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rev. 1.4 7/08 copyright ? 2008 by silicon laboratories si5110 si5110 siphy ? oc-48/stm-16 sonet/sdh t ransceiver features complete low-power, high-speed, sonet/ sdh transceiver with integrated limiting amp, cd r, cmu, and mux/demux. applications description the si5110 is a complete low-power transceiver for high-speed serial communication systems operating between oc-48 and 2.7 gbps. the receive path consists of a fully-integ rated limiting amplifier, clock and data recovery unit (cdr), and 1:4 deserializer. the transmit path combines a low-jitter clock multiplier unit (cmu) with a 4:1 serializer. the cmu uses silicon laboratories? dspll ? technology to provide superior jitter performance while reducing design co mplexity by eliminating external loop filter components. to simplif y ber optimization in long haul applications, programmable slicing and sample phase adjustment are supported. the si5110 operates fr om a single 1.8 v supply over the industrial temperature range (?20 to 85 c). functional block diagram ? data rates supported: oc-48/stm-16 through 2.7 gbps fec ? low-power operation 1.0 w (typ) ? dspll ? based clock multiplier unit with selectable loop filter bandwidths ? integrated limit ing amplifier ? diagnostic and line loopbacks ? sonet-compliant loop-timed operation ? programmable slicing level and sample phase adjustment ? lvds parallel interface ? single supply 1.8 v operation ? 11 x 11 mm bga package ? sonet/sdh transmission systems ? optical transceiver modules ? sonet/sdh test equipment txclkout rxdout[3:0] rxclk 1:4 demux 4:1 mux tx do ut rxdin limiting am p cdr txdin[3:0] slicelvl phaseadj bwsel[1:0] dspll t m tx cm u tx clk4 i n refclk line loopback diagnostic loopback ordering information: see page 32. si5110 bottom view
si5110 2 rev. 1.4
si5110 rev. 1.4 3 t able of c ontents section page 1. detailed block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4 2. electrical specificat ions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5 3. typical application schematic . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12 4. functional description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .13 5. receiver . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 5.1. receiver differential input circuitry . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 5.2. limiting amplifier . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13 5.3. clock and data recovery (cdr) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14 5.4. deserialization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15 5.5. voltage reference output . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15 5.6. auxiliary clock output . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 5.7. receive data squelch . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 6. transmitter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 6.1. dspll ? clock multiplier unit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18 6.2. serialization . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .19 7. loop timed operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 8. diagnostic loopback . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .19 9. line loopback . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19 10. bias generation circuitr y . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 0 11. reference clock . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .20 12. reset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 13. transmit differential out put circuit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 14. internal pullups and pulldowns . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 15. power supply filtering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 16. si5110 pinout: 99 bga . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23 17. pin descriptions: si5110 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2 5 18. ordering guide . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32 19. package outline . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .33 20. 11x11 mm 99l cbga recommended pc b layout . . . . . . . . . . . . . . . . . . . . . . . . . . . .34 document change list . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35 contact information . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .36
si5110 4 rev. 1.4 1. detailed block diagram limiting am p cdr 1:4 de- mux 4:1 mux cmu fifo 8:4 mux 8:4 mux rxdin slicelvl ltr pha sea dj rxlol loslvl los txdout txsqlch txclkout txlol refra te bwsel[1:0] refsel llbk refclk txclk4in txclk4out txdin[3:0] rxclk2div rxclk2dsbl rxclk1dsbl rxclk2 rxclk1 rxdout[3:0] dlbk rxsqlch txclkdsbl slicemode rxa mpmon rxmsbsel fifoerr fiforst txmsbsel lptm llbk los
si5110 rev. 1.4 5 2. electrical specifications figure 1. differential voltage measurement (rxdin, rxdout, rxclk1, rxclk2, txdin, txdout, txclkout, txclk4out, txclk4in) figure 2. data to clock delay table 1. recommended operating conditions parameter symbol test condition min * typ max * unit ambient temperature t a ?20 25 85 c lvttl i/o supply voltage v ddio 1.71 ? 3.47 v si5110 supply voltage v dd 1.71 1.8 1.89 v *note: all minimum and maximum specifications are guaranteed and apply across the recommended operating conditions. typical values apply at nominal supply volt ages and an operatin g temperature of 25 c unless otherwise stated. v ise , v ose v id ,v od (v id = 2 v ise ) differential i/os differential voltage swing single ended voltage differential peak-to-peak voltage signal + signal ? (signal+) ? (signal?) v icm , v ocm v t v i 0 v v txdout, txdin txclkout, txclk4in t cp t ch rxdout rxclk1 t cq1 t cq2 t cd
si5110 6 rev. 1.4 figure 3. i/o rise/fall times table 2. dc characteristics (v dd = 1.8 v 5%, t a = ?20 to 85 c) parameter symbol test condition min typ max unit supply current i dd full duplex ? 575 640 ma line/diagnostic loopback ? 635 700 ma power dissipation p d full duplex ? 1.0 1.2 w line/diagnostic loopback ?1.11.3w voltage reference (vref) v ref vref driving 10 k load 1.21 1.25 1.29 v common mode input voltage (rxdin) v icm 0.4 0.5 0.6 v differential input voltage swing (rxdin) (at bit error rate of 10 ?12 ) v id figure 1 30 ? 2000* mv ppd common mode output voltage (txdout, txclkout) v ocm 0.7 0.9 1.1 v differential output voltage swing (txdout, txclkout), differen- tial pk-pk v od figure 1 1000 1200 1400 mv ppd lvpecl input common mode voltage (refclk) v icm 0.8 1.2 2.4 v lvpecl input voltage swing, differential pk-pk (refclk) v id figure 1 250 ? 2400 mv ppd lvpecl input limits v limit 0?2.5 v lvds input voltage level (txdin, txclk4in) v i 0.8 1.2 2.4 v lvds input voltage, differential (txdin, txclk4in) v id 200 ? ? mv ppd lvds output voltage level (rxdout, rxclk1, rxclk2, txclk4out) v o 100 load line-to-line 0.925 ? 1.475 v *note: voltage on rxdin+ or rxdin? should not exceed 1000 mv pp (single-ended) all differential ios t f t r 80% 20%
si5110 rev. 1.4 7 lvds output voltage, differential (rxdout, rxclk1, rxclk2, txclk4out) v od 100 load line-to-line figure 1 550 650 800 mv ppd lvds common mode output voltage (rxdout, rxclk1, rxclk2, txclk4out) v cm 1.125 1.2 1.275 v input impedance (rxdin) r in each input to com- mon mode 42 50 58 lvds and lvpecl input imped- ance (txdin, txclk4in, ref- clk) r in line to line 90 110 130 cml output impedance (txd- out, txclkout) r out each output to com- mon mode 45 55 65 lvds output impedance (rxd- out, rxclk1, rxclk2, txclk4out) r out each output to com- mon mode 45 55 65 output current short to gnd (rxdout, rxclk1, rxclk2, txclk4out) i sc(?) ?1240ma input impedance (loslvl, slicelvl, phase- adj) r in 100 ? ? k output impedance (rxampmon) r out 468k output curren t short to v dd (rxdout, rxclk1, rxclk2, txclk4out) i sc(+) ?8 ?6 ? ma lvttl input voltage low v il2 v ddio = 1.8?3.3 v ?0.3 ? 0.35 v ddio v lvttl input voltage high v ih2 v ddio = 1.8?3.3 v 0.65 v ddio ?v ddio + 0.3 v lvttl input impedance r in 10 ? ? k lvttl output voltage low (i out =2ma) v ol2 v ddio = 1.8?3.3 v ??0.4v lvttl output voltage high (i out =2ma) v oh2 v ddio = 1.8?3.3 v v ddio ? 0.45 ? ? v table 2. dc characteristics (continued) (v dd = 1.8 v 5%, t a = ?20 to 85 c) parameter symbol test condition min typ max unit *note: voltage on rxdin+ or rxdin? should not exceed 1000 mv pp (single-ended)
si5110 8 rev. 1.4 table 3. ac characteristics (rxdin, rxdout, rxclk1, rxclk2) (v dd = 1.8 v 5%, t a = ?20 to 85 c) parameter symbol test condition min typ max unit input data rate (rxdin) 2.41 ? 2.7 gbps output clock frequency (rxclk1) f clkout ? 622 675 mhz output clock frequency (rxclk2) f clkout rxclk2div =1 rxclk2div =0 ? ? 622 155 675 169 mhz mhz duty cycle (rxclk1, rxclk2) tch/tcp, figure 2 45 ? 55 % output rise and fall times (rxclk1, rxclk2, rxdout) t r ,t f figure 3 100 175 250 ps data invalid prior to rxclk1 t cq1 figure 2 ? ? 200 ps data invalid after rxclk1 t cq2 figure 2 ? ? 200 ps input return loss (rxdin) s 11 1.25 ghz 2.5 ghz ? ? ?12 ?10 ? ? db db los threshold, slicemode = 0 1 v los loslvl = 0?350 mv 0 ? 250 mv los threshold error, slicemode = 0 1 ??30% los threshold, slicemode = 1 2 v los loslvl = 0?500 mv 0 ? 60 mv los threshold error, slicemode = 1 2 ??50% slice voltage, slicemode = 0 3 v level slicelvl = 350 mv ? ?50 ? mv slicelvl = 650 mv ? 40 ? mv slice voltage as percentage of differential input voltage swing (rxdin), slicemode = 1 4 v level slicelvl = 250 mv ? ?25 ? % slicelvl = 750 mv ? 18 ? % slice voltage as percentage of differential input voltage swing (rxdin) error, slicemode = 1 4 slicelvl = 200 mv ? ?25 ? % slicelvl = 800 mv ? 18 ? % sample phase offset 5 phaseadj = 200 mv ? ?25 ? ps phaseadj = 800 mv ? 25 ? ps rxampmon voltage range rxdin = 0?1000 mv ppd 0?550mv rxampmon voltage error ? 50 ? % notes: 1. see figure 4 on page 15. 2. see figure 5 on page 16. 3. see figure 6 on page 16. 4. see figure 7 on page 17. 5. see figure 8 on page 17.
si5110 rev. 1.4 9 table 4. ac characteristics (txclk4out, txclk4in, txclkout, txdin, txdout) (v dd = 1.8 v 5%, t a = ?20 to 85 c) parameter symbol test condition min typ max unit txclkout frequency f clkout figure 2 2.41 ? 2.7 ghz txclkout duty cycle tch/tcp, figure 2 40 50 60 % output rise time (txclkout, txdout) t r figure 3 ? 50 75 ps output fall time (txclkout, txdout) t f figure 3 ? 50 75 ps txclkout to txdout delay t cd figure 2 ?42 ? ?22 ps output return loss 100 khz?2.5 ghz 2.5 ghz?4.0 ghz ? ? ?12 ?10 ? ? db db txclk4out frequency f clkout ? 622 675 mhz txclk4out duty cycle tch/tcp, figure 2 40 ? 60 % txclk4out rise & fall times t r ,t f 100 175 250 ps txdin setup to txclk4in t dsin ??300ps txdin hold from txclk4in t dhin ??300ps txclk4in frequency f clkin ? 622 675 mhz txclk4in duty cycle tch/tcp, figure 2 40 ? 60 % txclk4in rise & fall times t r ,t f 100 ? 300 ps table 5. ac characteristics (receiver pll) (v dd = 1.8 v 5%, t a = ?20 to 85 c) parameter symbol test condition min typ max unit jitter tolerance (rxdin = 100 mv ppd , prbs31) *note: instrument limited j tol(pp) f = 10?600 hz 15* ? ? ui pp f = 0.6?6 khz 15* ? ? ui pp f = 6?100 khz 9* ? ? ui pp f = 100 khz?1 mhz 0.4 ui pp f = 1?20 mhz 0.3 ? ? ui pp acquisition time t aq ?? 2ms input reference clock frequency (refsel = 1) rc freq refrate = 1 ? 155 169 mhz refrate = 0 ? 78 84.4 mhz reference clock duty cycle rc duty 40 50 60 % reference clock frequency tolerance rc tol ?100 ? 100 ppm frequency difference at which receive pll goes out of lock (refclk compared to the divided down vco clock) lol 610 732 860 ppm frequency difference at which receive pll goes into lock (refclk compared to the divided down vco clock) lock ? 366 240 ppm note: bellcore specifications: gr-253-core, issue 3, september 2000.
si5110 10 rev. 1.4 table 6. ac characteristics (transmitter clock multiplier) 1 (v dd = 1.8 v 5%, t a = ?20 to 85 c) parameter symbol test condition min typ max unit jitter transfer bandwidth och48: 2.48832 gbps fec: 2.666676 gbps j bw bwsel[1:0] = 00 bwsel[1:0] = 01 bwsel[1:0] = 10 bwsel[1:0] = 11 ? ? ? ? ? ? ? ? 12 50 120 200 khz khz khz khz jitter transfer peaking ? 0.05 0.1 db acquisition time t aq valid refclk bwsel[1:0] = 11 ??20 ms input reference clock frequency rc freq refrate = 1 ? 155 169 mhz refrate = 0 ? 78 84.4 mhz input reference clock duty cycle rc duty 40 ? 60 % input reference clock frequency to l e r a n c e rc tol ?100 ? 100 ppm random rms jitter generation, txclkout (prbs 31) 2 j gen(rms) bwsel[1:0] = 00 bwsel[1:0] = 01 bwsel[1:0] = 10 bwsel[1:0] = 11 2.6 2.0 1.7 1.7 3.7 2.6 2.1 2.1 mui rms mui rms mui rms mui rms random peak-to-peak jitter generation, txclkout (prbs 31) 2 j gen(pp) bwsel[1:0] = 00 bwsel[1:0] = 01 bwsel[1:0] = 10 bwsel[1:0] = 11 25 23 22 21 36 32 28 27 mui pp mui pp mui pp mui pp notes: 1. bellcore specifications: gr-253 -core, issue 3, september 2000. 2. full duplex, refclk = 155 mhz.
si5110 rev. 1.4 11 table 7. absolute maximum ratings parameter symbol value unit dc supply voltage v dd ?0.5 to 2.2 v lvttl i/o supply voltage v ddio ?0.5 to 4.0 v differential input voltage (lvds input) v dif 5v differential input voltage (lvds output) v dif ?0.3 to (v dd + 0.3) v differential input voltage (lvttl input) v dif 2.4 v differential input voltage (lvttl output) v dif 5v maximum current any output pin 50 ma operating junction temperature t jct ?55 to 150 c storage temperature range t stg ?55 to 150 c esd hbm (2.5 ghz pins) 1 kv esd hbm tolerance (100 pf, 1.5 k )2kv note: permanent device damage can occur if the above absolute maximum ratings are exceeded. restrict functional operation to the conditions as specified in the operational se ctions of this data sheet. exposure to absolute maximum rating conditions for extended periods might affect device reliability. table 8. thermal characteristics parameter symbol test condition value unit thermal resistance junction to ambient ? ja still air 31 c/w
si5110 12 rev. 1.4 3. typical application schematic note* see 15. "power supply filtering" on page 20. si5110 refclk txclk4in lvpecl reference clock lvds data clock input loslvl slicelvl phaseadj txrext vdd gnd lvttl control inputs loss-of-signal level set data slice level set sampling phase level set reset rxdin high-speed serial input 0.1 f rxrext t xdin[3:0] lvds parallel data input 4 fiforst 3.091 k 1% 3.091 k 1% slicemode ltr txclkdsbl refsel refrate txsqlch rxsqlch lptm bwsel[1:0] llbk dlbk txmsbel rxmsbsel rxclk2div rxclk2dsbl rxclk1dsbl vref voltage reference output (1.25 v) txclk4out low-speed clock output txclkout 0.1 f high-speed clock output txdout 0.1 f high-speed serial data output rxclk1 rxclk2 lvds recovered low-speed clock rxdout[3:0] 4 lvds recovered parallel data los loss-of-signal indicator txlol rxlol loss-of-lock indicator fifoerr fifo over/underflow rxampmon rxdin amplitude monitor analog output vdd power supply filtering*
si5110 rev. 1.4 13 4. functional description the si5110 transceiver is a low-power, fully-integrated serializer/deserializer that pr ovides significant margin to all sonet/sdh jitter spec ifications. the device operates from 2.4?2.7 gbps making it suitable for oc- 48/stm-16 applications, and oc-48/stm-16 applications that use 255/23 8 or 255/237 forward error correction (fec) coding. the low-speed receive/transmit interface uses a low-power parallel lvds interface. 5. receiver the receiver within the si5110 includes a precision limiting amplifier, a jitte r-tolerant clock and data recovery unit (cdr), and 1:4 demultiplexer. programmable data slicing level and sampling phase adjustment are provided to support bit-error-rate (ber) optimization for long haul applications. 5.1. receiver differen tial input circuitry the receiver serial input provides proper termination and biasing through two resistor dividers internal to the device. the active circuitry has high-impedance inputs and provides sufficient gain for the clock and data recovery unit to recover the serial data. the input bias levels are optimized for jitter tolerance and input sensitivity and are typically not dc compatible with standard i/os; simply ac couple the data lines as shown in figure 10. 5.2. limiting amplifier the si5110 incorporates a limiting amplifier with sufficient gain to directly accept the output of transimpedance amplifiers. the limiting amplifier provides sufficient gain to fully saturate with input signals that are greater than 30 mv peak-to-peak differential. in addition, input signals up to 2 v peak-to-peak differential do not cause any performance degradation. 5.2.1. receiver signal amplitude monitoring the si5110 limiting amplifie r includes circuitry that monitors the amplitude of the receiver differential input signal (rxdin). the rxampmon output provides an analog output signal that is proportional to the input signal amplitude. the signal is enabled when slicemode is asserted . the voltage on the rxampmon output is nominally equal to one-half of the differential peak-to-peak signal amplitude of rxdin as shown in equation 1. equation 1 the receiver signal amplitud e monitoring circuit is also used in the generation of the loss-of-signal alarm (los ). 5.2.2. loss-of-signal alarm (los ) the si5110 can be configured to activate a loss-of- signal alarm output (los ) when the rxdin input amplitude drops below a programmable threshold level. an appropriate level of hysteresis prevents unnecessary switching on los . the los threshold level is set by applying a dc voltage to the loslvl input. the mapping of the voltage on the loslvl pin to the los threshold level depends on the state of the slicemode inpu t. (the slicemode input is used to select either absolute slice mode or proportional slice mode operation.) the loslvl mapping for absolute slice mode (slicemode = 0) is given in figure 4 on page 15. the linear region of the assert can be approximated by the following equation: equation 2 where v los is the differential pk-pk los threshold referred to the rxdin input, and v loslvl is the voltage applied to the loslvl pin. the linear region of the de- assert curve can be approximated by the following equation: equation 3 the loslvl mapping for proportional slice mode (slicemode = 1) is given in figure 5 on page 16. the linear region of the assert can be approximated by the following equation: equation 4 where v los is the differential pk-pk los threshold referred to the rxdin input, and v loslvl is the voltage applied to the loslvl pin. the linear region of the assert curve can be approximated be the following equation: equation 5 v rxampmon v rxdin pp () .566 () v los v loslvl 0.958 v los v loslvl 0.762 v los v loslvl 0.61 v los v loslvl 0.72
si5110 14 rev. 1.4 the los detection circuitry is disabled by tieing the loslvl input to vref. this forces the los output high. 5.2.3. slice level adjustment the limiting amplifier allows adjustment of the 0/1 decision threshold, or slice level, to allow optimization of bit-error-rates (ber) for demanding applications such as long-haul links. the si5110 provides two different modes of slice le vel adjustment: absolute slice mode and proportional slice mode. the mode is selected using the slicemode input. in either mode, the slice level is set by applying a dc voltage to the slicelvl input. the mapping of the voltage on the slicelvl pin to the 0/1 decision threshold voltage (or slice voltage) depends on the selected mode of operation. the slicelvl mapping fo r absolute slice mode (slicemode = 0) is given in figure 6 on page 16. the linear region of this curve can be approximated by the following equation: equation 6 where v level is the effective slice level referred to the rxdin input, v slicelvl is the voltage applied to the slicelvl pin, and vref is the reference voltage provided by the si5110 on the vref output pin (nominally 1.25 v). the slicelvl mapping for proportional slice mode (slicemode = 1) is given in figure 7 on page 17. the linear region of this curve can be approximated by the following equation: equation 7 where v level is the effective slice level referred to the rxdin input, v slicelvl is the voltage applied to the slicelvl pin, vref is the reference voltage provided by the si5110 on the vref output pin, and v rxdin(pp) is the peak-to-peak voltage level of the receive data signal applied to the rxdin input. the slice level adjustment function can be disabled by tieing the slicelvl input to vref. when slice level adjustment is disabled, the ef fective slice level is set to 0 mv relative to internally biased input common mode voltage for rxdin. 5.3. clock and da ta recovery (cdr) the si5110 uses an integrated cdr to recover clock and data from a non-return to zero (nrz) signal input on rxdin. the recovered clock is used to regenerate the incoming data by sampling the output of the limiting amplifier at the center of the nrz bit period. 5.3.1. sample phase adjustment in applications where data eye distortions are introduced by the transmission medium, it may be desirable to recover data by sampling at a point that is not at the center of the data eye. the si5110 provides a sample phase adjustment capability that allows adjustment of the cdr sampling phase across the nrz data period. when sample phase adjustment is enabled, the sampling instant used for data recovery can be moved over a range of approximately 22 ps relative to the center of the incoming nrz bit period. the sample phase is set by applying a dc voltage to the phaseadj input. the mapping of the voltage present on the phaseadj input to the sample phase sampling offset is given in figure 8. the linear region of this curve can be approximated by the following equation: equation 8 where phase offset is the sampling offset in picoseconds from the center of the data eye, v phaseadj is the voltage applied to the phaseadj pin, and vref is the reference voltage provided by the si5110 on the vref output pin (nominally 1.25 v). a positive phase offset adjusts the sampling point to lead the default sampling point (the center of the data eye) and a negative phase offset adjusts the sampling point to lag the default sampling point. data recovery using a sampling phase offset is disabled by tieing the phaseadj inpu t to vref. this forces a phase offset of 0 ps to be used for data recovery. 5.3.2. receiver lock detect the si5110 provides lock-detect circuitry that indicates whether the pll has achieved frequency lock with the incoming data. this circuit compares the frequency of a divided down version of the recovered clock with the frequency of the supplied reference clock. the si5110 will use either refclk or txclk4in as the reference clock input signal, depending on the state of the refsel input. if the (divided) recovered clock frequency deviates from that of the reference clock by more than the amount specified in table 5 on page 9, the cdr is declared out of lock, and the loss-of-lock (rxlol ) pin is asserted. in this state, the cdr attempts to reacquire lock with the incoming data stream. during v level v slicelvl vref 0.4 () ? () 0.375 () 0.005 ? v level v slicelvl vref 0.4 () ? () v rxdin pp () 0.95 () [ ] 0.03 v rxdin pp () [] ? = phase offset 85 ps/v v phaseadj 0.4 vref () ? ()
si5110 rev. 1.4 15 reacquisition, the recovered clock frequency (rxclk1 and rxclk2) drifts over a range of approximately 1000 ppm relative to the supplied reference clock unless ltr is asserted. the rxlol output remains asserted until the frequency of the (divided) recovered clock differs from the reference clock frequency by less than the amount specified in table 5 on page 9. the rxlol output will be assert ed automatically if a valid reference clock is not detected. the rxlol output will also be asserted whenever the loss of signal alarm (los ) is active, provided that the ltr input is set high (i.e., provided that the device is not configured for lock-to-reference mode). 5.3.3. lock-to-reference the lock-to-reference (ltr ) input can be utilized to ensure the presence of a stable output clock during a loss-of-signal alarm (los ). when ltr is asserted, the cdr is prevented from phase locking to the data signal and the cdr locks the rxclkout1 and rxclkout2 outputs to the reference cloc k. in typical applications, the los output is tied to the ltr input to force a stable output clock during a loss-of-signal condition. 5.4. deserialization the si5110 uses a 1:4 demultiplexer to deserialize the high-speed input. the deserialized data is output on a 4-bit parallel data bus, rx dout[3:0], aligned with the rising edge of rxclk1. 5.4.1. serial input to pa rallel output relationship the si5110 provides the capa bility to select the order in which the received serial data is mapped to the parallel output bus rxdout[3:0]. the mapping of the receive bits to the output data word is controlled by the rxmsbsel input. when rxm sbsel is set low, the first bit received is output on rxdout0, and the following bits are output in order on rxdout1 through rxdout3. when rxmsbsel is set high, the first bit received is output on rxdout3, and the following bits are output in order on rxdout2 through rxdout0. 5.5. voltage reference output the si5110 provides an output voltage reference that can be used by external circuitry to set the los threshold, slicing level, or sampling phase adjustment input voltage levels. one po ssible implementation uses a resistor divider to set the control voltage for the loslvl, slicelvl, or phaseadj inputs. an alternative is the use of digital-to-analog converters (dacs) to set the control voltages. using this approach, vref is used to set the range of the dac outputs. the voltage on the vref output is nominally 1.25 v. figure 4. typical loslvl transfer curve, absolute slice mode (slicemode = 0) 0 50 100 150 200 250 300 350 0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4 loslv (v) v los (mv) assert deassert v l o s = . 9 5 8 l o s l v l v l o s = . 7 6 2 l o s l v l
si5110 16 rev. 1.4 figure 5. typical loslvl transfer curve, proportional slice mode (slicemode = 1) figure 6. typical slicelvl transfer curve, absolute slice mode (slicemode = 0) loslvl transfer curve (proportional slice mode) 0 50 100 150 200 250 300 350 0 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4 0.45 0.5 loslvl (v) v los (mv) los assert threshold los de-assert threshold v l o s = . 7 2 lo s l v l v l o s = . 6 1 lo s l v l slicelvl transfer curve (absolute slice mode) -60 -40 -20 0 20 40 60 0.35 0.4 0.45 0.5 0.55 0.6 0.65 slicelvl (v) slice adjustment (mv)
si5110 rev. 1.4 17 figure 7. typical slicelvl transfer curve, proportional slice mode (slicemode = 1) figure 8. typical phaseadj transfer curve slicelvl transfer curve (proportional slice mode) -30 -20 -10 0 10 20 30 0.25 0.3 0.35 0.4 0.45 0.5 0.55 0.6 0.65 0.7 0.75 slicelvl (v) slice adjustment (% of rxdin) phaseadj transfer curve -40 -30 -20 -10 0 10 20 30 40 0.2 0.3 0.4 0.5 0.6 0.7 0.8 phaseadj (volts) phase adjustment (ps)
si5110 18 rev. 1.4 5.6. auxiliary clock output to support the widest range of system timing configurations, the si5110 provides a primary clock output on rxclk1 and a secondary clock output (rxclk2). the rxclk2 output can be configured to provide a clock that is 1/4th or 1/16th the frequency of the high-speed recovered clock. the divide ratio which determines the rxclk2 output frequency is selected by rxclk2div. 5.7. receive data squelch during some system error conditions, such as los , it may be desirable to force the receive data output to zero in order to avoid propagation of erroneous data into the downstream electronics. the si5110 provides a data squelching control input, rxsqlch , for this purpose. when the rxsqlch input is low, the data outputs rxdout[3:0] are forced to a zero state. the rxsqlch input is ignored when the device is operating in diagnostic loopback mode (dlbk = 0). 6. transmitter the transmitter consists of a low jitter clock multiplier unit (cmu) with a 4:1 serializer. the cmu uses a phase-locked loop (pll) arch itecture based on silicon laboratories? proprietary dspll technology. this technology generates ultra-low jitter clock and data outputs that provide significant margin to the sonet/sdh specifications . the dspll architecture also utilizes a digitally implemented loop filter that eliminates the need for external loop filter components. as a result, sensitive noise coupling nodes that typically degrade jitter performance in crowded pcb environments are removed. the dspll also reduces the complexity and relaxes the performance requirements for reference clock distribution circuitry for oc-48/stm-16 optical port cards. the dspll provides selectable wideband and narrowband loop filter settings that allow the jitter attenuation characteristics of the cmu to be optimized for the jitter content of the supplied reference clock. this allows the cmu to operate with reference clocks that have relatively high jitter content. unlike traditional analog pll implementations, the loop filter bandwidth of the si5110 transmitter cmu is controlled by a digital filter inside the dspll circuit allowing the bandwidth to be changed without changing any external component values. 6.1. dspll ? clock multiplier unit the si5110?s clock multiplie r unit (cmu) uses silicon laboratories proprietary dspll technology to achieve optimal jitter performance. the dspll implementation utilizes a digital signal pr ocessing (dsp) algorithm to replace the loop filter commonly found in analog pll designs. this algorithm processes the phase detector error term and generates a digital control value to adjust the frequency of th e voltage-controlle d oscillator (vco). the dspll implementation requires no external loop filter components. eliminat ing sensitive noise entry points makes the dspll implementation less susceptible to board-level noise sources and makes sonet/sdh jitter compliance easier to attain in the application. the transmit cmu multiplies the frequency of the selected reference clock up to the serial transmit data rate. the txlol output signal provides an indication of the transmit cmu lock status. when the cmu has achieved lock with the selected reference, the txlol output is deasserted (driven high). the txlol signal will be asserted, indicating a transmit cmu loss-of-lock condition, when a valid clock signal is not detected on the selected reference clock input. the txlol signal will also be asserted during the transmit cmu frequency calibration. calibration is performed automatically when the si5110 is powered on, when a valid clock signal is detected on the selected reference clock input following a period when no valid clock was present, or when the frequency of the selected reference clock is outside of the transmit cmu?s pll lock range or after reset is deasserted. 6.1.1. programmable loop filter bandwidth the digitally implemented loop filter allows for four transmit cmu loop bandwidth settings that provide wideband or narrowband jitter transfer characteristics. the filter bandwidth is selected via the bwsel[1:0] control inputs. the loop bandwidth choices are listed in table 6. unlike traditional pll implementations, changing the loop filter bandwidth of the si5110 is accomplished without the need to change external component values. lower loop bandwidth settings (narrowband operation) make the si5110 more tolerant to jitter on the reference clock source. as a result, circuitry used to generate and distribute the physical layer reference clocks can be simplified without compro mising margin to the sonet/sdh jitter specifications. higher loop bandwidth settings (wideband operation) are useful in applications where the reference clock is provided by a low jitter source like the si5364 clock synchronization ic or si5320 precision clock
si5110 rev. 1.4 19 multiplier/jitter attenuator ic. wideband operation allows the dspll to more closely track the precision reference source, resulting in the best possible jitter performance. 6.2. serialization the si5110 serialization circuitry is comprised of a fifo and a parallel to serial shift register. low-speed data on the parallel 4-bit input bus, txdin[3:0], is latched into the fifo on the rising edge of txclk4in. data is clocked out of the fifo and into the shift register by txclk4out. the high-speed serial data stream txdout is clocked out of the shift register by txclkout. the txclk4out clock is provided as an output signal to support data word transfers between the si5110 and upstream devices using a counter clocking scheme. 6.2.1. input fifo the si5110 fifo decouples the timing of the data transferred into the device via txclk4in from the data transferred into the shift register via txclk4out. the fifo is eight parallel words deep and accommodates any static phase delay that may be introduced between txclk4out and txclk4in in counter clocking schemes. furthermore, the fifo accommodates a bounded phase drift, or wander, between txclk4in and txclk4out of up to three parallel data words. the fifo circuitry indicates an overflow or underflow condition by asse rting the fifoerr signal. this output can be used to re-center the fifo read/write pointers by tieing it directly to the fiforst input. the fiforst signal causes re-centering of the fifo read/write pointers. the si5110 also automatically re- centers the read/write pointers after the device is powered on, after an exte rnal reset via the reset input, and each time the dspll transitions from an out- of-lock state to a locked state (when txlol transitions from low to high). 6.2.2. parallel input to serial output relationship the si5110 provides the capa bility to select the order in which the data received on the parallel input bus txdin[3:0] is transmitted serially on the high-speed serial data output txdout. data on the parallel bus will be transmitted msb first or lsb first depending on the setting of the txmsbsel input. when txmsbsel is set low, txdin0 is transmitted first, followed in order by txdin1 through txdin3. when txmsbsel is set high, txdin3 is transmitted first, followed in order by txdin2 through txdin0. this feature can simplify printed circuit board (pcb) routing in applications where ics are mounted on both sides of the pcb. 6.2.3. transmit data squelch to prevent the transmission of corrupted data into the network, the si5110 provides a control pin that can be used to force the high-speed serial data output txdout to zero. when the txsqlch input is set low, the txdout signal is forced to a zero state. the txsqlch input is ignored when the device is operating in line loopback mode (llbk = 0). 6.2.4. clock disable the si5110 provides a clock disable pin, txclkdsbl, that can be used to disable the high-speed serial data clock output, txclkout. when the txclkdsbl pin is asserted, the positive and negative terminals of clkout are tied internally to 1.5 v through 50 on- chip resistors. this feature can be used to reduce power consumption in applications that do not use the high-speed transmit data clock. 7. loop timed operation the si5110 can be configured to provide sonet/sdh compliant loop timed operation. when the lptm input is set low, the transmit clock and data timing is derived from the cdr recovered clock output. this is achieved by dividing down the recovered clock and using it as a reference source fo r the transmit cmu. this results in transmit clock and data signals that are locked to the timing recovered from the received data path. a narrow- band loop filter setting is recommended for this mode of operation. 8. diagnostic loopback the si5110 provides a diagnostic loopback mode that establishes a loopback path from the serializer output to the deserializer input. this provides a mechanism for looping back data input via the low speed transmit interface txdin[3:0] to the low speed receive data interface rxdout[3:0]. this mode is enabled when the dlbk input is set low. note: setting both dlbk and llbk low simultaneously is not supported. 9. line loopback the si5110 provides a line loopback mode that establishes a loopback path from the high-speed receive input to the high-speed transmit output. this provides a mechanism for looping back the high-speed data and clock recovered from rxdin to the transmit data output txdout and transmit clock txclkout. this mode is enabled when the llbk input is set low. note: setting both dlbk and llbk low simultaneously is not supported.
si5110 20 rev. 1.4 10. bias generation circuitry the si5110 uses two extern al resistors, rxrext and txrext, to set internal bias currents for the receive and transmit sections of the device, respectively. the external resistors allow precise generation of bias currents, which can significantly reduce power consumption. the bias generation circuitry requires two 3.09 k (1%) resistors each connected between rxrext and gnd, and between txrext and gnd. 11. reference clock the si5110 supports operation with one of two possible reference clock sources. in the first configuration, an external reference clock is connected to the refclk input. the second configuration uses the parallel data clock, txclk4in, as the re ference clock source. the refsel input is used to select whether the refclk or the txclk4in input will be us ed as the re ference clock. when refclk is selected as the reference clock source (refsel = 1), two possible reference clock frequencies are supported. the reference clock frequency provided on the refclk input can be either 1/16th or 1/32nd the desired transceiver data rate. the refclk frequency is selected using the refrate input. the txclk4in clock frequency is equal to 1/4th the transceiver data rate. when txclk4in is selected as the reference clock source (refsel = 0), the refrate input has no effect. the cmu in the si5110?s tran smit section multiplies the provided reference up to the serial transmit data rate. when the cmu has achieved lock with the selected reference, the txlol output is deasserted (driven high). the cdr in the receive section of the si5110 uses the selected reference clock to center the receiver pll frequency in order to speed lock acquisition. when the receive cdr locks to the data input, the rxlol signal is deasserted (driven high). 12. reset the si5110 is reset by holding the reset pin low for at least 1 s. when reset is asserted, the input fifo pointers are reset and the digital control circuitry is initialized. when reset transitions high to start normal operation, the transmit cmu calibration is performed. 13. transmit differential output circuit the si5110 utilizes a cu rrent-mode logic (cml) architecture to drive the high -speed serial output clock and data on txclkout and txdout. an example of output termination with ac coupling is shown in figure 9. in applications where direct dc coupling is possible, the 0.1 f capacitors may be omitted. the differential peak- to-peak voltage swing of the cml architecture is listed in table 2 on page 6. 14. internal pullups and pulldowns on-chip 30 k resistors are used to individually set the lvttl inputs if these inputs are left disconnected. the specific default state of each input is enumerated in 17. "pin descriptions: si5110" on page 25. 15. power supply filtering the transmitter generated jitter is most sensitive to power supply noise below its pll loop-bandwidth (bwsel setting). the power supply noise of interest is bounded between the sonet/sdh generated jitter specification of 12 khz (for 2.48832 gbps) and the pll loop-bandwidth. integrated supply noise from 1/10th the sonet/sdh specification (1 .2 khz) to 10x the loop- bandwidth should be suppressed to a level appropriate for each design. below the pll loop-bandwidth, the typical generated jitter due to supply noise is approximately 2.5 muipp per 1 mvrms; this parameter can be used as a guideline for calculating the output jitter and supply filtering requirements. the receiver does not place additional power supply constraints beyond those listed for the transmitter. please contact silicon lab oratories? applications engineering for recommendations on bypass capacitors and their placement.
si5110 rev. 1.4 21 figure 9. cml output driver termination (txclkout, txdout) figure 10. receiver differential input circuitry 1.5 v 50 50 24 ma zo = 50 zo = 50 50 50 vdd vdd 0.1 f 0.1 f 150 1.5 v 0.1 f 0.1 f + ? 150 75 75 rxdin+ rxdin?
si5110 22 rev. 1.4 figure 11. lvds differential input circuitry figure 12. lvds driver termination (rxdout, txclk4out) esd esd 5 k 5 k 100 in + in _ common mode adjust circuit esd _ + 6.5 ma out + in _ 50 50 1.2 v in + in _ in + esd out _ 6.5 ma
si5110 rev. 1.4 23 16. si5110 pinout: 99 bga figure 13. si5110 pin configuration (bottom view) k a b c d e f g h j 1 10 9 7 8 65432 gnd txrext txlol txclk4out? txclk4out+ txclk4in? txclk4in+ txdin[1]? txdin[0]? txdout? gnd rsvd_gnd rsvd_gnd fifoerr txsqlch refsel txclkdsbl txdin[1]+ txdin[0]+ txdout+ gnd bwsel1 txmsbsel fiforst bwsel0 dlbk llbk txdin[3]? txdin[2]? gnd vddio rsvd_gnd vdd vdd vdd vdd lptm txdin[3]+ txdin[2]+ txclkout? gnd refrate vdd vdd vdd gnd gnd gnd refclk? txclkout+ gnd reset vdd vdd vdd gnd gnd gnd refclk+ gnd los rxclk1dsbl vdd vdd vdd vdd rxmsbsel rxdout[3]? rxdout[2]? rxdin? gnd rxlol ltr rsvd_gnd slicemode rxclk2dsbl rxclk2div rxdout[3]+ rxdout[2]+ rxdin+ gnd loslvl vref rxampmon rsvd_gnd rxclk1? rxclk1+ rxdout[1]? rxdout[0]? phaseadj slicelvl rxrext rxsqlch rsvd_gnd rxclk2? rxclk2+ rxdout[1]+ rxdout[0]+ rsvd_gnd
si5110 24 rev. 1.4 figure 14. si5110 pin configuration (transparent top view) k a b c d e f g h j 1 10 9 78 6 5 4 3 2 gnd txrext txlol txclk4out? txclk4out+ txclk4in? txclk4in+ txdin[1]? txdin[0]? txdout? gnd rsvd_gnd rsvd_gnd fifoerr txsqlch refsel txclkdsbl txdin[1]+ txdin[0]+ txdout+ gnd bwsel1 txmsbsel fiforst bwsel0 dlbk llbk txdin[3]? txdin[2]? gnd vddio rsvd_gnd vdd vdd vdd vdd lptm txdin[3]+ txdin[2]+ txclkout? gnd refrate vdd vdd vdd gnd gnd gnd refclk? txclkout+ gnd reset vdd vdd vdd gnd gnd gnd refclk+ gnd los rxclk1dsbl vdd vdd vdd vdd rxmsbsel rxdout[3]? rxdout[2]? rxdin? gnd rxlol ltr rsvd_gnd slicemode rxclk2dsbl rxclk2div rxdout[3]+ rxdout[2]+ rxdin+ gnd loslvl vref rxampmon rsvd_gnd rxclk1? rxclk1+ rxdout[1]? rxdout[0]? phaseadj slicelvl rxrext rxsqlch rsvd_gnd rxclk2? rxclk2+ rxdout[1]+ rxdout[0]+ rsvd_gnd
si5110 rev. 1.4 25 17. pin descriptions: si5110 pin number(s) name i/o signal level description h3 h6 bwsel1 bwsel0 i lvttl transmit dspll bandwidth select. the inputs select loop bandwidth of the transmit clock multiplier dspll as listed in table 6. note: both inputs have an internal pulldown. h7 dlbk i lvttl diagnostic loopback. when this input is low, the transmit clock and data are looped back for output on rxdout, rxclk1 and rxclk2. this pin should be held high for normal operation. note: this input has an internal pullup. j5 fifoerr o lvttl fifo error. this output is asserted (dri ven low) when a fifo over- flow/underflow has occurred. this output is low until reset by asserting fiforst. h5 fiforst i lvttl fifo reset. when this input is low, the read/write fifo pointers are reset to thei r initial state. note: this input has an internal pullup. b2, c2, d1, e2, e7?9, f2, f7?9, g1, h2, j2, k1 gnd gnd supply ground. connect to system gnd. ensure a very low impedance path for optimal performance. h8 llbk i lvttl line loopback. when this input is low, the recovered clock and data are looped back for output on txdout, and txclk- out. set this pin high for normal operation. note: this input has an internal pullup. d2 los o lvttl loss-of-signal. this output is asserted (dri ven low) when the peak-to- peak signal amplitude on rxdin is below the thresh- old set via loslvl. b3 loslvl i los threshold level. applying an analog voltage to this pin allows adjust- ment of the threshold used to declare los . tieing this input to vref disables los detection and forces the los output high.
si5110 26 rev. 1.4 g8 lptm i lvttl loop timed operation. when this input is set low, the recovered clock from the receiver is divided down and used as the refer- ence source for the transmit cmu. the narrowband setting for the dspll cmu is sufficient to provide sonet compliant jitter generation and jitter transfer on the transmit data and clock outputs (txd- out,txclkout). set this pin high for normal opera- tion. note: this input has an internal pullup. c4 ltr i lvttl lock-to-reference. when the ltr input is set low, the receiver pll will lock to the selected reference clock. this function can be used to force a stable output clock on the rxclk1 and rxclk2 outputs when no valid input data signal is applied to rxdin. when the ltr input is set high, the receiver pll will lock to the rxdin signal (normal operation). note: this input has an internal pullup. a2 phaseadj i sampling phase adjust. applying an analog voltage to this pin allows adjust- ment of the sampling phase across the data eye. tieing this input to vref nominally centers the sam- pling phase. e10 f10 refclk+, refclk? i lvpecl differential reference clock. this input is used as the si5110 reference clock when the refsel input is set high (refsel = 1). the ref- erence clock sets the operating frequency of the si5110 transmit cmu, which is used to generate the high-speed transmit clock txclkout. the reference clock is also used by the si5110 receiver cdr to cen- ter the pll during lock acquisition, and as a reference for determination of the receiver lock status. the refclk frequency is either 1/16th or 1/32nd of the serial data rate (nominally 155 or 78 mhz, respectively). the refclk frequency is selected using the refrate input. when refsel = 1, a valid reference clock must be present. pin number(s) name i/o signal level description
si5110 rev. 1.4 27 f3 refrate i lvttl reference clock rate select. the refrate input sets the frequency for the refclk input. when refrate is set high, the refclk frequency is 1/16th the serial data rate (nominally 155 mhz). when refrate is set low, the refclk frequency is 1/32nd the serial data rate (nominally 78 mhz). the refrate input has no effect when the refsel input is set low. note: this input has an internal pullup. j7 refsel i lvttl reference clock selection. this input selects the reference clock source to be used by the si5110 transmitter and receiver. the ref- erence clock sets the operating frequency of the si5110 transmit cmu, which is used to generate the high-speed transmit clock txclkout. the reference clock is also used by the si5110 receiver cdr to cen- ter the pll during lock acquisition, and as a reference for determination of the receiver lock status. when refsel = 0, the low-speed data input clock, txclk4in, is used as the reference clock. when refsel = 1, the reference clock provided on refclk is used. note: this input has an internal pullup. e3 reset i lvttl device reset. forcing this input low for at least 1 s causes a device reset. for normal operation, this pin should be held high. note: this input has an internal pullup. a6, b6, c5, g3, j3?4, k2 rsvd_gnd reserved tie to ground. must be connected directly to gnd for proper operation. b5 rxampmon o analog receiver amplitude monitor. the rxampmon output provides an analog output signal that is proportional to the input signal amplitude. see equation 1 for the relationship between rxampon and rxdin. this signal is active when slicemode is asserted. b8 b7 rxclk1+, rxclk1? olvds differential receiver clock output 1. the clock recovered from the signal present on rxdin is divided down to the parallel output word rate and output on rxclk1. in the absence of data, a sta- ble clock on rxclk1 can be maintained by asserting ltr . pin number(s) name i/o signal level description
si5110 28 rev. 1.4 a8 a7 rxclk2+, rxclk2? olvds differential receiver clock output 2. an auxiliary output clock is prov ided on this pin that is equivalent to, or a submultiple of, the output word rate. the divide factor used in generating rxclk2 is set via rxclk2div. c8 rxclk2div i lvttl rxclk2 clock di vider select. this input selects the divide factor used to generate the rxclk2 output. when this input is driven high, rxclk2 is equal to the output word rate on rxdout. when driven low, rxclk2 is 1/4th the output word rate. note: this input has an internal pullup. d3 rxclk1dsbl i lvttl rxclk1 disable. setting this input low disables the rxclk1 output. this is used to save power in applications that do not require the primary output clock. note: this input has an internal pullup. c7 rxclk2dsbl i lvttl rxclk2 disable. setting this input low disables the rxclk2 output. this saves power in applications that do not require an auxiliary clock. note: this input has an internal pullup. b1, c1 rxdin+, rxdin? i high-speed differential differential receive data input. the receive clock and data signals rxclk1, rxclk2, and rxdout[3:0] are recovered from the high-speed data signal present on these pins. c9 d9 c10 d10 a9 b9 a10 b10 rxdout3+ rxdout3? rxdout2+ rxdout2? rxdout1+ rxdout1? rxdout0+ rxdout0? olvds differential parallel receive data output. the data recovered from the signal present on rxdin is demultiplexed and output as a 4-bit parallel word via rxdout[3:0]. the bit order for demultiplexing is selected by the rxmsbsel input. the rxdout[3:0] outputs are aligned to the rising edge of rxclk1. c3 rxlol o lvttl receiver loss-of-lock. this output is asserted (driven low) when the recov- ered clock frequency deviates from the reference clock by the amount specified in table 5 on page 9. pin number(s) name i/o signal level description
si5110 rev. 1.4 29 d8 rxmsbsel i lvttl receive data bus bit order select. this input determines the order of the received data bits on the rxdout[3:0] output bus. for rxmsbsel = 0, the first data bit received is out- put on rxdout0 and following data bits are output on rdout1 through rxdout3. for rxmsbsel = 1, the first data bit is output on rxdout3 and following data bits are output on rxdout2 through rxdout0. note: this input has an internal pulldown. a4 rxrext receiver external bias resistor. this resistor is used by the receiver circuitry to estab- lish bias currents within the device. this pin must be connected to gnd through a 3.09 k ( 1 %) resistor. a5 rxsqlch i lvttl receiver data squelch. when this input is low, th e data on rxdout[3:0] is forced to a zero state. set rxsqlch high for normal operation. the rxsqlch input is ignored when operating in diagnostic loopback mode (dlbk = 0). note: this input has an internal pullup. a3 slicelvl i slicing level adjustment. applying an analog voltage to this pin allows adjust- ment of the slicing level applied to the input data eye. tying this input to vref sets the slicing offset to 0. c6 slicemode i lvttl slice level adjustment mode. the slicemode input is used to select the mode of operation for slicing leve l adjustment. when slice- mode = 0, absolute slic e mode is selected. when slicemode = 1, proportiona l slice mode is selected. note: this input has an internal pulldown. k8 k7 txclk4in+, txclk4in? ilvds differential transmit data clock input. the rising edge of this input clocks data present on txdin into the device. txclk 4in is also used as the si5100 reference clock when the refsel input is set low. k6 k5 txclk4out+, txclk4out? olvds divided down transmit clock output. this clock output is generated by dividing down the high-speed output clock, txcl kout, by a factor of 4. it is intended for use in counter clocking schemes that transfer data between the system framer and the si5110. (see refsel and refrate descriptions.) pin number(s) name i/o signal level description
si5110 30 rev. 1.4 j8 txclkdsbl i lvttl high-speed transmit clock disable. when this input is high, the output driver for txclk- out is disabled. in applications that do not require the output data clock, the output clock driver should be disabled to save power. note: this input has an internal pulldown. e1 f1 txclkout+, txclkout? high-speed transmit clock output. the high-speed clock output, txclkout, is gener- ated by the pll in the transm it clock multiplier unit. its frequency is nominally 16 times or 32 times the selected reference source. g9 h9 g10 h10 j9 k9 j10 k10 txdin3+, txdin3? txdin2+, txdin2? txdin1+, txdin1? txdin0+, txdin0? ilvds differential parallel transmit data input. the 4-bit data word present on these pins is multi- plexed into a high-speed serial stream and output on txdout. the bit order for tr ansmit multiplexing is selected by the txmsbsel input. the data on txdin[3:0] is clocked into the device by the rising edge of txclk4in. h1 j1 txdout+, txdout? ocml differential high-speed transmit data output. the 4-bit word input on txdi n[3:0] is mult iplexed into a high-speed serial stream that is output on the txd- out pins. the bit order for transmit multiplexing is selected by the txmsbsel input. the txdout out- puts are updated by the rising edge of txclkout. k4 txlol o lvttl transmit cmu loss-of-lock. the txlol output is asserted (low) when the cmu is not phase locked to the selected reference source or if refclk is not present. h4 txmsbsel i lvttl transmit data bus bit order select. this input determines the order in which data bits recovered on the txdin[3:0] bus are transmitted on the high-speed serial output txdout. for txmsbsel = 0, data on txdin0 is transmitted first followed by txdin1 through txdin3. for txmsbsel = 1, txdin3 is transmitted first fol- lowed by txdin2 through txdin0. note: this input has an internal pulldown. k3 txrext transmitter external bias resistor. this resistor is used by t he transmitter circuitry to establish bias currents within the device. this pin must be connected to gnd through a 3.09 k ( 1 %) resistor. pin number(s) name i/o signal level description
si5110 rev. 1.4 31 j6 txsqlch i lvttl transmit data squelch. when txsqlch is set low, the output data stream on txdout is forced to a zero state. set txsqlch high for normal operation. the txsqlch input is ignored when operating in line loopback mode (llbk = 0). note: this input has an internal pullup. d4?7, e4?6, f4?6, g4?7 vdd vdd 1.8 v supply voltage. nominally 1.8 v. g2 vddio vddio 1.8 v or 3.3 v lvttl i/o supply voltage. connect to either 1.8 or 3.3 v. when connected to 3.3 v, lvttl compatible voltage swings are sup- ported on the lvttl inputs and lvttl outputs of the device. b4 vref o voltage ref voltage reference. the si5110 provides an out put voltage reference that can be used by an external circuit to set the los threshold, slicing level, or sampling phase adjustment. the equivalent resistance between this pin and gnd should not be less than 10 k . the reference voltage is nominally 1.25 v. pin number(s) name i/o signal level description
si5110 32 rev. 1.4 18. ordering guide part number package temperature range si5110-g-bc 99-ball cbga (prior revision) rohs-5 ?20 to 85 c SI5110-H-BL 99-ball pbga (current revision) rohs-5 ?20 to 85 c si5110-h-gl 99-ball pbga (current revision) rohs-6 ?20 to 85 c
si5110 rev. 1.4 33 19. package outline figure 15 illustrates the package details for the si5110. table 9 lists the values for the dimensions shown in the illustration. figure 15. 99-ball plastic ball grid array (pbga) table 9. package diagram dimensions (mm) symbol min nom max symbol min nom max a 1.22 1.39 1.56 e1 9.00 bsc a1 0.40 0.50 0.60 e 1.00 bsc a2 0.32 0.36 0.40 s 0.50 bsc a3 0.46 0.53 0.60 aaa 0.10 b 0.50 0.60 0.70 bbb 0.10 d 11.00 bsc ccc 0.12 e 11.00 bsc ddd 0.15 d1 9.00 bsc eee 0.08 notes: 1. all dimensions shown are in millim eters (mm) unless otherwise noted. 2. dimensioning and tolerancing per ansi y14.5m-1994. 3. this drawing conforms to jedec outline mo-192, variation aac-1. 4. recommended card reflow profile is per the jedec/ipc j-std-020c specification for small body components.
si5110 34 rev. 1.4 20. 11x11 mm 99l pbga recommended pcb layout notes: general 1. all dimensions shown are in milli meters (mm) unless otherwise noted. 2. dimensioning and tolerancing is per th e ansi y14.5m-1994 specification. 3. this land pattern design is based on the ipc-7351 guidelines. solder mask design 1. all metal pads are to be non-solder mask defined (nsmd). clearance between the solder mask and the metal pad is to be 60 m minimum, all the way around the pad. stencil design 1. a stainless steel, laser-cut and electro-polished stencil wit h trapezoidal walls should be used to assure good solder paste release. 2. the stencil thickness should be 0.125 mm (5 mils). 3. the ratio of stencil aperture to land pad size should be 1:1. card assembly 1. a no-clean, type-3 solder paste is recommended. 2. the recommended card reflow profile is per the jedec/ipc j-std-020c spec ification for small body components. symbol min nom max x 0.40 0.45 0.50 c1 9.00 c2 9.00 e1 1.00 e2 1.00
si5110 rev. 1.4 35 d ocument c hange l ist revision 0.53 to revision 1.0 ? update si5110 1. "detailed block diagram" on page 4 to clarify control rxampmon and cmu timing sources. ? figure 1 on page 5; clarified the measurement of vicm, and vocm ? updated table 2 on page 6. ? updated table 3 on page 8. ? updated table 4 on page 9. ? updated table 5 on page 9. ? updated table 6 on page 10. ? updated table 7 on page 11. ? update 3. "typical application schematic" on page 12 to show connection between fiforstb and fifoerrb. ? updated rxampmon description and equation in 5.2.1. "receiver signal amplitude monitoring" on page 13. ? updated loslvl equations, and related figures (figure 4 and figure 5 on page 16). ? clarified 5.3. "clock and data recovery (cdr)" on page 14. ? added figure 9, ?cml output driver termination (txclkout, txdout),? on page 21 and figure 10, ?receiver differential input circuitry,? on page 21. ? updated rxampmon, rxdin, refclk, and txclk4in pin descriptions in 17. "pin descriptions: si5110" on page 25. ? updated 19. "package outline" on page 33. revision 1.0 to revision 1.1 ? updated table 2, ?dc characteristics,? on page 6. ? updated table 9, ?package diagram dimensions (mm),? on page 33. revision 1.1 to revision 1.2 ? updated lvds in put impedance in table 2, ?dc characteristics,? on page 6. ? added test condition for acquisition time in table 6, ?ac characteristics (transmitter clock multiplier)1,? on page 10. ? updated 19. "package outline" on page 33. revision 1.2 to revision 1.3 ? updated chip graphic on page 1. ? corrected "18. ordering guide" on page 32. revision 1.3 to revision 1.4 ? updated "18. ordering guide" on page 32. ? updated "19. package outline" on page 33. ? updated "20. 11x11 mm 99l pbga recommended pcb layout" on page 34.
si5110 36 rev. 1.4 c ontact i nformation silicon laboratories inc. 400 west cesar chavez austin, tx 78701 tel: 1+(512) 416-8500 fax: 1+(512) 416-9669 toll free: 1+(877) 444-3032 email: highspeed@silabs.com internet: www.silabs.com silicon laboratories, silicon labs, siphy, and d spll are trademarks of silicon laboratories inc. other products or brandnames mentioned herein are trademarks or registered trademarks of their respective holders. the information in this document is believed to be accurate in all respects at the time of publication but is subject to change without notice. silicon laboratories assumes no responsibility for errors and omissions, and disclaims responsib ility for any consequences resu lting from the use of information included herein. a dditionally, silicon laboratorie s assumes no responsibility for the functioning of und escribed features or parameters. silicon laboratories reserves the right to make changes without further notice . silicon laboratories makes no wa rranty, rep- resentation or guarantee regarding the suitability of its products for any particular purpose, nor does silicon laboratories as sume any liability arising out of the application or use of any product or circuit, and s pecifically disclaims any an d all liability, including wi thout limitation conse- quential or incidental damages. silicon laborat ories products are not designed, intended, or authorized for use in applications intended to support or sustain life, or for any other application in which the failure of the silicon laboratories product could create a s ituation where per- sonal injury or death may occur. should buyer purchase or us e silicon laboratories products for any such unintended or unauthor ized ap- plication, buyer shall indemnify and hold silicon laboratories harmless against all claims and damages.

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