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rev.2.1 _00 ultra-small package built-in delay circuit high-precision voltage detector s-801 series seiko instruments inc. 1 the s-801 series is a series of high-precision voltag e detectors with a built-in delay time generator of fixed tim e developed using cmos process. the detection voltage i s fixed internally, with an accuracy of 2.0 %. internal oscillato r and counter timer can delay the release signal withou t external parts. three delay times 50 ms, 100 ms, and 200 m s are available. two output forms, nch open-drain and cmo s output, are available. ? ? ? ? features ? ultra-low current consumption 1.3 a typ. (at v dd = 3.5 v) ? high-precision detection voltage 2.0 % ? hysteresis characteristics 60 mv typ. ? detection voltage 2.2 v to 6.0 v (0.1 v step) ? three delay times a type 50 ms typ. b type 100 ms typ. c type 200 ms typ. ? on/off switching function of delay time (ds pin) ? operating voltage range 0.95 v to 10.0 v ? output forms nch open-drain output (active low) cmos output (active low) ? ? ? ? applications ? power monitor for portable equipment such as notebook computers, digital still cameras, pda, and cellular phones. ? constant voltage power monitor for cameras, video equipment and communication devices. ? power monitor for microcomputers and reset for cpus. ? ? ? ? packages package name drawing code package tape reel sot-23-5 mp005-a mp005-a mp005-a snt-4a pf004-a pf004-a pf004-a
ultra-small package built-in delay circuit high-precision voltage detector s-801 series rev.2.1 _00 2 seiko instruments inc. ? ? ? ? block diagrams 1. nch open-drain output products + ? delay circuit ds oscillator counter timer out *1 v ref vss vdd *1 *1 *1. parasitic diode figure 1 2. cmos output products v ref + ? out *1 *1 delay circuit ds oscillator counter timer vss vdd *1 *1 *1. parasitic diode figure 2
ultra-small package built-in delay circuit high-precision voltage detector rev.2.1 _00 s-801 series seiko instruments inc. 3 ? ? ? ? product name structure the detection voltage, delay time, output form and packages for s-801 series can be selected at the user's request. refer to the " 1. product name " for the construction of the product name and " 2. product name list " for the full product names. 1. product name 1-1. sot-23-5 package s-801xx x x mc - xxx - t2 ic direction in tape specifications * 1 t2: sot-23-5 product code *2 package code mc: sot-23-5 output form n: nch open-drain output (active low) l: cmos output (active low) delay time a: 50 ms typ. b: 100 ms typ. c: 200 ms typ. detection voltage value 22 to 60 (e.g. when the detection voltage is 2.2 v, it is expressed as 22.) *1 . refer to the taping specifications at the end this book. t2 is the standard. *2 . refer to the table 1 in the ? 2. product name list ?.
ultra-small package built-in delay circuit high-precision voltage detector s-801 series rev.2.1 _00 4 seiko instruments inc. 1-2. snt-4a package s-801xx x x pf - xxx tf g fixed ic direction in tape specifications *1 tf: snt-4a product code *2 package code pf: snt-4a output form n: nch open-drain output (active low) l: cmos output (active low) delay time a: 50 ms typ. b: 100 ms typ. c: 200 ms typ. detection voltage value 22 to 60 (e.g. when the detection voltage is 2.2 v, it is expressed as 22.) *1 . refer to the taping specifications at the end this book. tf is the standard. *2 . refer to the table 2 in the ? 2. product name list ?. 2. product name list 2-1. sot-23-5 table 1 (1/3) detection voltage range delay time nch open-drain output products cmos output products 2.2 v 2.0% 50 ms typ. s-80122anmc-jch-t2 s-80122almc-jah-t2 100 ms typ. s-80122bnmc-jgh-t2 s-80122blmc-jeh-t2 200 ms typ. s-80122cnmc-jkh-t2 s-80122clmc-jih-t2 2.3 v 2.0% 50 ms typ. s-80123anmc-jci-t2 s-80123almc-jai-t2 100 ms typ. s-80123bnmc-jgi-t2 s-80123blmc-jei-t2 200 ms typ. s-80123cnmc-jki-t2 s-80123clmc-jii-t2 2.4 v 2.0% 50 ms typ. s-80124anmc-jcj-t2 s-80124almc-jaj-t2 100 ms typ. s-80124bnmc-jgj-t2 s-80124blmc-jej-t2 200 ms typ. s-80124cnmc-jkj-t2 s-80124clmc-jij-t2 2.5 v 2.0% 50 ms typ. s-80125anmc-jck-t2 s-80125almc-jak-t2 100 ms typ. s-80125bnmc-jgk-t2 s-80125blmc-jek-t2 200 ms typ. s-80125cnmc-jkk-t2 s-80125clmc-jik-t2 2.6 v 2.0% 50 ms typ. s-80126anmc-jcl-t2 s-80126almc-jal-t2 100 ms typ. s-80126bnmc-jgl-t2 s-80126blmc-jel-t2 200 ms typ. s-80126cnmc-jkl-t2 s-80126clmc-jil-t2 2.7 v 2.0% 50 ms typ. s-80127anmc-jcm-t2 s-80127almc-jam-t2 100 ms typ. s-80127bnmc-jgm-t2 s-80127blmc-jem-t2 200 ms typ. s-80127cnmc-jkm-t2 s-80127clmc-jim-t2 2.8 v 2.0% 50 ms typ. s-80128anmc-jcn-t2 s-80128almc-jan-t2 100 ms typ. s-80128bnmc-jgn-t2 s-80128blmc-jen-t2 200 ms typ. s-80128cnmc-jkn-t2 s-80128clmc-jin-t2
ultra-small package built-in delay circuit high-precision voltage detector rev.2.1 _00 s-801 series seiko instruments inc. 5 table 1 (2/3) detection voltage range delay time nch open-drain output products cmos output products 2.9 v 2.0% 50 ms typ. s-80129anmc-jco-t2 s-80129almc-jao-t2 100 ms typ. s-80129bnmc-jgo-t2 s-80129blmc-jeo-t2 200 ms typ. s-80129cnmc-jko-t2 s-80129clmc-jio-t2 3.0 v 2.0% 50 ms typ. s-80130anmc-jcp-t2 s-80130almc-jap-t2 100 ms typ. s-80130bnmc-jgp-t2 s-80130blmc-jep-t2 200 ms typ. s-80130cnmc-jkp-t2 s-80130clmc-jip-t2 3.1 v 2.0% 50 ms typ. s-80131anmc-jcq-t2 s-80131almc-jaq-t2 100 ms typ. s-80131bnmc-jgq-t2 s-80131blmc-jeq-t2 200 ms typ. s-80131cnmc-jkq-t2 s-80131clmc-jiq-t2 3.2 v 2.0% 50 ms typ. s-80132anmc-jcr-t2 s-80132almc-jar-t2 100 ms typ. s-80132bnmc-jgr-t2 s-80132blmc-jer-t2 200 ms typ. s-80132cnmc-jkr-t2 s-80132clmc-jir-t2 3.3 v 2.0% 50 ms typ. s-80133anmc-jcs-t2 s-80133almc-jas-t2 100 ms typ. s-80133bnmc-jgs-t2 s-80133blmc-jes-t2 200 ms typ. s-80133cnmc-jks-t2 s-80133clmc-jis-t2 3.4 v 2.0% 50 ms typ. s-80134anmc-jct-t2 s-80134almc-jat-t2 100 ms typ. s-80134bnmc-jgt-t2 s-80134blmc-jet-t2 200 ms typ. s-80134cnmc-jkt-t2 s-80134clmc-jit-t2 3.5 v 2.0% 50 ms typ. s-80135anmc-jcu-t2 s-80135almc-jau-t2 100 ms typ. s-80135bnmc-jgu-t2 s-80135blmc-jeu-t2 200 ms typ. s-80135cnmc-jku-t2 s-80135clmc-jiu-t2 3.6 v 2.0% 50 ms typ. s-80136anmc-jcv-t2 s-80136almc-jav-t2 100 ms typ. s-80136bnmc-jgv-t2 s-80136blmc-jev-t2 200 ms typ. s-80136cnmc-jkv-t2 s-80136clmc-jiv-t2 3.7 v 2.0% 50 ms typ. s-80137anmc-jcw-t2 s-80137almc-jaw-t2 100 ms typ. s-80137bnmc-jgw-t2 s-80137blmc-jew-t2 200 ms typ. s-80137cnmc-jkw-t2 s-80137clmc-jiw-t2 3.8 v 2.0% 50 ms typ. s-80138anmc-jcx-t2 s-80138almc-jax-t2 100 ms typ. s-80138bnmc-jgx-t2 s-80138blmc-jex-t2 200 ms typ. s-80138cnmc-jkx-t2 s-80138clmc-jix-t2 3.9 v 2.0% 50 ms typ. s-80139anmc-jcy-t2 s-80139almc-jay-t2 100 ms typ. s-80139bnmc-jgy-t2 s-80139blmc-jey-t2 200 ms typ. s-80139cnmc-jky-t2 s-80139clmc-jiy-t2 4.0 v 2.0% 50 ms typ. s-80140anmc-jcz-t2 s-80140almc-jaz-t2 100 ms typ. s-80140bnmc-jgz-t2 s-80140blmc-jez-t2 200 ms typ. s-80140cnmc-jkz-t2 s-80140clmc-jiz-t2 4.1 v 2.0% 50 ms typ. s-80141anmc-jc2-t2 s-80141almc-ja2-t2 100 ms typ. s-80141bnmc-jg2-t2 s-80141blmc-je2-t2 200 ms typ. s-80141cnmc-jk2-t2 s-80141clmc-ji2-t2 4.2 v 2.0% 50 ms typ. s-80142anmc-jc3-t2 S-80142ALMC-JA3-T2 100 ms typ. s-80142bnmc-jg3-t2 s-80142blmc-je3-t2 200 ms typ. s-80142cnmc-jk3-t2 s-80142clmc-ji3-t2 4.3 v 2.0% 50 ms typ. s-80143anmc-jc4-t2 s-80143almc-ja4-t2 100 ms typ. s-80143bnmc-jg4-t2 s-80143blmc-je4-t2 200 ms typ. s-80143cnmc-jk4-t2 s-80143clmc-ji4-t2 4.4 v 2.0% 50 ms typ. s-80144anmc-jc5-t2 s-80144almc-ja5-t2 100 ms typ. s-80144bnmc-jg5-t2 s-80144blmc-je5-t2 200 ms typ. s-80144cnmc-jk5-t2 s-80144clmc-ji5-t2
ultra-small package built-in delay circuit high-precision voltage detector s-801 series rev.2.1 _00 6 seiko instruments inc. table 1 (3/3) detection voltage range delay time nch open-drain output products cmos output products 4.5 v 2.0% 50 ms typ. s-80145anmc-jc6-t2 s-80145almc-ja6-t2 100 ms typ. s-80145bnmc-jg6-t2 s-80145blmc-je6-t2 200 ms typ. s-80145cnmc-jk6-t2 s-80145clmc-ji6-t2 4.6 v 2.0% 50 ms typ. s-80146anmc-jc7-t2 s-80146almc-ja7-t2 100 ms typ. s-80146bnmc-jg7-t2 s-80146blmc-je7-t2 200 ms typ. s-80146cnmc-jk7-t2 s-80146clmc-ji7-t2 4.7 v 2.0% 50 ms typ. s-80147anmc-jc8-t2 s-80147almc-ja8-t2 100 ms typ. s-80147bnmc-jg8-t2 s-80147blmc-je8-t2 200 ms typ. s-80147cnmc-jk8-t2 s-80147clmc-ji8-t2 4.8 v 2.0% 50 ms typ. s-80148anmc-jc9-t2 s-80148almc-ja9-t2 100 ms typ. s-80148bnmc-jg9-t2 s-80148blmc-je9-t2 200 ms typ. s-80148cnmc-jk9-t2 s-80148clmc-ji9-t2 4.9 v 2.0% 50 ms typ. s-80149anmc-jda-t2 s-80149almc-jba-t2 100 ms typ. s-80149bnmc-jha-t2 s-80149blmc-jfa-t2 200 ms typ. s-80149cnmc-jla-t2 s-80149clmc-jja-t2 5.0 v 2.0% 50 ms typ. s-80150anmc-jdb-t2 s-80150almc-jbb-t2 100 ms typ. s-80150bnmc-jhb-t2 s-80150blmc-jfb-t2 200 ms typ. s-80150cnmc-jlb-t2 s-80150clmc-jjb-t2 5.1 v 2.0% 50 ms typ. s-80151anmc-jdc-t2 s-80151almc-jbc-t2 100 ms typ. s-80151bnmc-jhc-t2 s-80151blmc-jfc-t2 200 ms typ. s-80151cnmc-jlc-t2 s-80151clmc-jjc-t2 5.2 v 2.0% 50 ms typ. s-80152anmc-jdd-t2 s-80152almc-jbd-t2 100 ms typ. s-80152bnmc-jhd-t2 s-80152blmc-jfd-t2 200 ms typ. s-80152cnmc-jld-t2 s-80152clmc-jjd-t2 5.3 v 2.0% 50 ms typ. s-80153anmc-jde-t2 s-80153almc-jbe-t2 100 ms typ. s-80153bnmc-jhe-t2 s-80153blmc-jfe-t2 200 ms typ. s-80153cnmc-jle-t2 s-80153clmc-jje-t2 5.4 v 2.0% 50 ms typ. s-80154anmc-jdf-t2 s-80154almc-jbf-t2 100 ms typ. s-80154bnmc-jhf-t2 s-80154blmc-jff-t2 200 ms typ. s-80154cnmc-jlf-t2 s-80154clmc-jjf-t2 5.5 v 2.0% 50 ms typ. s-80155anmc-jdg-t2 s-80155almc-jbg-t2 100 ms typ. s-80155bnmc-jhg-t2 s-80155blmc-jfg-t2 200 ms typ. s-80155cnmc-jlg-t2 s-80155clmc-jjg-t2 5.6 v 2.0% 50 ms typ. s-80156anmc-jdh-t2 s-80156almc-jbh-t2 100 ms typ. s-80156bnmc-jhh-t2 s-80156blmc-jfh-t2 200 ms typ. s-80156cnmc-jlh-t2 s-80156clmc-jjh-t2 5.7 v 2.0% 50 ms typ. s-80157anmc-jdi-t2 s-80157almc-jbi-t2 100 ms typ. s-80157bnmc-jhi-t2 s-80157blmc-jfi-t2 200 ms typ. s-80157cnmc-jli-t2 s-80157clmc-jji-t2 5.8 v 2.0% 50 ms typ. s-80158anmc-jdj-t2 s-80158almc-jbj-t2 100 ms typ. s-80158bnmc-jhj-t2 s-80158blmc-jfj-t2 200 ms typ. s-80158cnmc-jlj-t2 s-80158clmc-jjj-t2 5.9 v 2.0% 50 ms typ. s-80159anmc-jdk-t2 s-80159almc-jbk-t2 100 ms typ. s-80159bnmc-jhk-t2 s-80159blmc-jfk-t2 200 ms typ. s-80159cnmc-jlk-t2 s-80159clmc-jjk-t2 6.0 v 2.0% 50 ms typ. s-80160anmc-jdl-t2 s-80160almc-jbl-t2 100 ms typ. s-80160bnmc-jhl-t2 s-80160blmc-jfl-t2 200 ms typ. s-80160cnmc-jll-t2 s-80160clmc-jjl-t2
ultra-small package built-in delay circuit high-precision voltage detector rev.2.1 _00 s-801 series seiko instruments inc. 7 2-2. snt-4a table 2 (1/3) detection voltage range delay time nch open-drain output products cmos output products 2.2 v 2.0% 50 ms typ. s-80122anpf-jchtfg s-80122alpf-jahtfg 100 ms typ. s-80122bnpf-jghtfg s-80122blpf-jehtfg 200 ms typ. s-80122cnpf-jkhtfg s-80122clpf-jihtfg 2.3 v 2.0% 50 ms typ. s-80123anpf-jcitfg s-80123alpf-jaitfg 100 ms typ. s-80123bnpf-jgitfg s-80123blpf-jeitfg 200 ms typ. s-80123cnpf-jkitfg s-80123clpf-jiitfg 2.4 v 2.0% 50 ms typ. s-80124anpf-jcjtfg s-80124alpf-jajtfg 100 ms typ. s-80124bnpf-jgjtfg s-80124blpf-jejtfg 200 ms typ. s-80124cnpf-jkjtfg s-80124clpf-jijtfg 2.5 v 2.0% 50 ms typ. s-80125anpf-jcktfg s-80125alpf-jaktfg 100 ms typ. s-80125bnpf-jgktfg s-80125blpf-jektfg 200 ms typ. s-80125cnpf-jkktfg s-80125clpf-jiktfg 2.6 v 2.0% 50 ms typ. s-80126anpf-jcltfg s-80126alpf-jaltfg 100 ms typ. s-80126bnpf-jgltfg s-80126blpf-jeltfg 200 ms typ. s-80126cnpf-jkltfg s-80126clpf-jiltfg 2.7 v 2.0% 50 ms typ. s-80127anpf-jcmtfg s-80127alpf-jamtfg 100 ms typ. s-80127bnpf-jgmtfg s-80127blpf-jemtfg 200 ms typ. s-80127cnpf-jkmtfg s-80127clpf-jimtfg 2.8 v 2.0% 50 ms typ. s-80128anpf-jcntfg s-80128alpf-jantfg 100 ms typ. s-80128bnpf-jgntfg s-80128blpf-jentfg 200 ms typ. s-80128cnpf-jkntfg s-80128clpf-jintfg 2.9 v 2.0% 50 ms typ. s-80129anpf-jcotfg s-80129alpf-jaotfg 100 ms typ. s-80129bnpf-jgotfg s-80129blpf-jeotfg 200 ms typ. s-80129cnpf-jkotfg s-80129clpf-jiotfg 3.0 v 2.0% 50 ms typ. s-80130anpf-jcptfg s-80130alpf-japtfg 100 ms typ. s-80130bnpf-jgptfg s-80130blpf-jeptfg 200 ms typ. s-80130cnpf-jkptfg s-80130clpf-jiptfg 3.1 v 2.0% 50 ms typ. s-80131anpf-jcqtfg s-80131alpf-jaqtfg 100 ms typ. s-80131bnpf-jgqtfg s-80131blpf-jeqtfg 200 ms typ. s-80131cnpf-jkqtfg s-80131clpf-jiqtfg 3.2 v 2.0% 50 ms typ. s-80132anpf-jcrtfg s-80132alpf-jartfg 100 ms typ. s-80132bnpf-jgrtfg s-80132blpf-jertfg 200 ms typ. s-80132cnpf-jkrtfg s-80132clpf-jirtfg 3.3 v 2.0% 50 ms typ. s-80133anpf-jcstfg s-80133alpf-jastfg 100 ms typ. s-80133bnpf-jgstfg s-80133blpf-jestfg 200 ms typ. s-80133cnpf-jkstfg s-80133clpf-jistfg 3.4 v 2.0% 50 ms typ. s-80134anpf-jcttfg s-80134alpf-jattfg 100 ms typ. s-80134bnpf-jgttfg s-80134blpf-jettfg 200 ms typ. s-80134cnpf-jkttfg s-80134clpf-jittfg 3.5 v 2.0% 50 ms typ. s-80135anpf-jcutfg s-80135alpf-jautfg 100 ms typ. s-80135bnpf-jgutfg s-80135blpf-jeutfg 200 ms typ. s-80135cnpf-jkutfg s-80135clpf-jiutfg 3.6 v 2.0% 50 ms typ. s-80136anpf-jcvtfg s-80136alpf-javtfg 100 ms typ. s-80136bnpf-jgvtfg s-80136blpf-jevtfg 200 ms typ. s-80136cnpf-jkvtfg s-80136clpf-jivtfg 3.7 v 2.0% 50 ms typ. s-80137anpf-jcwtfg s-80137alpf-jawtfg 100 ms typ. s-80137bnpf-jgwtfg s-80137blpf-jewtfg 200 ms typ. s-80137cnpf-jkwtfg s-80137clpf-jiwtfg
ultra-small package built-in delay circuit high-precision voltage detector s-801 series rev.2.1 _00 8 seiko instruments inc. table 2 (2/3) detection voltage range delay time nch open-drain output products cmos output products 3.8 v 2.0% 50 ms typ. s-80138anpf-jcxtfg s-80138alpf-jaxtfg 100 ms typ. s-80138bnpf-jgxtfg s-80138blpf-jextfg 200 ms typ. s-80138cnpf-jkxtfg s-80138clpf-jixtfg 3.9 v 2.0% 50 ms typ. s-80139anpf-jcytfg s-80139alpf-jaytfg 100 ms typ. s-80139bnpf-jgytfg s-80139blpf-jeytfg 200 ms typ. s-80139cnpf-jkytfg s-80139clpf-jiytfg 4.0 v 2.0% 50 ms typ. s-80140anpf-jcztfg s-80140alpf-jaztfg 100 ms typ. s-80140bnpf-jgztfg s-80140blpf-jeztfg 200 ms typ. s-80140cnpf-jkztfg s-80140clpf-jiztfg 4.1 v 2.0% 50 ms typ. s-80141anpf-jc2tfg s-80141alpf-ja2tfg 100 ms typ. s-80141bnpf-jg2tfg s-80141blpf-je2tfg 200 ms typ. s-80141cnpf-jk2tfg s-80141clpf-ji2tfg 4.2 v 2.0% 50 ms typ. s-80142anpf-jc3tfg s-80142alpf-ja3tfg 100 ms typ. s-80142bnpf-jg3tfg s-80142blpf-je3tfg 200 ms typ. s-80142cnpf-jk3tfg s-80142clpf-ji3tfg 4.3 v 2.0% 50 ms typ. s-80143anpf-jc4tfg s-80143alpf-ja4tfg 100 ms typ. s-80143bnpf-jg4tfg s-80143blpf-je4tfg 200 ms typ. s-80143cnpf-jk4tfg s-80143clpf-ji4tfg 4.4 v 2.0% 50 ms typ. s-80144anpf-jc5tfg s-80144alpf-ja5tfg 100 ms typ. s-80144bnpf-jg5tfg s-80144blpf-je5tfg 200 ms typ. s-80144cnpf-jk5tfg s-80144clpf-ji5tfg 4.5 v 2.0% 50 ms typ. s-80145anpf-jc6tfg s-80145alpf-ja6tfg 100 ms typ. s-80145bnpf-jg6tfg s-80145blpf-je6tfg 200 ms typ. s-80145cnpf-jk6tfg s-80145clpf-ji6tfg 4.6 v 2.0% 50 ms typ. s-80146anpf-jc7tfg s-80146alpf-ja7tfg 100 ms typ. s-80146bnpf-jg7tfg s-80146blpf-je7tfg 200 ms typ. s-80146cnpf-jk7tfg s-80146clpf-ji7tfg 4.7 v 2.0% 50 ms typ. s-80147anpf-jc8tfg s-80147alpf-ja8tfg 100 ms typ. s-80147bnpf-jg8tfg s-80147blpf-je8tfg 200 ms typ. s-80147cnpf-jk8tfg s-80147clpf-ji8tfg 4.8 v 2.0% 50 ms typ. s-80148anpf-jc9tfg s-80148alpf-ja9tfg 100 ms typ. s-80148bnpf-jg9tfg s-80148blpf-je9tfg 200 ms typ. s-80148cnpf-jk9tfg s-80148clpf-ji9tfg 4.9 v 2.0% 50 ms typ. s-80149anpf-jdatfg s-80149alpf-jbatfg 100 ms typ. s-80149bnpf-jhatfg s-80149blpf-jfatfg 200 ms typ. s-80149cnpf-jlatfg s-80149clpf-jjatfg 5.0 v 2.0% 50 ms typ. s-80150anpf-jdbtfg s-80150alpf-jbbtfg 100 ms typ. s-80150bnpf-jhbtfg s-80150blpf-jfbtfg 200 ms typ. s-80150cnpf-jlbtfg s-80150clpf-jjbtfg 5.1 v 2.0% 50 ms typ. s-80151anpf-jdctfg s-80151alpf-jbctfg 100 ms typ. s-80151bnpf-jhctfg s-80151blpf-jfctfg 200 ms typ. s-80151cnpf-jlctfg s-80151clpf-jjctfg 5.2 v 2.0% 50 ms typ. s-80152anpf-jddtfg s-80152alpf-jbdtfg 100 ms typ. s-80152bnpf-jhdtfg s-80152blpf-jfdtfg 200 ms typ. s-80152cnpf-jldtfg s-80152clpf-jjdtfg 5.3 v 2.0% 50 ms typ. s-80153anpf-jdetfg s-80153alpf-jbetfg 100 ms typ. s-80153bnpf-jhetfg s-80153blpf-jfetfg 200 ms typ. s-80153cnpf-jletfg s-80153clpf-jjetfg
ultra-small package built-in delay circuit high-precision voltage detector rev.2.1 _00 s-801 series seiko instruments inc. 9 table 2 (3/3) detection voltage range delay time nch open-drain output products cmos output products 5.4 v 2.0% 50 ms typ. s-80154anpf-jdftfg s-80154alpf-jbftfg 100 ms typ. s-80154bnpf-jhftfg s-80154blpf-jfftfg 200 ms typ. s-80154cnpf-jlftfg s-80154clpf-jjftfg 5.5 v 2.0% 50 ms typ. s-80155anpf-jdgtfg s-80155alpf-jbgtfg 100 ms typ. s-80155bnpf-jhgtfg s-80155blpf-jfgtfg 200 ms typ. s-80155cnpf-jlgtfg s-80155clpf-jjgtfg 5.6 v 2.0% 50 ms typ. s-80156anpf-jdhtfg s-80156alpf-jbhtfg 100 ms typ. s-80156bnpf-jhhtfg s-80156blpf-jfhtfg 200 ms typ. s-80156cnpf-jlhtfg s-80156clpf-jjhtfg 5.7 v 2.0% 50 ms typ. s-80157anpf-jditfg s-80157alpf-jbitfg 100 ms typ. s-80157bnpf-jhitfg s-80157blpf-jfitfg 200 ms typ. s-80157cnpf-jlitfg s-80157clpf-jjitfg 5.8 v 2.0% 50 ms typ. s-80158anpf-jdjtfg s-80158alpf-jbjtfg 100 ms typ. s-80158bnpf-jhjtfg s-80158blpf-jfjtfg 200 ms typ. s-80158cnpf-jljtfg s-80158clpf-jjjtfg 5.9 v 2.0% 50 ms typ. s-80159anpf-jdktfg s-80159alpf-jbktfg 100 ms typ. s-80159bnpf-jhktfg s-80159blpf-jfktfg 200 ms typ. s-80159cnpf-jlktfg s-80159clpf-jjktfg 6.0 v 2.0% 50 ms typ. s-80160anpf-jdltfg s-80160alpf-jbltfg 100 ms typ. s-80160bnpf-jhltfg s-80160blpf-jfltfg 200 ms typ. s-80160cnpf-jlltfg s-80160clpf-jjltfg
ultra-small package built-in delay circuit high-precision voltage detector s-801 series rev.2.1 _00 10 seiko instruments inc. ? ? ? ? pin configurations table 3 pin no. pin name pin description 1 ds *1 on/off switch for delay time 2 vss gnd pin 3 nc *2 no connection 4 out voltage detection output pin 5 vdd voltage input pin sot-23-5 top view 5 4 3 2 1 figure 3 *1. refer to ? 2. delay circuit ? in ? ? ? ? ? operation ? for operation. *2. the nc pin is electrically open. the nc pin can be connected to vdd or vss. table 4 pin no. pin name pin description 1 vss gnd pin 2 ds *1 on/off switch for delay time 3 vdd voltage input pin 4 out voltage detection output pin snt-4a top view 1 4 2 3 figure 4 *1. refer to ? 2. delay circuit ? in ? ? ? ? ? operation ? for operation. ? ? ? ? absolute maximum ratings table 5 (ta = 25 c unless otherwise specified) item symbol absolute maximum ratings unit power supply voltage v dd ? v ss 12 v output voltage nch open-drain output products v out v ss ? 0.3 to v ss + 12 cmos output products v ss ? 0.3 to v dd +0.3 output current i out 50 ma power dissipation p d sot-23-5 250 mw snt-4a 140 operating ambient temperature topr ? 40 to +85 c storage temperature tstg ? 40 to +125 caution the absolute maximum ratings are rated values exceeding which the product could suffer physical damage. these values must therefore not be exceeded under any conditions.
ultra-small package built-in delay circuit high-precision voltage detector rev.2.1 _00 s-801 series seiko instruments inc. 11 ? ? ? ? electrical characteristics table 6 (ta = 25 c unless otherwise specified) item symbol condition min. typ. max. unit test circuit detection voltage *1 ? v det ? ? v det(s) 0.98 ? v det(s) ? v det(s) 1.02 v 1 hysteresis width v hys ? 30 60 100 mv i ss v dd = 3.5 v s-80122 to 26 ? 1.3 3.3 a current consumption v dd = 4.5 v s-80127 to 39 ? 1.5 3.5 v dd = 6.5 v s-80140 to 60 ? 1.8 4.0 operating voltage v dd ? 0.95 ? 10.0 v output current i out output transistor, nch, v out = 0.5 v v dd = 1.2 v s-80122 to 60 0.75 1.5 ? ma 2 v dd = 2.4 v s-80127 to 60 3.0 6.0 ? v dd = 4.8 v s-80122 to 39 1.0 2.0 ? only for cmos output products, output transistor, pch, v dd ?v out = 0.5 v v dd = 6.0 v s-80140 to 54 1.25 2.5 ? v dd = 8.4 v s-80155 to 60 1.5 3.0 ? leakage current i leak only for nch open-drain output products, output transistor, nch, v dd = 10.0 v, v out = 10.0 v ? ? 0.1 a detection voltage temperature coefficient *2 det det v ta v ? ? ? ? ? ta =? 40 c to + 85 c ? 120 360 ppm/ c 1 delay time 1 t d1 v dd =? v det + 1 v, ds pin low s-801xxax 32.5 50 72.5 ms s-801xxbx 65 100 145 s-801xxcx 130 200 290 delay time 2 t d2 v dd =? v det +1 v, ds pin high 110 220 330 s 3 input voltage v sh ds pin, v dd = 6.0 v 1.0 ? ? v 4 v sl ds pin, v dd = 6.0 v ? ? 0.3 *1. ? v det : actual detection voltage value, ? v det(s) : specified detection voltage value (the center value of the detection voltage range in table 1 to 2 .) *2. temperature change ratio for the detection voltage [mv/ c] is calculated using the following equation. [] () [] [] 1000 c ppm/ v ta ? v ? v typ. v c mv/ ta ? v ? det det det(s) det ? ? ? = ? ? 3 * 2 * *1 *1. temperature change ratio of the detection voltage *2. specified detection voltage value *3. detection voltage temperature coefficient
ultra-small package built-in delay circuit high-precision voltage detector s-801 series rev.2.1 _00 12 seiko instruments inc. ? ? ? ? test circuits 1. ds vd d out vss r *1 100 k ? a v 2. ds vdd out vss a *1. r is unnecessary for cmos output products. figure 5 figure 6 3. ds vdd out vss r *1 100 k ? v 4. ds vdd out vss r *1 100 k ? a v *1. r is unnecessary for cmos output products. *1. r is unnecessary for cmos output products. figure 7 figure 8
ultra-small package built-in delay circuit high-precision voltage detector rev.2.1 _00 s-801 series seiko instruments inc. 13 ? ? ? ? operation 1. basic operation: cmos output (active low) 1-1. when the power supply voltage (v dd ) is higher than the release voltage ( + v det ), the nch transistor is off and the pch transistor is on to provide v dd (high) at the output. since the nch transistor n1 in figure 9 is off, the comparator input voltage is c b a dd c b r r r v ) r r ( + + ? + . 1-2. when the v dd goes below + v det , the output provides the v dd level, as long as v dd remains above the detection voltage (?v det ). when the v dd falls below ?v det (point a in figure 10 ), the nch transistor becomes on, the pch transistor becomes off, and the v ss level appears at the output. at this time the nch transistor n1 in figure 9 becomes on, the comparator input voltage is changed to b a dd b r r v r + ? . 1-3. when the v dd falls below the minimum operating voltage, the output becomes undefined, or goes to v dd when the output is pulled up to v dd . 1-4. the v ss level appears when v dd rises above the minimum operating voltage. the v ss level still appears even when v dd surpasses the ?v det , as long as it does not exceed the release voltage + v det . 1-5. when v dd rises above + v det (point b in figure 10 ), the nch transistor becomes off and the pch transistor becomes on to provide v dd at the output. the v dd at the out pin is delayed for t d due to the delay circuit. *1 ds *1 r c r b pch nch v ref v dd + ? r a n1 v ss out delay circuit *1. paracitic diode figure 9 operation 1
ultra-small package built-in delay circuit high-precision voltage detector s-801 series rev.2.1 _00 14 seiko instruments inc. a b v dd t d v ss minimum operating voltage output from out pin v dd v ss ( 1 ) ( 2 ) ( 3 ) ( 5 ) ( 4 ) hysterisis width ( v hys ) release voltage ( + v det ) detection voltage ( ? v det ) figure 10 operation 2 2. delay circuit 2-1. delay time the delay circuit delays the output signal from the time at which the power voltage (v dd ) exceeds the release voltage ( + v det ) when v dd is turned on. the output signal is not delayed when the v dd goes below the detection voltage (?v det ). (refer to figure 10 .) the delay time (t d ) is a fixed value that is determined by a built-in oscillation circuit and counter. 2-2. ds pin (on/off switch pin for delay time) the ds pin should be connected to low or high. when the ds pin is high, the output delay time becomes short since the output signal is taken from the middle of counter circuit (refer to figure 15 ). 3. other characteristics 3-1. temperature characteristics of detection voltage the shaded area in figure 11 shows the temperature characteristics of the detection voltage. ?40 25 + 0.792 mv/ c 2.200 85 ta [ c ] ? 0.792 mv/ c ?v det [v] figure 11 temperature characteristics of detection voltage (example for s-80122xxxx)
ultra-small package built-in delay circuit high-precision voltage detector rev.2.1 _00 s-801 series seiko instruments inc. 15 3-2. temperature characteristics of release voltage the temperature coefficient ta v det ? + ? of the release voltage is calculated by the temperature coefficient ta v det ? ? ? for the detection voltage as follows: ta v v v ta v det det det det ? ? ? ? + = ? + ? the temperature coefficients for the release voltage and the detection voltage have the same sign consequently. 3-3. temperature characteristics of hysteresis voltage the temperature characteristics for the hysteresis voltage is expressed as ta v ta v det det ? ? ? ? ? + ? and is calculated as follows: ta v v v ta v ta v det det hys det det ? ? ? ? = ? ? ? ? ? + ? ? ? ? ? standard circuit ds vdd out vss r * 1 100 k ? *1. r is unnecessary for cmos output products. figure 12 caution the above connection diagram and constant will not guarantees successful operation. perform through using the actual application to set the constant.
ultra-small package built-in delay circuit high-precision voltage detector s-801 series rev.2.1 _00 16 seiko instruments inc. ? ? ? ? technical terms 1. detection voltage (?v det ), release voltage ( + + + + v det ) the detection voltage (?v det ) is a voltage at which the output turns to low. the detection voltage varies slightly among products of the same specification. the variation of detection voltage between the specified minimum (?v det ) min. and the maximum (?v det ) max. is called the detection voltage range (refer to figure 13 ). e.g. for the s-80122an, the detection voltage lies in the range of 2.156 (?v det ) 2.244. this means that some s-80122ans have 2.156 v for ?v det and some have 2.244 v. the release voltage ( + v det ) is a voltage at which the output turns to high. the release voltage varies slightly among products of the same specification. the variation of release voltages between the specified minimum ( + v det ) min. and the maximum ( + v det ) max. is called the release voltage range (refer to figure 14 ). e.g. for the s-80122an, the release voltage lies in the range of 2.186 ( + v det ) 2.344. this means that some s-80122ans have 2.186 v for + v det and some have 2.344 v. detection voltage detection voltage range v dd ( ? v det ) min. ( ? v det ) max. out delay time release voltage release voltage range v dd ( + v det ) min. ( + v det ) max. out figure 13 detection voltage figure 14 release voltage remark although the detection voltage and release voltage overlap in the range of 2.186 v to 2.244 v, + v det is always larger than ?v det .
ultra-small package built-in delay circuit high-precision voltage detector rev.2.1 _00 s-801 series seiko instruments inc. 17 2. hysteresis width (v hys ) hysteresis width is the voltage difference between the detection voltage and the release voltage (the voltage at point b ? the voltage at point a = v hys in figure 10 ). the existence of the hysteresis width prevents malfunction caused by noise on input signal. 3. delay time (t d ) delay time is a time internally measured from the instant at which input voltage to the vdd pin exceeds the release voltage ( + v det ) to the point at which the output of the out pin inverts. the delay time is fixed in each series distinguished by a, b and c. s-801xxax series: typ. 50 ms s-801xxbx series: typ. 100 ms s-801xxcx series: typ. 200 ms the output of the out pin can be inverted in a short delay time (t d2 ) by setting the ds pin high (refer to figure 15 ). t d2 t d1 v dd at ds = ?h? out v + v det figure 15 4. through-type current the through-type current refers to the current that flows instantaneously at the time of detection and release of a voltage detector. the through-type current flows at a frequency of 20 khz during release delay time since the internal logic circuit operates.
ultra-small package built-in delay circuit high-precision voltage detector s-801 series rev.2.1 _00 18 seiko instruments inc. 5. oscillation in applications where a resistor is connected to the voltage detector input ( figure 16 ), taking a cmos active low products for example, the through-type current which is generated when the output goes from low to high (release) causes a voltage drop equal to [through-type current] [input resistance] across the resistor. when the input voltage drops below the detection voltage (?v det ) as a result, the output voltage goes to low level. in this state, the through-type current stops and its resultant voltage drop disappears, and the output goes from low to high. the through-type current is again generated, a voltage drop appears, and repeating the process finally induces oscillation. out vss vdd r b r a v in s-801 figure 16 example for bad implementation of input voltage divider ? ? ? ? precautions ? in the s-801 series products, the through-type current flows at a frequency of 20 khz approximately during the delay time since the internal oscillator circuit and counter timer operate at voltage release. high impedance in the input may cause oscillation by the through-type current. when the input impedance is high, insert a capacitor between vdd pin and vss pin to prevent oscillation. ? do not apply an electrostatic discharge to this ic that exceeds the performance ratings of the built-in electrostatic protection circuit. ? in cmos output products of the s-801 series, the through-type current flows at detection and release. if the impedance is high, oscillation may occur due to the voltage drop by the through-type current during releasing. ? when designing for mass production using an application circuit described herein, the product deviation and temperature characteristics should be taken into consideration. sii shall not bear any responsibility for the patents on the circuits described herein. ? sii claims no responsibility for any and all disputes arising out of or in connection with any infringement of the products including this ic upon patents owned a third party.
ultra-small package built-in delay circuit high-precision voltage detector rev.2.1 _00 s-801 series seiko instruments inc. 19 ? ? ? ? typical characteristics (typical data) 1. detection voltage (v det ) - temperature (ta) s-80122al s-80160al 2.1 2.2 2.3 2.4 ? 40 ? 20 0 20 40 60 80 100 ta [c] v det [v] v det ( + ) v det ( ? ) 5.8 6.0 6.2 6.4 ? 40 ? 20 0 20 40 60 80 100 ta [c)] v det [v] v det ( + ) v det ( ? ) 2. hysteresis voltage width (v hys ) - temperature (ta) s-80122al s-80160al 30 40 50 60 70 80 90 100 ? 40 ? 20 0 20 40 60 80 100 ta [c] v hys [mv] 30 40 50 60 70 80 90 100 ? 40 ? 20 0 20 40 60 80 100 ta [c] v hys [mv] 3. current consumption (i ss ) - input voltage (v dd ) (a) s-80122al (b) s-80129al 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 0 2 4 6 8 10 v dd [v] i ss [ = 25c 2.9 a 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 0 2 4 6 8 10 v dd [v] i ss [ = 25c 3.3 a (c) s-80130al (d) s-80160al 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 0 2 4 6 8 10 v dd [v] i ss [ = 25c 5.0 a 0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 0 2 4 6 8 10 v dd [v] i ss [ = 25c 20 a
ultra-small package built-in delay circuit high-precision voltage detector s-801 series rev.2.1 _00 20 seiko instruments inc. 4. current consumption (i ss ) - temperature (ta) (a) s-80122al (b) s-80129al 0.0 1.0 2.0 3.0 4.0 5.0 ? 40 ? 20 0 20 40 60 80 100 ta [c] i ss [ = 3.5 v 0.0 1.0 2.0 3.0 4.0 5.0 ? 40 ? 20 0 20 40 60 80 100 ta [c] i ss [ = 4.5 v (c) s-80130al (d) s-80160al 0.0 1.0 2.0 3.0 4.0 5.0 ? 40 ? 20 0 20 40 60 80 100 ta [c] i ss [ = 4.5 v 0.0 1.0 2.0 3.0 4.0 5.0 ? 40 ? 20 0 20 40 60 80 100 ta [c] i ss [ = 6.5 v 5. nch transistor output current (i out ) -v out 6. pch transistor output current (i out ) - (v dd -v out ) s-80160al s-80122al 0 10 20 30 40 50 60 70 0 2 4 6 8 10 v out [v] i out [ma] ta = 25c 2 v 2.4 v 4 v 5.5 v v dd = 1 v, 1.2 v 0 10 20 30 40 0 2 4 6 8 10 v dd -v out [v] i out [ma] ta = 25c v dd = 4 v 4.8 v 6 v 6.5 v 10 v 8 v 7. nch transistor output current (i out ) - input voltage (v dd ) 8. pch transistor output current (i out ) - input voltage (v dd ) s-80160al s-80122al 0 5 10 15 20 25 0 2 4 6 8 10 v dd [v] i out [ma] v ds = 0.5 v ta = ? 40c 85c 25c 0 1 2 3 4 5 0 2 4 6 8 10 v dd [v] i out [ma] v ds = 0.5 v ta = ? 40c 85c 25c
ultra-small package built-in delay circuit high-precision voltage detector rev.2.1 _00 s-801 series seiko instruments inc. 21 9. minimum operating voltage - input voltage (v dd ) s-80122an 0 0.1 0.2 0.3 0.4 0.5 0.6 0 0.5 1 1.5 v dd [v] v out [v] pull-up, v dd :100 k ? 85c 25c ta = ? 40c 10. threshold voltage of ds pin - temperature (ta) 11. threshold voltage of ds pin - input voltage (v dd ) s-80122al s- 80122al 0 0.2 0.4 0.6 0.8 1 ? 40 ? 20 0 20 40 60 80 100 ta [c] threshold [v] v dd = 6.0 v 0 0.2 0.4 0.6 0.8 1 0 2 4 6 8 10 v dd [v] threshold [v] ta = ? 40c 25c 85c 12. delay time 1 - temperature (ta) s-80122cl s-80160cl 0 50 100 150 200 250 300 ? 40 ? 20 0 20 40 60 80 100 ta [c] delay time [ms] v dd = 3.2 v 0 50 100 150 200 250 300 ? 40 ? 20 0 20 40 60 80 100 ta [c] delay time [ms] v dd = 7.0 v 13. delay time 1 - input voltage (v dd ) s-80122cl 0 50 100 150 200 250 300 2 4 6 8 10 v dd [v] delay time [ms] ta = 25c
ultra-small package built-in delay circuit high-precision voltage detector s-801 series rev.2.1 _00 22 seiko instruments inc. 14. delay time 2 - temperature (ta) s-80122al s-80160al 0 50 100 150 200 250 300 350 400 ? 40 ? 20 0 20 40 60 80 100 ta [c] delay time [ s] v dd = 3.2 v 0 50 100 150 200 250 300 350 400 ? 40 ? 20 0 20 40 60 80 100 ta [c] delay time [ s] v dd = 7.0 v 15. delay time 2 - input voltage (v dd ) s-80122an 0 50 100 150 200 250 300 350 400 2 4 6 8 10 v dd [v] delay time [ s] ta = 25c v dd out vss ds *1 vdd s-801 series v v r *2 100 k ? v dd 90 % v ss v ih v il t d v ih = 10 v, v il = 0.95 v input voltage output voltage *1. set to v dd or v ss . *2. r is not necessary for cmos output products. figure 17 measurment condition for delay time figure 18 measurment circuit for delay time caution the above connection diagram will not guarantees successful operation. perform through using the actual application to set the constant.
ultra-small package built-in delay circuit high-precision voltage detector rev.2.1 _00 s-801 series seiko instruments inc. 23 16. response time - load capacitor (c out ) s-80122al s-80122an 0.001 0.01 0.1 1 0.00001 0.0001 0.001 0.01 0.1 c out [ = 25c t plh (delay time2) t phl 0.001 0.01 0.1 1 10 100 0.00001 0.0001 0.001 0.01 0.1 c out [ = 25c t plh (delay time2) t phl s-80160al s-80160an 0.001 0.01 0.1 1 0.00001 0.0001 0.001 0.01 0.1 c out [ = 25c t plh (delay time2) t phl 0.001 0.01 0.1 1 10 100 0.00001 0.0001 0.001 0.01 0.1 c out [ f] response time [ms] ta = 25c t plh (delay time2) t phl v dd out ds vss vdd s-801 series v r *1 100 k ? v v dd 90 % v dd 10 % v ih input voltage output voltage v il v dd t phl t plh v ih =10 v, v il =0.95 v 1 s 1 s *1. r is not necessary for cmos output products. figure 19 measurment condition for response time figure 20 measurment circuit for response time caution the above connection diagram will not guarantees successful operation. perform through using the actual application to set the constant.
ultra-small package built-in delay circuit high-precision voltage detector s-801 series rev.2.1 _00 24 seiko instruments inc. ? ? ? ? application circuit examples microcomputer reset circuits if the power supply voltage to a microcomputer falls below the specified level, an unspecified operation may be performed or the contents of the memory register may be lost. when power supply voltage returns to normal, the microcomputer needs to be initialized before normal operations can be done. reset circuits protect microcomputers in the event of current being momentarily switched off or lowered. reset circuits shown in figures 21 to 22 can be easily constructed with the help of the s-801 series that has low operating voltage, a high-precision detection voltage, hysteresis, and a built-in delay circuit. vss vdd microcomputer s- 801xxal vss (nch open-drain output products only.) vdd1 vdd2 microcomputer s- 801xxan figure 21 ret circuit (s-801xxal) figure 22 reset circuit (s-801xxan) caution the above connection diagram will not guarantees successful operation. perform through using the actual application to set the constant.

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the information described herein is subject to change without notice. seiko instruments inc. is not responsible for any problems caused by circuits or diagrams described herein whose related industrial properties, patents, or other rights belong to third parties. the application circuit examples explain typical applications of the products, and do not guarantee the success of any specific mass-production design. when the products described herein are regulated products subject to the wassenaar arrangement or other agreements, they may not be exported without authorization from the appropriate governmental authority. use of the information described herein for other purposes and/or reproduction or copying without the express permission of seiko instruments inc. is strictly prohibited. the products described herein cannot be used as part of any device or equipment affecting the human body, such as exercise equipment, medical equipment, security systems, gas equipment, or any apparatus installed in airplanes and other vehicles, without prior written permission of seiko instruments inc. although seiko instruments inc. exerts the greatest possible effort to ensure high quality and reliability, the failure or malfunction of semiconductor products may occur. the user of these products should therefore give thorough consideration to safety design, including redundancy, fire-prevention measures, and malfunction prevention, to prevent any accidents, fires, or community damage that may ensue.

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