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TK 100A BUZ908D 9DB8B FET 6K6 6C10 39162 88E1116R
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Part No. NSG163P NSG161P
OCR Text ...0 mm ns 161/163 series page 11 reliability testing result failure criteria reliability testing result applicable standard testing conditions duration failure room temp. operating life eiaj ed- 4701/100(101) ta = 25 , i f = maxium rated c...
Description 7 SEG NUMERIC DISPLAY, GREEN, 13.6 mm

File Size 276.62K  /  12 Page

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    TOSHIBA
Part No. TK100F04K3L
OCR Text ...this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. please design the appropriate reliability upon revi...
Description Power MOSFET (N-ch single 30V<VDSS≤60V)

File Size 281.48K  /  10 Page

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    AVX
Part No. TC2H447 TC2H946 TC2H945 TC2H207 TC2H667 TC2H666
OCR Text ...low esr and utilize established reliability capaci- tors (weibull grade voltage condi- tioning) in accordance with mil- prf-55365. they can also be sup- plied with src9000 space level components. the stacked construction of fully molded cap...
Description Low ESR Tantalum Modules

File Size 221.51K  /  3 Page

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    UPD72011407 UPD720114GA-YEU-A UPD720114GA-9EU-A

NEC[NEC]
Part No. UPD72011407 UPD720114GA-YEU-A UPD720114GA-9EU-A
OCR Text ... within which damage or reduced reliability will not result when power is applied to a VDD pin. Indicates voltage range within which damage or reduced reliability will not result when power is applied to an input pin. Output voltage VO Indi...
Description MOS INTEGRATED CIRCUIT

File Size 266.10K  /  32 Page

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    2SC2290A

Toshiba Semiconductor
Part No. 2SC2290A
OCR Text ...king to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility ...
Description 2~30MHz SSB LINEAR POWER AMPLIFIER APPLICATIONS (LOW SUPPLY VOLTAGE USE)

File Size 157.13K  /  3 Page

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    SANYO
Part No. 2SC4219
OCR Text ... * High breakdown voltage, high reliability (VCEO400V). * Fast switching speed (tf=0.1s typ). * Wide ASO. * Adoption of MBIT process. * Suitable for sets whose height is restricted. Package Dimensions unit:mm 2049C [2SC4219] 10.2 0.9 ...
Description NPN Triple Diffused Planar Silicon Transistor 400V/4A Switching Regulator Applications

File Size 97.41K  /  5 Page

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    2SC5960

Sanyo Semicon Device
Part No. 2SC5960
OCR Text ...High breakdown voltage and high reliability. High-speed switching. Wide ASO. Adoption of MBIT process. 2.6 1.6 2.0 1.3 20.0 1.2 15.0 20.0 3.5 2.0 0.6 1.0 1 0.6 2 3 1.4 1 : Base 2 : Collector 3 : Em...
Description Switching Regulator Applications

File Size 38.11K  /  4 Page

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    2SC5967

Sanyo Semicon Device
Part No. 2SC5967
OCR Text ...down voltage (VCBO=1700V). High reliability (Adoption of HVP process). Adoption of MBIT process. 20.0 3.3 5.0 26.0 2.0 3.4 20.7 2.0 1.0 0.6 1.2 Specifications Absolute Maximum Ratings at Ta=25C Parameter Collec...
Description Ultrahigh-Definition CRT Display Horizontal Deflection Output Applications

File Size 37.82K  /  4 Page

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    2SC5968

Sanyo Semicon Device
Part No. 2SC5968
OCR Text ...down voltage (VCBO=1700V). High reliability (Adoption of HVP process). Adoption of MBIT process. 20.0 3.3 5.0 26.0 2.0 3.4 20.7 2.0 1.0 0.6 1.2 Specifications Absolute Maximum Ratings at Ta=25C Parameter Collec...
Description Ultrahigh-Definition CRT Display Horizontal Deflection Output Applications

File Size 37.87K  /  4 Page

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