AFBR-79E4Z-D 4 channels quad small form factor pluggable parallel optics transceiver reliability data sheet description the avago technologies AFBR-79E4Z-D are 10g, 4 chan - nel quad small form factor, pluggable parallel optics transceiver, utilizing avagos 850nm vcsel. fit rate summary fit rate for AFBR-79E4Z-D is calculated as 197.42. compu - tation was done at 40c based on telcordia sr- 332 (issue 2), part count method. the details of the calculation are included in this report. random failure rate (fit) calculation failure in time rate, or fit, is defned as the number of failures per billion device hours. in the product useful life region, the random failure rate is considered as a constant failure rate. in this region mttf, mean time to failure, is defned as mttf = 1/fit. fit prediction based on telcordia sr-332 parts count procedure the telcordia parts count method assumes that the mod - ule failure rate is equal to the sum of the device compo - nent failure rates. modifers are included to take into con - sideration variations in module operation environments, device quality requirements, temperature, and stress. the tables that follow show the fit for the components used in the modules and the total fit which have been calcu - lated for an operating ambient temperature of 40oc. random failure rate (fit) calculation failure in time rate, or fit, is defned as the number of failures per billion device hours. in the product useful life region, the random failure rate is considered as a constant failure rate. in this region mttf, mean time to failure, is defned as mttf = 1/fit. fits prediction based on telcordia sr-332 part count pro - cedure the telcordia parts count method assumes that the mod - ule failure rate is equal to the sum of the device compo - nent failure rates. modifers are included to take into con - sideration variations in module operation environments, device quality requirements, temperature, and stress. the following table shows the fits for the components used in the module and the total fits which has been calculated for a case temperature of 40c.
for product information and a complete list of distributors, please go to our web site: www.avagotech.com avago, avago technologies, and the a logo are trademarks of avago technologies in the united states and other countries. data subject to change. copyright ? 2005-2010 avago technologies. all rights reserved. av02-2738en - november 18, 2010 table 1. fit rate calculations for AFBR-79E4Z-D reliability prediction based on telcordia sr-332 (issue 2) parts count method stress factor at 50% 1.0 environmental factors 1.0 component telcordia information / data source quantity component base rate (fits) quality factor temperature factor @ 40 c total component failure rate (fits) @ 40 c vcsel avago data 4 6 0.8 1.0 19.2 monitor pin ic photodiode 4 7.7 0.8 1.0 24.6 pin photodiode 4 7.7 0.8 1.0 24.6 capacitors fixed ceramic 49 0.2 1.0 1.0 9.8 resistors fixed film 57 0.5 1.0 1.0 28.5 ferrite chip (inductor) power filter 5 2.3 1.0 1.0 11.5 mosfet supplier info 2 4.0 1.0 1.0 8.0 or gate supplier info 1 4.3 1.0 1.0 4.3 nand gate supplier info 1 4.3 1.0 1.0 4.3 qsfp ic avago data 1 11.0 1.0 1.0 11.0 microcontroller supplier info 1 28.0 1.0 1.0 28.0 voltage regulator telcordia information / data source 2 9.3 1.0 1.0 18.6 connectors pcb, edge (20 pin) 38 0.13 1.0 1.0 4.9 total AFBR-79E4Z-D transceiver failure at 40 c (fits) 197.4 mttf @ 40 c (hours) 5.07e+06 fits at other temperatures can be derived following the procedure of telcordia sr-332, assuming activation en - ergy, ea, of 0.35ev to determine the component tempera - ture factor ?t. the following table shows fits at diferent temperature for the transceiver. table 2. fit rates at diferent operation case temperatures, following the telcordia parts count method tcase (c) AFBR-79E4Z-D 40 197.4 50 296.1 60 434.3 70 612.0 the limitations of the fit prediction based on the parts count method include the fact that the piece part failure rates are mostly obtained from telcordia database, which may not be exhaustive for state-of-the-art piece parts, and that the results are independent of true module en - vironmental stress tests. nevertheless, the information obtained from the parts count method is a useful refer - ence during design-in and evaluation. whenever possible, avago substitutes internal data for the fit rates of individ - ual components, and predictions will be updated as more current data becomes available.
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