 7) Derate 0.8mA above 70C. 50% duty cycle,1ms pulse width. Derate 1.6mA / C above 70C. Pulse width 1s, 300pps. Derate 0.9mW / C above 70C. Derate 2mW / C above 70C. Soldering portion of lead: up to 2mm from body of the devise. Device considered a two-terminal device: Pins 1, 2, 3 and 4 shorted together and pins 5, 6, 7 and 8 shorted together. 2 2007-10-01 TLP559 Electrical Characteristics (Ta = 25C) Characteristic Forward voltage LED Forward voltage temperature coefficient Reverse current Capacitance between terminal Symbol VF VF / Ta IR CT IOH (1) Detector High level output current IOH (2) IOH High level supply voltage Current transfer ratio Coupled Low level output voltage Resistance (input-output) Capacotance (input-output) ICCH IO / IF VOL RS CS IF = 16mA IF = 16mA VR = 5V VF = 0, f = 1MHz IF = 0mA, VCC = VO = 5.5V IF = 0mA, VCC = VO = 15V IF = 0mA, VCC = 15V VO = 15V, Ta = 70C IF = 0mA, VCC = 15V IF = 16mA, VCC = 4.5V VO = 0.4V IF = 16mA, VCC = 4.5V IO = 2.4mA R.H. 60%, VS = 500VDC VS = 0, f = 1MHz (Note 7) (Note 7) Test Condition Min. 20 5x10 10 Typ. 1.65 -2 45 3 0.01 40 10 14 Max. 1.85 10 500 5 50 1 0.4 Unit V mV / C A pF nA A A % V pF 0.8 Switching Characteristics (Ta = 25CVCC = 5V) Characteristic Propagation delay time (H L) Propagation delay time (L H) Common mode transient immunity at logic high output Common mode transient immunity at logic high output Symbol tpHL 1 tpLH CMH 2 CML IF = 0mA, VCM = 400Vp-p RL = 4.1k IF =16mA, VCM = 400Vp-p RL = 4.1k IF = 16mA, RL = 1.9k 2000 0.3 10000 0.8 s V / s V / s Test Cir- cuit Test Condition Min. Typ. 0.2 Max. 0.8 Unit s (Note 8) (Note 8) -2000 -10000 (Note 8) CML is the maximum rate of fall of the common mode voltage that can be sustained with the output voltage in the logic low state (VO < 0.8V). CMH is the maximum rate of rise of the common mode voltage that can be sustained with the output voltage in the logic high state (VO < 2.0V). (Note 9) Maximum electrostatic discharge voltage for any pins: 100V (C = 200pF, R = 0) 3 2007-10-01 TLP559 Test Circuit 1: Switching Time Test Circuit Pulse input PW=100s Duty ratio=1 / 10 IF monitor 51 IF 1 2 3 4 8 7 6 5 RL VCC = 5V IF 0 VO 5V 1.5V tpHL tpLH 1.5V VOL VO Output monitor Test Circuit 2: Common Mode Noise Immunity Test Circuit 1 2 3 4 8 7 6 5 VCM Pulse generator ZO=50 320(V) 320(V) CMH = , CML = t r (s) t f (s) VCC=5V VCM RL VO Output monitor VO (IF=0mA) VO (IF=16mA) tr 90% 10% tf 400V IF 0V 5V 2V 0.8V VOL 4 2007-10-01 TLP559 IF - VF 100 50 30 Ta = 25C -2.6 VF / Ta - IF Forward voltage temperature coefficient VF / Ta (mV / ) -2.4 (mA) 10 5 3 1 0.5 0.3 0.1 0.05 0.03 0.01 1.0 -2.2 Forward current IF -2.0 -1.8 -1.6 1.2 1.4 1.6 1.8 2.0 -1.4 0.1 0.3 0.5 1 3 5 10 30 Forward voltage VF (V) Forward current IF (mA) IOH (1) - Ta 300 10 5 100 3 lO - IF VCC = 5V VO = 0.4V Ta = 25C High level output current IOH (A) 50 30 (mA) 1 0.5 0.3 10 5 3 Output current IO 0.1 0.05 0.03 1 0.6 0 40 80 120 160 0.01 0.1 0.3 0.5 1 3 5 10 30 50 100 300 Ambient temperature Ta () Forward current IF (mA) IO / IF - IF 100 50 30 VCC = 5V VO = 0.4V 1.0 1.2 IO / IF - Ta Normalized IO / IF Current transfer ratio IO / IF (%) Ta = -25C 0.8 10 25C 100C 0.6 Normalized To : IF = 16mA VCC = 4.5V 0.2 VO = 0.4V Ta = 25C 5 3 0.4 1 0.3 0.5 1 3 5 10 30 50 0 -40 -20 0 20 40 60 80 100 Forward current IF (mA) Ambient temperature Ta () 5 2007-10-01 TLP559 IO - VO 10 30mA VCC = 5V Ta = 25C 25mA 5 VO - IF IF 4 VCC =5V (mA) (V) 8 20mA 6 15mA RL VO Output voltage VO Output current IO 3 Ta=25 2 RL=2k 3.9k 1 10k 4 10mA 2 IF=5mA 0 0 1 2 3 4 5 6 7 0 0 4 8 12 16 20 24 Output voltage VO (V) Forward current IF (mA) tpHL, tpLH - RL 5 3 IF = 16mA VCC = 5V Ta = 25C tpLH Propagation delay time tpLH, tpHL (s) 1 0.5 0.3 tpHL 0.1 1 3 5 10 30 50 100 Load resistance RL (k) 6 2007-10-01 TLP559 RESTRICTIONS ON PRODUCT USE * The information contained herein is subject to change without notice. 20070701-EN * TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer's own risk. * The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. * GaAs(Gallium Arsenide) is used in this product. The dust or vapor is harmful to the human body. Do not break, cut, crush or dissolve chemically. * Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 7 2007-10-01 |
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