Part Number Hot Search : 
TDA7315N 1N6330 A143E EL4332 CDG00 V220MA2A G67150 GBS308
Product Description
Full Text Search
 

To Download LA191B-HE-1 Datasheet File

  If you can't view the Datasheet, Please click here to try to view without PDF Reader .  
 
 


  Datasheet File OCR Text:
 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
OFFICE:7F.,NO.208,SEC.3,JHONGYANG Rd.,Tucheng City Taipei Hsien,Taiwan R.O.C TEL:(02)22677686(REP) FAX:(02)22675286,(02)22695616
LED ARRAY
LA191B/HE-1
DATA SHEET
DOC. NO : REV. DATE : :
QW0905-LA191B/HE-1 A 01 - Oct - 2004
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
PART NO. LA191B/HE-1 Page 1/4
Package Dimensions
4.6 3.50.5 4.7
2.9 8.55 6.3
3.50.5
6.0 1/4 0.5 TYP 2.950.5
2.54TYP
+ LHE2643-1
-
2.9
3.1
3.3
4.3
1.5MAX 25.0MIN 0.5 TYP
2.54TYP
+
-
1.0MIN
Note : 1.All dimension are in millimeter tolerance is O 0.25mm unless otherwise noted. 2.Specifications are subject to change without notice.
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
PART NO. LA191B/HE-1 Page 2/4
Absolute Maximum Ratings at Ta=25 J
Ratings Parameter Symbol HE Forward Current Peak Forward Current Duty 1/10@10KHz Power Dissipation Reverse Current @5V Electrostatic Discharge Operating Temperature Storage Temperature Soldering Temperature IF IFP PD Ir ESD Topr Tstg Tsol 30 60 75 10 2000 -40 ~ +85 -40 ~ +100 Max 260J for 5 sec Max (2mm from body) mA mA mW UNIT
g A V J J
Typical Electrical & Optical Characteristics (Ta=25 J )
PART NO
MATERIAL Emitted
COLOR Lens
Forward Dominant Spectral voltage wave halfwidth @ 20mA(V) length f nm f Dnm
Luminous intensity @20mA(mcd)
Viewing angle 2c 1/2 (deg)
Min. Max. Min. 620 17 1.7 2.6 350
Typ. 700 40
LA191B/HE-1 AlGaInP
Orange Water Clear
Note : 1.The forward voltage data did not including O 0.1V testing tolerance. 2. The luminous intensity data did not including O 15% testing tolerance.
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
PART NO. LA191B/HE-1 Page3/4
Typical Electro-Optical Characteristics Curve
HE CHIP
Fig.1 Forward current vs. Forward Voltage Fig.2 Relative Intensity vs. Forward Current
1000
3.5
Forward Current(mA)
100 10 1.0 0.1 1.0 1.5 2.0 2.5 3.0
Relative Intensity Normalize @20mA
3.0 2.5 2.0 1.5 1.0 0.5 0.0 1.0 10 100 1000
Forward Voltage(V) Fig.3 Forward Voltage vs. Temperature
1.2
Forward Current(mA) Fig.4 Relative Intensity vs. Temperature
2.0
Forward Voltage@20mA Normalize @25J
Relative Intensity@20mA Normalize @25J
1.1 1.0
1.5 1.0
0.9
0.5
0.8 -40 -20 0 20 40 60 80 100
0.0 -40 -20 0 20 40 60 80 100
Ambient Temperature(J )
Ambient Temperature(J )
Fig.5 Relative Intensity vs. Wavelength
1.0
Relative Intensity@20mA
0.5
0.0 550 600 650 700
Wavelength (nm)
LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only
PART NO. LA191B/HE-1 Page 4/4
Reliability Test:
Test Item
Test Condition
1.Under Room Temperature 2.If=20mA 3.t=1000 hrs (-24hrs, +72hrs)
Description
This test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. The purpose of this is the resistance of the device which is laid under ondition of hogh temperature for hours.
Reference Standard
MIL-STD-750: 1026 MIL-STD-883: 1005 JIS C 7021: B-1
Operating Life Test
High Temperature Storage Test
1.Ta=105JO 5J 2.t=1000 hrs (-24hrs, +72hrs)
MIL-STD-883:1008 JIS C 7021: B-10
Low Temperature Storage Test
1.Ta=-40JO 5J 2.t=1000 hrs (-24hrs, +72hrs)
The purpose of this is the resistance of the device which is laid under condition of low temperature for hours.
JIS C 7021: B-12
High Temperature High Humidity Test
1.Ta=65JO 5J 2.RH=90%~95% 3.t=240hrsO 2hrs
The purpose of this test is the resistance of the device under tropical for hous.
MIL-STD-202:103B JIS C 7021: B-11
Thermal Shock Test
1.Ta=105JO 5J &-40JO (10min) (10min) 2.total 10 cycles
5J
The purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. This test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. This test intended to see soldering well performed or not.
MIL-STD-202: 107D MIL-STD-750: 1051 MIL-STD-883: 1011
Solder Resistance Test
1.T.Sol=260JO 5J 2.Dwell time= 10O 1sec.
MIL-STD-202: 210A MIL-STD-750: 2031 JIS C 7021: A-1 MIL-STD-202: 208D MIL-STD-750: 2026 MIL-STD-883: 2003 JIS C 7021: A-2
Solderability Test
1.T.Sol=230JO 5J 2.Dwell time=5O 1sec


▲Up To Search▲   

 
Price & Availability of LA191B-HE-1

All Rights Reserved © IC-ON-LINE 2003 - 2022  

[Add Bookmark] [Contact Us] [Link exchange] [Privacy policy]
Mirror Sites :  [www.datasheet.hk]   [www.maxim4u.com]  [www.ic-on-line.cn] [www.ic-on-line.com] [www.ic-on-line.net] [www.alldatasheet.com.cn] [www.gdcy.com]  [www.gdcy.net]


 . . . . .
  We use cookies to deliver the best possible web experience and assist with our advertising efforts. By continuing to use this site, you consent to the use of cookies. For more information on cookies, please take a look at our Privacy Policy. X