Part Number Hot Search : 
5DU121 12100 S3P44D10 MJ10022 XOA91 2SK44 AK5554VN 25V4035
Product Description
Full Text Search
 

To Download AN79L07M Datasheet File

  If you can't view the Datasheet, Please click here to try to view without PDF Reader .  
 
 


  Datasheet File OCR Text:
  voltage regulators 1 publication date: june 2004 sff00006deb an79lxx/an79lxxm series 3-pin negative output voltage regulator (100 ma type) overview the an79lxx series and the an79lxxm series are 3-pin, fixed negative output type monolithic voltage regulators. stabilized fixed output voltage is obtained from un- stable dc input voltage without using any external compo- nents. 12 types of output voltage are available: ? 4v, ? 5v, ? 6v, ? 7v, ? 8v, ? 9v, ? 10v, ? 12v, ? 15v, ? 18v, ? 20v and ? 24v. they can be used widely in power circuits with current capacity of up to 100ma. features ? no external components ? output voltage: ? 4v, ? 5v, ? 6v, ? 7v, ? 8v, ? 9v, ? 10v, ? 12v, ? 15v, ? 18v, ? 20v, ? 24v ? built-in overcurrent limit circuit ? built-in thermal overload protection circuit ssip003-p-0000 an79lxx series unit: mm hsip003-p-0000b an79lxxm series unit: mm 5.00.2 5.10.2 13.50.5 (1.0) (1.0) 4.00.2 2.30.2 0.60.15 0.43 +0.1 ?0.05 2.54 0.43 +0.1 ?0.05 21 3 2.6 typ. 1.6 max. 1.8 max. 4.6 max. 3.0 1.5 1.5 321 0.48 max. 0.58 max. 0.44 max. 4.25 max. 2.6 max. 0.8 min. block diagram (an79lxx series) 2 1 3 common (1) output (3) input (2) starter voltage reference error amp. + ? r 1 q 1 pass tr. r sc current limiter thermal protection r 2 note) the number in ( ) shows the pin number for the an79lxxm series. 1 : common 2 : input 3 : output 1 : output 2 : common 3 : intput note) the packages (ssip003-p-0000 and hsip003- p-0000b) of this product will be changed to lead-free type (ssip003-p-0000s and hsip003-p-0000q). see the new package di- mensions section later of this datasheet.
an79lxx/an79lxxm series 2 sff00006deb  absolute maximum ratings at t a = 25 c  electrical characteristics at t a = 25 c ? an79l04 ( ? 4v type) v i p d t opr t stg v v mw c c parameter symbol rating unit ? 35 * 1 ? 40 * 2 650 * 3 ? 20 to + 80 ? 55 to + 150 ? 55 to + 125 input voltage power dissipation operating ambient temperature storage temperature an79lxx series an79lxxm series * 1 an79l04, an79l05/m, an79l06, an79l07/m, an79l08/m, an79l09/m, an79l10/m, an79l12/m, an79l15/m, an79l18 * 2 an79l20, an79l24 * 3 follow the derating curve. when t j exceeds 150 c, the internal circuit cuts off the output. an79lxxm series is mounted on a standard board ( g lass e p ox y : 20mm 20mm t1.7mm with cu foil of 1cm 2 or more). parameter symbol conditions min typ max output voltage v o v t j = 25 c output voltage tolerance v o v v i = ? 7 to ? 19v, i o = 1 to 70ma line regulation reg in mv v i = ? 6 to ? 20v, t j = 25 c mv load regulation reg l mv i o = 1 to 100ma, t j = 25 c mv i o = 1 to 40ma, t j = 25 c v i = ? 7 to ? 17v, t j = 25 c ma t j = 25 c note 1) the specified condition t j = 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i = ? 9v, i o = 40ma, c i = 2 f, c o = 1 f, t j = 0 to 125 c bias current i bias ma v i = ? 7 to ? 19v, t j = 25 c bias current fluctuation to input  i bias(in) ma bias current fluctuation to load  i bias(l) v i o = 1 to 40ma, t j = 25 c output noise voltage v no db f = 10hz to 100khz, t a = 25 c ripple rejection ratio rr v i = ? 7 to ? 17v, f = 120hz, t a = 25 c v t j = 25 c minimum input/output voltage difference v dif(min) ma output short-circuit current i o(short) mv/ c v i = ? 35v, t j = 25 c output voltage temperature coefficient  v o /t a i o = 5ma unit ? 4.16 ? 4 80 10 3 38 0.5 0.1 40 ? 4.2 60 30 5 55 ? 3.84 ? 3.8 0.8 200 ? 0.4 4.5
an79lxx/an79lxxm series 3 sff00006deb electrical characteristics at t a = 25 c (continued) ? an79l05, an79l05m ( ? 5v type) ? an79l06 ( ? 6v type) v o v t j = 25 c v o v v i = ? 9 to ? 21v, i o = 1 to 70ma reg in mv v i = ? 8 to ? 22v, t j = 25 c mv reg l mv i o = 1 to 100ma, t j = 25 c mv i o = 1 to 40ma, t j = 25 c v i = ? 9 to ? 19v, t j = 25 c ma t j = 25 c i bias ma v i = ? 9 to ? 21v, t j = 25 c ? i bias(in) ma ? i bias(l) v i o = 1 to 40ma, t j = 25 c v no db f = 10hz to 100khz, t a = 25 c rr v i = ? 9 to ? 19v, f = 120hz, t a = 25 c v t j = 25 c v dif(min) ma i o(short) mv/ c v i = ? 35v, t j = 25 c ? v o /t a i o = 5ma ? 6.24 ? 6 120 12 3 44 0.5 0.1 60 ? 6.3 60 30 5 55 ? 5.76 ? 5.7 0.8 200 ? 0.4 5.5 parameter symbol conditions min typ max output voltage output voltage tolerance line regulation load regulation note 1) the specified condition t j = 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i = ? 11v, i o = 40ma, c i = 2 f, c o = 1 f, t j = 0 to 125 c bias current bias current fluctuation to input bias current fluctuation to load output noise voltage ripple rejection ratio minimum input/output voltage difference output short-circuit current output voltage temperature coefficient unit v o v t j = 25 c v o v v i = ? 8 to ? 20v, i o = 1 to 70ma reg in mv v i = ? 7 to ? 21v, t j = 25 c mv reg l mv i o = 1 to 100ma, t j = 25 c mv i o = 1 to 40ma, t j = 25 c v i = ? 8 to ? 18v, t j = 25 c ma t j = 25 c i bias ma v i = ? 8 to ? 20v, t j = 25 c ? i bias(in) ma ? i bias(l) v i o = 1 to 40ma, t j = 25 c v no db f = 10hz to 100khz, t a = 25 c ? 4.8 rr v i = ? 8 to ? 18v, f = 120hz, t a = 25 c v t j = 25 c v dif(min) ma i o(short) mv/ c v i = ? 35v, t j = 25 c ? v o /t a i o = 5ma ? 5.2 ? 5 100 11 3 40 0.5 0.1 50 ? 5.25 60 30 5 55 ? 4.75 0.8 200 ? 0.4 5 parameter symbol conditions min typ max output voltage output voltage tolerance line regulation load regulation note 1) the specified condition t j = 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i = ? 10v, i o = 40ma, c i = 2 f, c o = 1 f, t j = 0 to 125 c (an79l05) and t j = 0 to 100 c (an79l05m) bias current bias current fluctuation to input bias current fluctuation to load output noise voltage ripple rejection ratio minimum input/output voltage difference output short-circuit current output voltage temperature coefficient unit
an79lxx/an79lxxm series 4 sff00006deb electrical characteristics at t a = 25 c (continued) ? an79l07, AN79L07M ( ? 7v type) ? an79l08, an79l08m ( ? 8v type) v o v t j = 25 c v o v v i = ? 11 to ? 23v, i o = 1 to 70ma reg in mv v i = ? 10 to ? 24v, t j = 25 c mv reg l mv i o = 1 to 100ma, t j = 25 c mv i o = 1 to 40ma, t j = 25 c v i = ? 11 to ? 21v, t j = 25 c ma t j = 25 c i bias ma v i = ? 11 to ? 23v, t j = 25 c ? i bias(in) ma ? i bias(l) v i o = 1 to 40ma, t j = 25 c v no db f = 10hz to 100khz, t a = 25 c rr v i = ? 11 to ? 21v, f = 120hz, t a = 25 c v t j = 25 c v dif(min) ma i o(short) mv/ c v i = ? 35v, t j = 25 c ? v o /t a i o = 5ma, t j = 0 to 125 c ? 8.32 ? 8 160 15 3 52 0.5 0.1 80 ? 8.4 80 40 5 54 ? 7.68 ? 7.6 0.8 200 ? 0.6 7 parameter symbol conditions min typ max output voltage output voltage tolerance line regulation load regulation note 1) the specified condition t j = 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i = ? 14v, i o = 40ma, c i = 2 f, c o = 1 f, t j = 0 to 125 c (an79l08) and t j = 0 to 100 c (an79l08m) bias current bias current fluctuation to input bias current fluctuation to load output noise voltage ripple rejection ratio minimum input/output voltage difference output short-circuit current output voltage temperature coefficient unit v o v t j = 25 c v o v v i = ? 10 to ? 22v, i o = 1 to 70ma reg in mv v i = ? 9 to ? 23v, t j = 25 c mv reg l mv i o = 1 to 100ma, t j = 25 c mv i o = 1 to 40ma, t j = 25 c v i = ? 10 to ? 20v, t j = 25 c ma t j = 25 c i bias ma v i = ? 10 to ? 22v, t j = 25 c ? i bias(in) ma ? i bias(l) v i o = 1 to 40ma, t j = 25 c v no db f = 10hz to 100khz, t a = 25 c rr v i = ? 10 to ? 20v, f = 120hz, t a = 25 c v t j = 25 c v dif(min) ma i o(short) mv/ c v i = ? 35v, t j = 25 c ? v o /t a i o = 5ma ? 7.28 ? 7 140 13 3 48 0.5 0.1 70 ? 7.35 70 40 5 54 ? 6.72 ? 6.65 0.8 200 ? 0.5 6 parameter symbol conditions min typ max output voltage output voltage tolerance line regulation load regulation note 1) the specified condition t j = 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i = ? 12v, i o = 40ma, c i = 2 f, c o = 1 f, t j = 0 to 125 c (an79l07) and t j = 0 to 100 c (AN79L07M) bias current bias current fluctuation to input bias current fluctuation to load output noise voltage ripple rejection ratio minimum input/output voltage difference output short-circuit current output voltage temperature coefficient unit
an79lxx/an79lxxm series 5 sff00006deb electrical characteristics at t a = 25 c (continued) ? an79l09, an79l09m ( ? 9v type) ? an79l10, an79l10m ( ? 10v type) v o v t j = 25 c v o v v i = ? 13 to ? 25v, i o = 1 to 70ma reg in mv v i = ? 12 to ? 26v, t j = 25 c mv reg l mv i o = 1 to 100ma, t j = 25 c mv i o = 1 to 40ma, t j = 25 c v i = ? 13 to ? 23v, t j = 25 c ma t j = 25 c i bias ma v i = ? 13 to ? 25v, t j = 25 c ? i bias(in) ma ? i bias(l) v i o = 1 to 40ma, t j = 25 c v no db f = 10hz to 100khz, t a = 25 c rr v i = ? 13 to ? 23v, f = 120hz, t a = 25 c v t j = 25 c v dif(min) ma i o(short) mv/ c v i = ? 35v, t j = 25 c ? v o /t a i o = 5ma ? 10.4 ? 10 160 17 3 65 0.5 0.1 80 ? 10.5 100 50 5 53 ? 9.6 ? 9.5 0.8 200 ? 0.7 9 parameter symbol conditions min typ max output voltage output voltage tolerance line regulation load regulation note 1) the specified condition t j = 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i = ? 16v, i o = 40ma, c i = 2 f, c o = 1 f, t j = 0 to 125 c (an79l10) and t j = 0 to 100 c (an79l10m) bias current bias current fluctuation to input bias current fluctuation to load output noise voltage ripple rejection ratio minimum input/output voltage difference output short-circuit current output voltage temperature coefficient unit v o v t j = 25 c v o v v i = ? 12 to ? 24v, i o = 1 to 70ma reg in mv v i = ? 11 to ? 25v, t j = 25 c mv reg l mv i o = 1 to 100ma, t j = 25 c mv i o = 1 to 40ma, t j = 25 c v i = ? 12 to ? 22v, t j = 25 c ma t j = 25 c i bias ma v i = ? 12 to ? 24v, t j = 25 c ? i bias(in) ma ? i bias(l) v i o = 1 to 40ma, t j = 25 c v no db f = 10hz to 100khz, t a = 25 c rr v i = ? 12 to ? 22v, f = 120hz, t a = 25 c v t j = 25 c v dif(min) ma i o(short) mv/ c v i = ? 35v, t j = 25 c ? v o /t a i o = 5ma, t j = 0 to 125 c ? 9.36 ? 9 160 16 3 58 0.5 0.1 80 ? 9.45 90 50 5 53 ? 8.64 ? 8.55 0.8 200 ? 0.6 8 parameter symbol conditions min typ max output voltage output voltage tolerance line regulation load regulation note 1) the specified condition t j = 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i = ? 15v, i o = 40ma, c i = 2 f, c o = 1 f, t j = 0 to 125 c (an79l09) and t j = 0 to 100 c (an79l09m) bias current bias current fluctuation to input bias current fluctuation to load output noise voltage ripple rejection ratio minimum input/output voltage difference output short-circuit current output voltage temperature coefficient unit
an79lxx/an79lxxm series 6 sff00006deb electrical characteristics at t a = 25 c (continued) ? an79l12, an79l12m ( ? 12v type) ? an79l15, an79l15m ( ? 15v type) v o v t j = 25 c v o v v i = ? 18 to ? 28v, i o = 1 to 70ma reg in mv v i = ? 17.5 to ? 33v, t j = 25 c mv reg l mv i o = 1 to 100ma, t j = 25 c mv i o = 1 to 40ma, t j = 25 c v i = ? 18 to ? 28v, t j = 25 c ma t j = 25 c i bias ma v i = ? 18 to ? 30v, t j = 25 c ? i bias(in) ma ? i bias(l) v i o = 1 to 40ma, t j = 25 c v no db f = 10hz to 100khz, t a = 25 c rr v i = ? 18 to ? 28v, f = 120hz, t a = 25 c v t j = 25 c v dif(min) ma i o(short) mv/ c v i = ? 35v, t j = 25 c ? v o /t a i o = 5ma ? 15.6 ? 15 200 25 3 90 0.5 0.1 100 ? 15.75 130 60 5 51 ? 14.4 ? 14.25 0.8 200 ? 0.9 12 parameter symbol conditions min typ max output voltage output voltage tolerance line regulation load regulation note 1) the specified condition t j = 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i = ? 23v, i o = 40ma, c i = 2 f, c o = 1 f, t j = 0 to 125 c (an79l15) and t j = 0 to 100 c (an79l15m) bias current bias current fluctuation to input bias current fluctuation to load output noise voltage ripple rejection ratio minimum input/output voltage difference output short-circuit current output voltage temperature coefficient unit v o v t j = 25 c v o v v i = ? 15 to ? 27v, i o = 1 to 70ma reg in mv v i = ? 14.5 to ? 30v, t j = 25 c mv reg l mv i o = 1 to 100ma, t j = 25 c mv i o = 1 to 40ma, t j = 25 c v i = ? 15 to ? 25v, t j = 25 c ma t j = 25 c i bias ma v i = ? 15 to ? 27v, t j = 25 c ? i bias(in) ma ? i bias(l) v i o = 1 to 40ma, t j = 25 c v no db f = 10hz to 100khz, t a = 25 c rr v i = ? 15 to ? 25v, f = 120hz, t a = 25 c v t j = 25 c v dif(min) ma i o(short) mv/ c v i = ? 35v, t j = 25 c ? v o /t a i o = 5ma ? 12.5 ? 12 200 20 3 75 0.5 0.1 100 ? 12.6 100 50 5 52 ? 11.5 ? 11.4 0.8 200 ? 0.8 10 parameter symbol conditions min typ max output voltage output voltage tolerance line regulation load regulation note 1) the specified condition t j = 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i = ? 19v, i o = 40ma, c i = 2 f, c o = 1 f, t j = 0 to 125 c (an79l12) and t j = 0 to 100 c (an79l12m) bias current bias current fluctuation to input bias current fluctuation to load output noise voltage ripple rejection ratio minimum input/output voltage difference output short-circuit current output voltage temperature coefficient unit
an79lxx/an79lxxm series 7 sff00006deb electrical characteristics at t a = 25 c (continued) ? an79l18 ( ? 18v type) ? an79l20 ( ? 20v type) v o v t j = 25 c v o v v i = ? 21 to ? 33v, i o = 1 to 70ma reg in mv v i = ? 21 to ? 33v, t j = 25 c mv reg l mv i o = 1 to 100ma, t j = 25 c mv i o = 1 to 40ma, t j = 25 c v i = ? 21 to ? 32v, t j = 25 c ma t j = 25 c i bias ma v i = ? 21 to ? 33v, t j = 25 c ? i bias(in) ma ? i bias(l) v i o = 1 to 40ma, t j = 25 c v no db f = 10hz to 100khz, t a = 25 c 5 rr v i = ? 22 to ? 32v, f = 120hz, t a = 25 c v t j = 25 c v dif(min) ma i o(short) mv/ c v i = ? 35v, t j = 25 c ? v o /t a i o = 5ma ? 18.7 ? 18 200 30 3 110 0.5 0.1 100 ? 18.9 160 80 50 ? 17.3 ? 17.1 0.8 200 ? 1 15 parameter symbol conditions min typ max output voltage output voltage tolerance line regulation load regulation note 1) the specified condition t j = 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i = ? 27v, i o = 40ma, c i = 2 f, c o = 1 f, t j = 0 to 125 c bias current bias current fluctuation to input bias current fluctuation to load output noise voltage ripple rejection ratio minimum input/output voltage difference output short-circuit current output voltage temperature coefficient unit v o v t j = 25 c v o v v i = ? 23 to ? 35v, i o = 1 to 70ma reg in mv v i = ? 23 to ? 35v, t j = 25 c mv reg l mv i o = 1 to 100ma, t j = 25 c mv i o = 1 to 40ma, t j = 25 c v i = ? 24 to ? 34v, t j = 25 c ma t j = 25 c i bias ma v i = ? 23 to ? 35v, t j = 25 c ? i bias(in) ma ? i bias(l) v i o = 1 to 40ma, t j = 25 c v no db f = 10hz to 100khz, t a = 25 c rr v i = ? 24 to ? 34v, f = 120hz, t a = 25 c v t j = 25 c v dif(min) ma i o(short) mv/ c v i = ? 35v, t j = 25 c ? v o /t a i o = 5ma ? 20.8 ? 20 200 35 3 135 0.5 0.1 100 ? 21 180 90 5 49 ? 19.2 ? 19 0.8 200 ? 1 17 parameter symbol conditions min typ max output voltage output voltage tolerance line regulation load regulation note 1) the specified condition t j = 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i = ? 29v, i o = 40ma, c i = 2 f, c o = 1 f, t j = 0 to 125 c bias current bias current fluctuation to input bias current fluctuation to load output noise voltage ripple rejection ratio minimum input/output voltage difference output short-circuit current output voltage temperature coefficient unit
an79lxx/an79lxxm series 8 sff00006deb electrical characteristics at t a = 25 c (continued) ? an79l24 ( ? 24v type) main characteristics v o v t j = 25 c v o v v i = ? 27 to ? 38v, i o = 1 to 70ma reg in mv v i = ? 27 to ? 38v, t j = 25 c mv reg l mv i o = 1 to 100ma, t j = 25 c mv i o = 1 to 40ma, t j = 25 c v i = ? 27 to ? 37v, t j = 25 c ma t j = 25 c i bias ma v i = ? 27 to ? 38v, t j = 25 c ? i bias(in) ma ? i bias(l) v i o = 1 to 40ma, t j = 25 c v no db f = 10hz to 100khz, t a = 25 c rr v i = ? 28 to ? 38v, f = 120hz, t a = 25 c v t j = 25 c v dif(min) ma i o(short) mv/ c v i = ? 35v, t j = 25 c ? v o /t a i o = 5ma ? 25 ? 24 200 40 3 170 0.5 0.1 100 ? 25.2 200 100 5 49 ? 23 ? 22.8 0.8 200 ? 1 20 parameter symbol conditions min typ max output voltage output voltage tolerance line regulation load regulation note 1) the specified condition t j = 25 c means that the test should be carried out within so short a test time (within 10ms) that the characteristic value drift due to the chip junction temperature rise can be ignored. note 2) unless otherwise specified, v i = ? 33v, i o = 40ma, c i = 2 f, c o = 1 f, t j = 0 to 125 c bias current bias current fluctuation to input bias current fluctuation to load output noise voltage ripple rejection ratio minimum input/output voltage difference output short-circuit current output voltage temperature coefficient unit 1.0 0.8 0.6 0.4 0.2 0 0 20 40 60 80 100 120 140 160 ambient temperature t a ( c) power dissipation p d (w) p d ? t a (an79lxx series) ? 5.12 ? 5.08 ? 5.04 ? 5.00 ? 4.96 ? 4.92 ? 4.88 ? 4.84 ? 4.80 junction temperature t j ( c) output voltage v o (v) v o ? t j ? 25 0 25 50 75 100 125 an79l05 v i = ? 10v i o = 1ma 1.0 0.8 0.6 0.4 0.2 0 0 20 40 60 80 100 120 140 160 ambient temperature t a ( c) power dissipation p d (w) p d ? t a (an79lxxm series) independent ic without a heat sink r th(j-a) = 190 c/w p d = 658mw (25 c) mounted on standard board (glass epoxy: 20 mm 20 mm t1.7mm with cu foil of 1cm 2 or more)
an79lxx/an79lxxm series 9 sff00006deb main characteristics (continued) 120 100 80 60 40 20 0 10 100 an79l05 i o = 5ma 1k 10k 100k frequency f (hz) ripple rejection ratio rr (db) rr ? f 0246810 time t ( s) 10 0 ? 10 ? 20 20 15 10 5 output voltage fluctuation (mv) input voltage v i (v) input transient response an79l05 0 1020304050 time t ( s) 1 0 ? 1 ? 2 200 100 0 output voltage fluctuation (v) load current i o (ma) load transient response an79l05 1.4 1.2 1.0 0.8 0.6 0.4 ? 50 0 50 100 150 junction temperature t j ( c) minimum input/output voltage difference v dif(min) (v) v dif(min) ? t j i o = 100ma i o = 20ma i o = 10ma i o = 1ma an79l05 basic regulator circuit c o c i input ? v i ? v o output an79lxx common 3 1 2 ? + ? + connect c i of 2 f when the input line is long. c o improves the transient response. 1 f
an79lxx/an79lxxm series 10 sff00006deb usage notes 1. cautions for a basic circuit c i : when a wiring from a smoothing circuit to a three-pin regulator is long, it is likely to oscillate at output. a capacitor of 0.1 f to 0.47 f should be connected near an input pin. c o : deadly needed to prevent from oscillation (0.33 f to 1.0 f). it is recommended to use a capacitor of a small internal imped- ance (ex. tantalum capacitor) when using it under a low tem- perature. when any sudden change of load current is likely to occur, con- nect an electrolytic capacitor of 10 f to 100 f to improve a transitional response of output voltage. d i : normally unnecessary. but add it in the case that there is a residual voltage at the output capacitor co even after switching off the supply power because a current is likely to flow into an output pin of the ic and damage the ic. 2. other caution items 1) short-circuit between the input pin and gnd pin if the input pin is short-circuitted to gnd or is cut off when a large capacitance capacitor has been con- nected to the ic's load, a voltage of a capacitor con- nected to an output pin is applied between input/out- put of the ic and this likely results in damage of the ic. it is necessary, therefore, to connect a diode, as shown in figure 2, to counter the reverse bias between input/output pins. 2) floating of gnd pin if a gnd pin is made floating in an operating mode, an unstabilized input voltage is outputted. in this case, a thermal protection circuit inside the ic does not normally operate. in this state, if the load is short-circuited or overloaded, it is likely to damage the ic. application circuit example figure 1 c o v o c i v i d i 1 3 2 in gnd out figure 2 c o output 1 3 2 ? + ? v o 2 f 1 f i bias an79lxx 3 1 2 r 2 r 1 v o ' ? v i input common output | v o | = v o ' 1 + + i q r 1 r 2 r 1 ? + ? + note) v o varies due to sample to sample variation of i bias . never fail to adjust individually with r 1 .
an79lxx/an79lxxm series 11 sff00006deb new package dimensions (unit: mm) ? ssip003-p-0000s (lead-free package) ? hsip003-p-0000q (lead-free package) (1.00) (1.00) 3 1 5.00 0.20 4.00 0.20 2.30 0.20 0.60 0.15 0.40 0.10 5.00 0.20 13.30 0.50 0.40 +0.10 - 0.05 1.27 1.27 3 1 0.42 +0.10 - 0.05 1.00 +0.10 - 0.20 0.40 +0.10 - 0.05 4.00 +0.25 - 0.20 2.50 0.10 4.50 0.10 1.55 0.20 2.65 0.10 (0.40) 1.50 0.10 (0.75) 3.00 1.50 m 0.15 0.10 0.50 +0.10 - 0.05 0.40 +0.10 - 0.05
request for your special attention and precautions in using the technical information and semiconductors described in this material (1) an export permit needs to be obtained from the competent authorities of the japanese government if any of the products or technical information described in this material and controlled under the "foreign exchange and foreign trade law" is to be exported or taken out of japan. (2) the technical information described in this material is limited to showing representative characteristics and applied circuits examples of the products. it neither warrants non-infringement of intellectual property right or any other rights owned by our company or a third party, nor grants any license. (3) we are not liable for the infringement of rights owned by a third party arising out of the use of the technical information as described in this material. (4) the products described in this material are intended to be used for standard applications or general elec- tronic equipment (such as office equipment, communications equipment, measuring instruments and house- hold appliances). consult our sales staff in advance for information on the following applications: ? special applications (such as for airplanes, aerospace, automobiles, traffic control equipment, combus- tion equipment, life support systems and safety devices) in which exceptional quality and reliability are required, or if the failure or malfunction of the products may directly jeopardize life or harm the human body. ? any applications other than the standard applications intended. (5) the products and product specifications described in this material are subject to change without notice for modification and/or improvement. at the final stage of your design, purchasing, or use of the products, therefore, ask for the most up-to-date product standards in advance to make sure that the latest specifica- tions satisfy your requirements. (6) when designing your equipment, comply with the guaranteed values, in particular those of maximum rat- ing, the range of operating power supply voltage, and heat radiation characteristics. otherwise, we will not be liable for any defect which may arise later in your equipment. even when the products are used within the guaranteed values, take into the consideration of incidence of break down and failure mode, possible to occur to semiconductor products. measures on the systems such as redundant design, arresting the spread of fire or preventing glitch are recommended in order to prevent physical injury, fire, social damages, for example, by using the products. (7) when using products for which damp-proof packing is required, observe the conditions (including shelf life and amount of time let standing of unsealed items) agreed upon when specification sheets are individually exchanged. (8) this material may be not reprinted or reproduced whether wholly or partially, without the prior written permission of matsushita electric industrial co., ltd. 2003 sep


▲Up To Search▲   

 
Price & Availability of AN79L07M

All Rights Reserved © IC-ON-LINE 2003 - 2022  

[Add Bookmark] [Contact Us] [Link exchange] [Privacy policy]
Mirror Sites :  [www.datasheet.hk]   [www.maxim4u.com]  [www.ic-on-line.cn] [www.ic-on-line.com] [www.ic-on-line.net] [www.alldatasheet.com.cn] [www.gdcy.com]  [www.gdcy.net]


 . . . . .
  We use cookies to deliver the best possible web experience and assist with our advertising efforts. By continuing to use this site, you consent to the use of cookies. For more information on cookies, please take a look at our Privacy Policy. X