20DL2CZ47A,20fl2cz47a 2006-11-08 1 toshiba high efficiency diode stack (hed) silicon epitaxial type 20DL2CZ47A, 20fl2cz47a switching mode power supply application converter & chopper application z repetitive peak reverse voltage : v rrm = 200 v, 300 v z average output rectified current : i o = 20 a z ultra fast reverse-recovery time : t rr = 35 ns (max) z low switching losses and low output noise absolute maximum ratings (ta = 25c) characteristic symbol rating unit 20DL2CZ47A 200 repetitive peak reverse voltage 20fl2cz47a v rrm 300 v average output rectified current (full sine waveform) i o 20 a 100 (50h z ) peak one cycle surge forward current (non ? repetitive) i fsm 110 (60h z ) a junction temperature t j ? 40~150 c storage temperature range t stg ? 40~150 c screw torque D 0.6 nm note: using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. please design the appropriate reliability upon review ing the toshiba semiconductor reliability handbook (?handling precautions?/derating concept and methods) and in dividual reliability data (i.e. reliability test report and estimated failure rate, etc). electrical characteristics (ta = 25c) characteristic symbol test condition min typ. max unit 20DL2CZ47A D D 0.98 peak forward voltage (note 1) 20fl2cz47a v fm i fm = 10a D D 1.3 v repetitive peak reverse current (note 1) i rrm v rrm = rated D D 50 a reverse recovery time (note 1) t rr i f = 2.0a, di / dt = ? 50a / s D D 35 ns forward recovery time (note 1) t fr i f = 1.0a D D 100 ns thermal resistance r th (j ? c) dc total, junction to case D D 3.0 c / w note 1: a value applied to one cell. polarity jedec D jeita D toshiba 12 ? 10c1a weight: 2.0g unit: mm
20DL2CZ47A,20fl2cz47a 2006-11-08 2 marking abbreviation code part no. 20dl2cz 20DL2CZ47A 20fl2cz 20fl2cz47a handling precaution the absolute maximum ratings denote the absolute maximum ratings, which are rated values and must not be exceeded during operation, even for an instant. the following are the general derating methods that we recommend when you design a circuit with a device. v rrm : we recommend that the worst case voltage, including surge voltage, be no greater than 80% of the absolute maximum rating of v rrm for a dc circuit and be no greater than 50% of that of v rrm for an ac circuit. v rrm has a temperature coefficient of 0.1%/c. take this temperature coefficient into account designing a device at low temperature. i o : we recommend that the worst case current be no greater than 80% of the absolute maximum rating of i o . carry out adequate heat design. if you can?t design a circuit with excellent heat radiation, set the margin by using an allowable tamax-i o curve. this rating specifies the non-repetitive peak current in one cycle of a 50-hz sine wave, condition angle 180. therefore, this is only applied for an abnormal operation, which seldom occurs during the lifespan of the device. we recommend that a device be used at a tj of below 120c under the worst load and heat radiation conditions. please refer to the rectifiers databook for further information. lot no. a line indicates lead (pb)-free package or lead (pb)-free finish. 20dl2cz characteristics indicator part no. (or abbreviation code)
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20DL2CZ47A,20fl2cz47a 2006-11-08 5 ? the information contained herein is subject to change without notice. ? the information contained herein is presented only as a guide for the applications of our products. no responsibility is assumed by toshiba for any infringements of patents or other rights of the third parties which may result from its use. no license is granted by implication or otherwise under any patent or patent rights of toshiba or others. ? toshiba is continually working to improve the quality an d reliability of its products. nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. it is the responsibility of the buyer, when utilizing toshiba products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such toshiba products could cause loss of human life, bodily injury or damage to property. in developing your designs, please ensure that toshiba products are used within specified operating ranges as set forth in the most recent toshiba products specifications. also, please keep in mind the precautions and conditions set forth in the ?handling guide for semiconductor devices,? or ?toshiba semiconductor reliability handbook? etc.. ? the toshiba products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). these toshiba products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfuncti on or failure of which may cause loss of human life or bodily injury (?unintended usage?). unintended usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. unintended usage of toshiba products listed in this document shall be made at the customer?s own risk. ? toshiba products should not be embedded to the downstream products which are prohibited to be produced and sold, under any law and regulations. 030619eaa restrictions on product use
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