reliability datasheet rd03 hpwsth00/fh00/tl00/fl00 description the following cumulative test results have been obtained from testing performed in accordance with the latest revision of milstd883. lumileds tests parts at the absolute maximum rated conditions recommended for the device. the actual performance you obtain depends on the electrical and environmental characteristics of your application, but will probably be better than the performance outlined in table 1. snapled 150 emitter reliability data sheet t t a a b b l l e e 1 1 : : l l i i f f e e t t e e s s t t s s d d e e m m o o n n s s t t r r a a t t e e d d p p e e r r f f o o r r m m a a n n c c e e p p o o i i n n t t t t y y p p i i c c a a l l p p e e r r f f o o r r m m a a n n c c e e s s t t r r e e s s s s t t e e s s t t t t o o t t a a l l u u n n i i t t s s u u n n i i t t s s f f a a i i l l u u r r e e r r a a t t e e c c o o l l o o r r s s c c o o n n d d i i t t i i o o n n s s d d e e v v i i c c e e h h o o u u r r s s t t e e s s t t e e d d f f a a i i l l e e d d m m t t b b f f ( ( % % / / 1 1 k k h h o o u u r r s s ) ) ts allngap t a = 55c, 168,000 168 0 168,000 < 0.595 amber and i f = 150 ma redorange ts allngap t a = 55c, 48,000 48 0 48,000 < 2.08 amber and i f = 160 ma redorange ts allngap t a = 55c pulse 48,000 48 (1 hz) 0 48,000 < 2.08 amber and 50% duty factor, 2hz 56,000 56 (2 hz) 0 56,000 < 1.786 redorange i f = 200 ma failure rate prediction the failure rate of semiconductor devices is determined by the junction temperature of the device. the relationship between ambient temperature and actual junction temperature is given by the following: t j (c) = t a (c) + ja p avg where: t a = ambient temperature in c ja = thermal resistance of junctiontoambient in c/watt p avg = average power dissipated in watts the estimated mtbf and failure rate at temperatures lower than the actual stress temperature can be determined by using an arrhenius model for temperature acceleration. results of such calculations are shown in the table on the following page using an activation energy of 0.43 ev (reference milhdbk217).
snapled 150 emitter reliability datasheet rd03 (7/05) 2 t t a a b b l l e e 2 2 : : f f a a i i l l u u r r e e r r a a t t e e p p r r e e d d i i c c t t i i o o n n ( ( i i f f 1 1 5 5 0 0 m m a a ) ) p p o o i i n n t t t t y y p p i i c c a a l l p p e e r r f f o o r r m m a a n n c c e e p p e e r r f f o o r r m m a a n n c c e e i i n n t t i i m m e e [ [ 1 1 ] ] i i n n t t i i m m e e [ [ 2 2 ] ] ( ( 6 6 0 0 % % c c o o n n f f i i d d e e n n c c e e ) ) ( ( 9 9 0 0 % % c c o o n n f f i i d d e e n n c c e e ) ) a a m m b b i i e e n n t t j j u u n n c c t t i i o o n n f f a a i i l l u u r r e e r r a a t t e e f f a a i i l l u u r r e e r r a a t t e e t t e e m m p p e e r r a a t t u u r r e e ( ( c c ) ) t t e e m m p p e e r r a a t t u u r r e e ( ( c c ) ) m m t t b b f f [ [ 1 1 ] ] ( ( % % / / 1 1 k k h h o o u u r r s s ) ) m m t t b b f f [ [ 2 2 ] ] ( ( % % / / 1 1 k k h h o o u u r r s s ) ) 85 138 65,000 1.548 28,000 3.565 75 128 87,000 1.144 38,000 2.634 65 118 120,000 0.832 52,000 1.916 55 108 168,000 0.595 73,000 1.371 45 98 239,000 0.418 104,000 0.963 35 88 347,000 0.288 151,000 0.663 25 78 515,000 0.194 223,000 0.447 n n o o t t e e s s : : [1] the point typical mtbf (which represents 60% confidence level) is the total device hours divided by the number of failures. in the case of zero failures, one failure is assumed for this calculation. [2] the 90% confidence mtbf represents the minimum level of reliability performance which is expected from 90% of all samples. this confi dence interval is based on the statistics of the distribution of failures. the assumed distribution of failures is exponential. this particular distribution is commonly used in describing useful life failures. refer to milstd690b for details on this methodology. [3] a failure is any led which does not emit light and max. % i v degradation is > 50%. [4] assuming 115c/w of ja example of failure rate calculation assume a device operating 8 hours/day, 5 days/week. the utilization factor, given 168 hours/week is: (8 hours/day) x (5 days/week) / (168 hours/week) = 0.25 the point failure rate per year (8760 hours) at 25c ambient temperature is: (0.060% / 1k hours) x (0.25) x (8760 hours/year) = 0.131% per year similarly, 90% confidence level failure rate per year at 25c: (0.137% / 1k hours) x (0.25) x (8760 hours/year) = 0.300% per year t t a a b b l l e e 3 3 : : e e n n v v i i r r o o n n m m e e n n t t a a l l t t e e s s t t s s t t e e s s t t n n a a m m e e r r e e f f e e r r e e n n c c e e t t e e s s t t c c o o n n d d i i t t i i o o n n s s u u n n i i t t s s t t e e s s t t e e d d u u n n i i t t s s f f a a i i l l e e d d temperature cycle milstd883 55 c to 100c, 15 min. dwell, 5 min. transfer method 1010 20 cycles 4480 0 100 cycles 4480 0 temperature cycle milstd883 40 c to 120c, 15 min. dwell, 5 min. transfer method 1010 20 cycles 952 0 100 cycles 952 0 power temperature internal 40 c to 85c, 18 min. dwell, 42 min. transfer, cycle reference 115 ma, 5 min on/off 100 cycles 48 0 power temperature internal 40 c to 85c, 18 min. dwell, 42 min. transfer, cycle reference 150 ma, 5 min on/off 100 cycles 56 0
snapled 150 emitter reliability datasheet rd03 (7/05) 3 electrostatic discharge (esd) test the snapled 150 has been tested for esd and has passed with minimal change in flux, forward voltage, and dominant wave length. units were subjected to 16kv esd with the human body model profile, and 400v with the machine model profile. results of the test are shown in table 4 below. t t a a b b l l e e 4 4 : : e e l l e e c c t t r r o o s s t t a a t t i i c c d d i i s s c c h h a a r r g g e e ( ( e e s s d d ) ) t t e e s s t t t t e e s s t t t t e e s s t t c c o o n n d d i i t t i i o o n n s s r r e e s s u u l l t t s s human body model 16 kv, 3 positive pulses, 3 negative pulses 95 units / 0 failures machine model 400 v, 3 positive pulses, 3 negative pulses 100 units / 0 failures * no appreciable change in flux, forward voltage, and dominant wavelength
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